CLOCK AND POWER FAULT DETECTION FOR MEMORY MODULES

    公开(公告)号:US20100211765A1

    公开(公告)日:2010-08-19

    申请号:US12770576

    申请日:2010-04-29

    IPC分类号: G06F1/24 G11C5/14

    摘要: A system, method and apparatus for clock and power fault detection for a memory module is provided. In one embodiment, a system is provided. The system includes a voltage detection circuit and a clock detection circuit. The system further includes a controller coupled to the voltage detection circuit and the clock detection circuit. The system also includes a memory control state machine coupled to the controller. The system includes volatile memory coupled to the memory control state machine. The system further includes a battery and battery regulation circuitry coupled to the controller and the memory control state machine. The battery, battery regulation circuitry, volatile memory, memory control state machine, controller, clock detection circuit and voltage detection circuit are all collectively included in a unitary memory module.

    Clock and power fault detection for memory modules
    2.
    发明授权
    Clock and power fault detection for memory modules 有权
    内存模块的时钟和电源故障检测

    公开(公告)号:US07724604B2

    公开(公告)日:2010-05-25

    申请号:US11552949

    申请日:2006-10-25

    IPC分类号: G11C5/14

    摘要: A system, method and apparatus for clock and power fault detection for a memory module is provided. In one embodiment, a system is provided. The system includes a voltage detection circuit and a clock detection circuit. The system further includes a controller coupled to the voltage detection circuit and the clock detection circuit. The system also includes a memory control state machine coupled to the controller. The system includes volatile memory coupled to the memory control state machine. The system further includes a battery and battery regulation circuitry coupled to the controller and the memory control state machine. The battery, battery regulation circuitry, volatile memory, memory control state machine, controller, clock detection circuit and voltage detection circuit are all collectively included in a unitary memory module.

    摘要翻译: 提供了一种用于存储器模块的时钟和电源故障检测的系统,方法和装置。 在一个实施例中,提供了一种系统。 该系统包括电压检测电路和时钟检测电路。 该系统还包括耦合到电压检测电路和时钟检测电路的控制器。 该系统还包括耦合到控制器的存储器控​​制状态机。 该系统包括耦合到存储器控制状态机的易失性存储器。 该系统还包括耦合到控制器和存储器控制状态机的电池和电池调节电路。 电池,电池调节电路,易失性存储器,存储器控制状态机,控制器,时钟检测电路和电压检测电路都集成在一体式存储器模块中。

    Clock and power fault detection for memory modules
    3.
    发明授权
    Clock and power fault detection for memory modules 有权
    内存模块的时钟和电源故障检测

    公开(公告)号:US08068378B2

    公开(公告)日:2011-11-29

    申请号:US12770610

    申请日:2010-04-29

    IPC分类号: G11C5/14

    摘要: A system, method and apparatus for clock and power fault detection for a memory module is provided. In one embodiment, a system is provided. The system includes a voltage detection circuit and a clock detection circuit. The system further includes a controller coupled to the voltage detection circuit and the clock detection circuit. The system also includes a memory control state machine coupled to the controller. The system includes volatile memory coupled to the memory control state machine. The system further includes a battery and battery regulation circuitry coupled to the controller and the memory control state machine. The battery, battery regulation circuitry, volatile memory, memory control state machine, controller, clock detection circuit and voltage detection circuit are all collectively included in a unitary memory module.

    摘要翻译: 提供了一种用于存储器模块的时钟和电源故障检测的系统,方法和装置。 在一个实施例中,提供了一种系统。 该系统包括电压检测电路和时钟检测电路。 该系统还包括耦合到电压检测电路和时钟检测电路的控制器。 该系统还包括耦合到控制器的存储器控​​制状态机。 该系统包括耦合到存储器控制状态机的易失性存储器。 该系统还包括耦合到控制器和存储器控制状态机的电池和电池调节电路。 电池,电池调节电路,易失性存储器,存储器控制状态机,控制器,时钟检测电路和电压检测电路都集成在一体的存储器模块中。

