公开(公告)号：US10120011B2

公开(公告)日：2018-11-06

申请号：US15117884

申请日：2015-02-12

Applicant: NHK Spring Co., Ltd.

Inventor： Kohei Hironaka ,  Takashi Nidaira ,  Tomohiro Yoneda

IPC: G01R31/02 ,  G01R1/073 ,  H01R13/24 ,  G01R31/28 ,  G01R31/26

Abstract: A test unit according to the present invention includes: a first contact probe contacting with an electrode provided on a front surface of one of contact targets, and contacting with an electrode of the other contact target; a second contact probe contacting with an electrode provided on a back surface of the one of contact targets and contacting with an electrode of a substrate; a first probe holder including a suction holder that sucks and holds the one of contact targets, and accommodating and holding therein the first contact probes; a second probe holder accommodating and holding therein the second contact probes; and a base portion, which is layered over the first probe holder and holds the other contact target at a side thereof layered over the first probe holder; and a gap is formed between the other contact target and the first probe holder.