公开(公告)号：US20240295487A1

公开(公告)日：2024-09-05

申请号：US18270795

申请日：2022-01-25

申请人： NANOENTEK, INC.

发明人： Chan Il CHUNG ,  Hyoung Seop LEE ,  Sanghwa AHN

IPC分类号： G01N15/1433 ,  G01N15/01 ,  G01N15/14

CPC分类号： G01N15/1433 ,  G01N15/1456 ,  G01N15/01 ,  G01N2015/1486

摘要： In a fine particle counting method using a multi-channel sample chip and a fine particle counting apparatus implementing the method, a plurality of samples is observable in a short period of time and even when warpage occurs during a manufacturing process as a sample chip becomes larger, the warpage is corrected so as to count fine particles accurately. Problems that a focal distance of each channel is not constant due to warpage occurring in a chip having a plurality of channels, and thus it takes a lot of time to obtain an image by obtaining a focus value for each channel may be solved. A problem that since an amount of sample injected into each channel is small, a sample dries out when an image is not quickly obtained and used for counting, thereby causing the occurrence of measurement error may be prevented.