    CLOCK AND POWER FAULT DETECTION FOR MEMORY MODULES
    4.
    发明申请
    CLOCK AND POWER FAULT DETECTION FOR MEMORY MODULES 有权
    用于存储器模块的时钟和电源故障检测

    公开(公告)号:US20100238754A1

    公开(公告)日:2010-09-23

    申请号:US12770610

    申请日:2010-04-29

    IPC分类号: G11C5/14

    摘要: A system, method and apparatus for clock and power fault detection for a memory module is provided. In one embodiment, a system is provided. The system includes a voltage detection circuit and a clock detection circuit. The system further includes a controller coupled to the voltage detection circuit and the clock detection circuit. The system also includes a memory control state machine coupled to the controller. The system includes volatile memory coupled to the memory control state machine. The system further includes a battery and battery regulation circuitry coupled to the controller and the memory control state machine. The battery, battery regulation circuitry, volatile memory, memory control state machine, controller, clock detection circuit and voltage detection circuit are all collectively included in a unitary memory module.

    摘要翻译: 提供了一种用于存储器模块的时钟和电源故障检测的系统,方法和装置。 在一个实施例中,提供了一种系统。 该系统包括电压检测电路和时钟检测电路。 该系统还包括耦合到电压检测电路和时钟检测电路的控制器。 该系统还包括耦合到控制器的存储器控​​制状态机。 该系统包括耦合到存储器控制状态机的易失性存储器。 该系统还包括耦合到控制器和存储器控制状态机的电池和电池调节电路。 电池,电池调节电路,易失性存储器,存储器控制状态机,控制器,时钟检测电路和电压检测电路都集成在一体的存储器模块中。

    Clock and power fault detection for memory modules
    5.
    发明授权
    Clock and power fault detection for memory modules 有权
    内存模块的时钟和电源故障检测

    公开(公告)号:US08644105B2

    公开(公告)日:2014-02-04

    申请号:US12770576

    申请日:2010-04-29

    IPC分类号: G11C8/00

    摘要: A system, method and apparatus for clock and power fault detection for a memory module is provided. In one embodiment, a system is provided. The system includes a voltage detection circuit and a clock detection circuit. The system further includes a controller coupled to the voltage detection circuit and the clock detection circuit. The system also includes a memory control state machine coupled to the controller. The system includes volatile memory coupled to the memory control state machine. The system further includes a battery and battery regulation circuitry coupled to the controller and the memory control state machine. The battery, battery regulation circuitry, volatile memory, memory control state machine, controller, clock detection circuit and voltage detection circuit are all collectively included in a unitary memory module.

    摘要翻译: 提供了一种用于存储器模块的时钟和电源故障检测的系统,方法和装置。 在一个实施例中,提供了一种系统。 该系统包括电压检测电路和时钟检测电路。 该系统还包括耦合到电压检测电路和时钟检测电路的控制器。 该系统还包括耦合到控制器的存储器控​​制状态机。 该系统包括耦合到存储器控制状态机的易失性存储器。 该系统还包括耦合到控制器和存储器控制状态机的电池和电池调节电路。 电池,电池调节电路,易失性存储器,存储器控制状态机,控制器,时钟检测电路和电压检测电路都集成在一体式存储器模块中。

    Multi-channel memory modules for computing devices
    6.
    发明申请
    Multi-channel memory modules for computing devices 审中-公开
    用于计算设备的多通道内存模块

    公开(公告)号:US20080123305A1

    公开(公告)日:2008-05-29

    申请号:US11605809

    申请日:2006-11-28

    IPC分类号: H05K1/14

    摘要: A dual-channel memory module for use in computing devices is disclosed. The memory module can include a substrate having a base portion, a first connector portion, and a second connector portion spaced apart and electrically insulated from the first connector portion. A first set of memory devices is disposed on the base portion and in electrical communication with the first connector portion, and a second set of memory devices is disposed on the base portion and in electrical communication with the second connector portion. The first and second sets of memory devices are independent of each other.

