公开(公告)号：US11791004B2

公开(公告)日：2023-10-17

申请号：US18081004

申请日：2022-12-14

Applicant: Micron Technology, Inc.

Inventor： Michael Sheperek ,  Bruce A. Liikanen ,  Steve Kientz ,  Anita Ekren ,  Gerald Cadloni

IPC: G11C16/34 ,  G11C16/10 ,  G11C7/04 ,  G11C16/32 ,  G11C16/30 ,  G11C16/26

CPC classification number: G11C16/349 ,  G11C7/04 ,  G11C16/10 ,  G11C16/26 ,  G11C16/30 ,  G11C16/32 ,  G11C16/3404 ,  G11C16/3459

Abstract: A method includes associating, by a processing device, a set of dies of a block family with a die family, wherein the block family is associated with a first threshold voltage offset bin for voltage offsets to be applied in a read operation; and responsive to detecting a triggering event, associating each die of the set of dies with a second threshold voltage offset bin for voltage offsets to be applied in a read operation, wherein the second threshold voltage offset bin is selected based on a representative die of the set of dies associated with the die family.

公开(公告)号：US20230115960A1

公开(公告)日：2023-04-13

申请号：US18081004

申请日：2022-12-14

Applicant: Micron Technology, Inc.

Inventor： Michael Sheperek ,  Bruce A. Liikanen ,  Steve Kientz ,  Anita Ekren ,  Gerald Cadloni

IPC: G11C16/34 ,  G11C16/10 ,  G11C7/04 ,  G11C16/32 ,  G11C16/30 ,  G11C16/26

Abstract: A method includes associating, by a processing device, a set of dies of a block family with a die family, wherein the block family is associated with a first threshold voltage offset bin for voltage offsets to be applied in a read operation; and responsive to detecting a triggering event, associating each die of the set of dies with a second threshold voltage offset bin for voltage offsets to be applied in a read operation, wherein the second threshold voltage offset bin is selected based on a representative die of the set of dies associated with the die family.

公开(公告)号：US11545227B2

公开(公告)日：2023-01-03

申请号：US17070526

申请日：2020-10-14

Applicant: Micron Technology, Inc.

Inventor： Michael Sheperek ,  Bruce A. Liikanen ,  Steve Kientz ,  Anita Ekren ,  Gerald Cadloni

IPC: G11C16/34 ,  G11C16/10 ,  G11C7/04 ,  G11C16/32 ,  G11C16/30 ,  G11C16/26

Abstract: A measure associated with a characteristic of a die of a memory device is obtained. It is determined whether the measure satisfies a first criterion to group one or more die into a first die family. If it is determined that the measure satisfies the first criterion, the die is associated with the first die family.

公开(公告)号：US20220115079A1

公开(公告)日：2022-04-14

申请号：US17070526

申请日：2020-10-14

Applicant: Micron Technology, Inc.

Inventor： Michael Sheperek ,  Bruce A. Liikanen ,  Steve Kientz ,  Anita Ekren ,  Gerald Cadloni

IPC: G11C16/34 ,  G11C16/10 ,  G11C16/26 ,  G11C16/32 ,  G11C16/30 ,  G11C7/04

Abstract: A measure associated with a characteristic of a die of a memory device is obtained. It is determined whether the measure satisfies a first criterion to group one or more die into a first die family. If it is determined that the measure satisfies the first criterion, the die is associated with the first die family.