Partial block read level voltage compensation to decrease read trigger rates

    公开(公告)号:US12272408B2

    公开(公告)日:2025-04-08

    申请号:US18138489

    申请日:2023-04-24

    Abstract: A memory device includes a memory array having a plurality of wordlines coupled with respective memory cells of the memory array. Control logic is operatively coupled with the memory array, the control logic to perform operations including: determining, prior to performing a read operation at one or more strings of the respective memory cells, a number of wordlines that are associated with memory cells that have been programmed; adjusting, based on the number of wordlines, a read level voltage for a selected wordline of the one or more strings that is to be read during the read operation; and causing, during the read operation, the adjusted read level voltage to be applied to the selected wordline.

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