公开(公告)号：US20230268018A1

公开(公告)日：2023-08-24

申请号：US17675477

申请日：2022-02-18

Applicant: Micron Technology, Inc.

Inventor： Vamsi Rayaprolu ,  Ashutosh Malshe ,  Gary Besinga ,  Roy Leonard

IPC: G11C16/34 ,  G11C16/10 ,  G11C16/16 ,  G11C16/26 ,  G11C16/32

CPC classification number: G11C16/3495 ,  G11C16/102 ,  G11C16/16 ,  G11C16/26 ,  G11C16/32

Abstract: Systems and methods are disclosed including a memory device and a processing device operatively coupled to the memory device. The processing device can perform operations comprising determining a data validity metric value with respect to a source set of memory cells of the memory device; determining whether the data validity metric value satisfies a first threshold criterion; responsive to determining that the data validity metric value satisfies the first threshold criterion, performing a data integrity check on the source set of memory cells to obtain a data integrity metric value; determining whether the data integrity metric value satisfies a second threshold criterion; and responsive to determining that the data integrity metric value fails to satisfy the second threshold criterion, causing the memory device to copy data from the source set of memory cells to a destination set of memory cells of the memory device.

公开(公告)号：US12272412B2

公开(公告)日：2025-04-08

申请号：US18394660

申请日：2023-12-22

Applicant: Micron Technology, Inc.

Inventor： Vamsi Rayaprolu ,  Ashutosh Malshe ,  Gary Besinga ,  Roy Leonard

IPC: G11C11/34 ,  G11C16/10 ,  G11C16/16 ,  G11C16/26 ,  G11C16/32 ,  G11C16/34

Abstract: Systems and methods are disclosed including a memory device and a processing device operatively coupled to the memory device. The processing device can perform operations comprising determining a data validity metric value with respect to a set of memory cells of the memory device; responsive to determining that the data validity metric value satisfies a first threshold criterion, performing a data integrity check on the set of memory cells to obtain a data integrity metric value; and responsive to determining that the data integrity metric value satisfies a second threshold criterion, performing an error handling operation on the data stored on the set of memory cells to generate corrected data.

公开(公告)号：US20240127900A1

公开(公告)日：2024-04-18

申请号：US18394660

申请日：2023-12-22

Applicant: Micron Technology, Inc.

Inventor： Vamsi Rayaprolu ,  Ashutosh Malshe ,  Gary Besinga ,  Roy Leonard

IPC: G11C16/34 ,  G11C16/10 ,  G11C16/16 ,  G11C16/26 ,  G11C16/32

CPC classification number: G11C16/3495 ,  G11C16/102 ,  G11C16/16 ,  G11C16/26 ,  G11C16/32

Abstract: Systems and methods are disclosed including a memory device and a processing device operatively coupled to the memory device. The processing device can perform operations comprising determining a data validity metric value with respect to a set of memory cells of the memory device; responsive to determining that the data validity metric value satisfies a first threshold criterion, performing a data integrity check on the set of memory cells to obtain a data integrity metric value; and responsive to determining that the data integrity metric value satisfies a second threshold criterion, performing an error handling operation on the data stored on the set of memory cells to generate corrected data.

公开(公告)号：US11887681B2

公开(公告)日：2024-01-30

申请号：US17675477

申请日：2022-02-18

Applicant: Micron Technology, Inc.

Inventor： Vamsi Rayaprolu ,  Ashutosh Malshe ,  Gary Besinga ,  Roy Leonard

IPC: G11C11/34 ,  G11C16/34 ,  G11C16/10 ,  G11C16/32 ,  G11C16/26 ,  G11C16/16

CPC classification number: G11C16/3495 ,  G11C16/102 ,  G11C16/16 ,  G11C16/26 ,  G11C16/32

Abstract: Systems and methods are disclosed including a memory device and a processing device operatively coupled to the memory device. The processing device can perform operations comprising determining a data validity metric value with respect to a source set of memory cells of the memory device; determining whether the data validity metric value satisfies a first threshold criterion; responsive to determining that the data validity metric value satisfies the first threshold criterion, performing a data integrity check on the source set of memory cells to obtain a data integrity metric value; determining whether the data integrity metric value satisfies a second threshold criterion; and responsive to determining that the data integrity metric value fails to satisfy the second threshold criterion, causing the memory device to copy data from the source set of memory cells to a destination set of memory cells of the memory device.