中科微点-全球专利检索

  1. Login
  2. Sign Up

Search Results

9 records (took 0.014 seconds)

    Apparatus and method for generating and providing detection model, and non-transitory storage medium
    1.
    发明授权
    Apparatus and method for generating and providing detection model, and non-transitory storage medium 有权

    公开(公告)号：US11796676B2

    公开(公告)日：2023-10-24

    申请号：US17692367

    申请日：2022-03-11

    Applicant: NEC Corporation

    Inventor： Masahiro Kawai ,  Shinichi Morimoto ,  Masaru Eto ,  Toshinori Takemura ,  Masayuki Ariyoshi

    IPC: G01S17/04 ,  G06F21/31 ,  G01N23/10 ,  G06N20/00

    CPC classification number: G01S17/04 ,  G01N23/10 ,  G06F21/31 ,  G06N20/00

    Abstract: For easily setting, for each of a plurality of detection apparatuses, a target object detected by the detection apparatus, a model providing apparatus including: a storage unit storing a machine learning model detecting a plurality of detection target objects, based on a received signal of a reflected wave of an electromagnetic wave with a wavelength equal to or greater than 30 micrometers and equal to or less than 1 meter; a request reception unit receiving a request for a detection model detecting the detection target object, based on the received signal; a selection unit selecting at least one out of a plurality of detection target objects for each request; generation unit generating a detection model detecting a selected detection target object and not detecting an unselected detection target object, based on the machine learning model; and a transmission unit transmitting the generated detection model to a detection apparatus is provided.

    MODEL PROVIDING APPARATUS, MODEL PROVIDING METHOD, AND NON-TRANSITORY STORAGE MEDIUM
    2.
    发明申请
    MODEL PROVIDING APPARATUS, MODEL PROVIDING METHOD, AND NON-TRANSITORY STORAGE MEDIUM 有权

    公开(公告)号：US20220299636A1

    公开(公告)日：2022-09-22

    申请号：US17692367

    申请日：2022-03-11

    Applicant: NEC Corporation

    Inventor： Masahiro Kawai ,  Shinichi Morimoto ,  Masaru Eto ,  Toshinori Takemura ,  Masayuki Ariyoshi

    IPC: G01S17/04 ,  G01N23/10 ,  G06F21/31

    Abstract: For easily setting, for each of a plurality of detection apparatuses, a target object detected by the detection apparatus, a model providing apparatus including: a storage unit storing a machine learning model detecting a plurality of detection target objects, based on a received signal of a reflected wave of an electromagnetic wave with a wavelength equal to or greater than 30 micrometers and equal to or less than 1 meter; a request reception unit receiving a request for a detection model detecting the detection target object, based on the received signal; a selection unit selecting at least one out of a plurality of detection target objects for each request; generation unit generating a detection model detecting a selected detection target object and not detecting an unselected detection target object, based on the machine learning model; and a transmission unit transmitting the generated detection model to a detection apparatus is provided.

    INSPECTION SYSTEM AND INSPECTION METHOD
    6.
    发明申请
    INSPECTION SYSTEM AND INSPECTION METHOD 有权

    公开(公告)号：US20220299454A1

    公开(公告)日：2022-09-22

    申请号：US17692359

    申请日：2022-03-11

    Applicant: NEC Corporation

    Inventor： Naoya NAKAYAMA ,  Masanori Sekido ,  Shinichi Morimoto ,  Masayuki Ariyoshi ,  Tatsuya Sumiya ,  Toshiyuki Nomura ,  Toshinori Takemura

    IPC: G01N23/10 ,  G01N23/04 ,  G01N23/18 ,  G01V5/00

    Abstract: To shorten a waiting time for a belongings inspection, the present invention provides an inspection system 10 including: an electromagnetic wave transmission/reception unit 11 that irradiates an electromagnetic wave having a wavelength of equal to or more than 30 micrometers and equal to or less than one meter, and receives a reflection wave; a detection unit 12 that performs detection processing of detecting an abnormal state, based on a signal of the reflection wave; a decision unit 13 that decides, for an inspection target person from which the abnormal state is detected, whether to perform a secondary inspection at a place or perform a secondary inspection later; and a registration unit 16 that registers, in association with a result of the detection processing, identification information about the inspection target person decided that a secondary inspection is performed later.

    Inspection system and inspection method
    7.
    发明授权
    Inspection system and inspection method 有权

    公开(公告)号：US12055717B2

    公开(公告)日：2024-08-06

    申请号：US17739414

    申请日：2022-05-09

    Applicant: NEC Corporation

    Inventor： Masanori Sekido ,  Naoya Nakayama ,  Shinichi Morimoto ,  Masayuki Ariyoshi ,  Toshinori Takemura

    IPC: G06V20/00 ,  G02B27/01 ,  G06V20/52

    CPC classification number: G02B27/017 ,  G06V20/52 ,  G02B2027/0138 ,  G02B2027/014 ,  G02B2027/0178

    Abstract: An inspection system acquires an inspection target person image including an inspection target person, irradiates an electromagnetic wave having a wavelength of equal to or more than 30 micrometers and equal to or less than one meter toward the inspection target person and receives a reflection wave, performs detection processing of detecting an anomalous state based on a signal of the reflection wave, causes a storage unit to store tracking target person information indicating an external appearance of a tracking target person being the inspection target person in which the anomalous state is detected, acquires a worker peripheral image including scenery in the periphery of a worker; detects the tracking target person from the worker peripheral image based on the tracking target person information, and notifies the worker of a position of the tracking target person detected from the worker peripheral image.

Patent Agency Ranking