    摘要翻译: 公开了一种用于计算设备的双通道内存模块。 存储器模块可以包括具有基座部分,第一连接器部分和与第一连接器部分间隔开并与之电绝缘的第二连接器部分的基板。 第一组存储器件设置在基座部分上并且与第一连接器部分电连通,并且第二组存储器件设置在基座部分上并与第二连接器部分电连通。 第一组和第二组存储器件彼此独立。

    MULTI-RANK MEMORY MODULE THAT EMULATES A MEMORY MODULE HAVING A DIFFERENT NUMBER OF RANKS
    8.
    发明申请
    MULTI-RANK MEMORY MODULE THAT EMULATES A MEMORY MODULE HAVING A DIFFERENT NUMBER OF RANKS 有权
    模拟具有不同数量排名的记忆模块的多RAN记忆模块

    公开(公告)号:US20130036264A1

    公开(公告)日:2013-02-07

    申请号:US13568694

    申请日:2012-08-07

    IPC分类号: G06F12/00

    摘要: A transparent four rank memory module has a front side and a back side. The front side has a third memory rank stacked on a first memory rank. The back side has a fourth memory rank stacked on a second memory rank. An emulator coupled to the memory module activates and controls one individual memory rank from either the first memory rank, the second memory rank, the third memory rank, or the fourth memory rank based on the signals received from a memory controller.

    摘要翻译: 透明的四级存储器模块具有前侧和后侧。 前侧具有堆叠在第一存储器等级上的第三存储器级。 背面具有堆叠在第二存储器等级上的第四存储器级。 耦合到存储器模块的仿真器基于从存储器控制器接收的信号来激活并控制来自第一存储器级,第二存储器级,第三存储器级或第四存储器级的一个单独的存储器级。

    Multi-rank memory module that emulates a memory module having a different number of ranks
    9.
    发明授权
    Multi-rank memory module that emulates a memory module having a different number of ranks 有权
    模拟具有不同数量的存储器模块的多级存储器模块

    公开(公告)号:US08990489B2

    公开(公告)日:2015-03-24

    申请号:US13568694

    申请日:2012-08-07

    摘要: A transparent four rank memory module has a front side and a back side. The front side has a third memory rank stacked on a first memory rank. The back side has a fourth memory rank stacked on a second memory rank. An emulator coupled to the memory module activates and controls one individual memory rank from either the first memory rank, the second memory rank, the third memory rank, or the fourth memory rank based on the signals received from a memory controller.

    摘要翻译: 透明的四级存储器模块具有前侧和后侧。 前侧具有堆叠在第一存储器等级上的第三存储器级。 背面具有堆叠在第二存储器等级上的第四存储器级。 耦合到存储器模块的仿真器基于从存储器控制器接收的信号来激活并控制来自第一存储器级,第二存储器级,第三存储器级或第四存储器级的一个单独的存储器级。

    MULTI-RANK MEMORY MODULE THAT EMULATES A MEMORY MODULE HAVING A DIFFERENT NUMBER OF RANKS
    10.
    发明申请
    MULTI-RANK MEMORY MODULE THAT EMULATES A MEMORY MODULE HAVING A DIFFERENT NUMBER OF RANKS 审中-公开
    模拟具有不同数量排名的记忆模块的多RAN记忆模块

    公开(公告)号:US20110125966A1

    公开(公告)日:2011-05-26

    申请号:US12902073

    申请日:2010-10-11

    IPC分类号: G06F12/00

    摘要: A transparent four rank memory module has a front side and a back side. The front side has a third memory rank stacked on a first memory rank. The back side has a fourth memory rank stacked on a second memory rank. An emulator coupled to the memory module activates and controls one individual memory rank from either the first memory rank, the second memory rank, the third memory rank, or the fourth memory rank based on the signals received from a memory controller.

    摘要翻译: 透明的四级存储器模块具有前侧和后侧。 前侧具有堆叠在第一存储器等级上的第三存储器级。 背面具有堆叠在第二存储器等级上的第四存储器级。 耦合到存储器模块的仿真器基于从存储器控制器接收的信号来激活并控制来自第一存储器级,第二存储器级,第三存储器级或第四存储器级的一个单独的存储器级。