摘要:
An immersion lithography apparatus includes an optical assembly that projects a beam onto a substrate through an immersion liquid, a containment member surrounding a path of the beam, a stage holding the substrate, an isolator having a first actuator which limits vibrations of the optical assembly, and a support system having a second actuator to support the containment member and move it by the second actuator. The containment member includes a first supply opening via which water as the immersion liquid is released, a recovery opening via which the immersion liquid is recovered from a gap between the containment member and the substrate and/or the stage, and a second supply opening via which the water is released to the gap between the containment member and the substrate and/or the stage, the second supply opening being provided radially inward of the recovery opening.
摘要:
A liquid immersion lithography apparatus includes a projection system, an opening from which liquid is supplied to a space under the projection system, the opening being connectable to a liquid source via a flow passage to supply the liquid to the space and the opening being connectable to a vacuum source via the flow passage, and a holding member by which a substrate is held, the holding member being movable below the projection system and the opening. The substrate held by the holding member is exposed through the liquid that is supplied from the opening and that covers only a portion of an upper surface of the substrate.
摘要:
A liquid immersion lithography apparatus includes a projection system having an optical member of which an incidence side has a convex lens shape, and a flow passage connected to a hole from which liquid is supplied. A substrate is exposed through the liquid covering only a portion of an upper surface of the substrate. The optical member has an end surface via which the exposure light is projected to the substrate via the liquid. A material having the end surface is fused silica.
摘要:
An immersion lithography apparatus includes (i) an optical assembly including an optical element, and configured to project a beam onto a substrate through an immersion liquid; (ii) a containment member that surrounds a path of the beam; and (iii) a stage on which the substrate is held, the substrate on the stage being moved below and spaced from a bottom surface of the containment member. The containment member includes: (1) a nozzle outlet via which water as the immersion liquid is released, (2) a recovery channel via which the immersion liquid is recovered from a gap between the containment member and the substrate and/or the stage, and (3) a fluid channel via which water is released to the gap between the containment member and the substrate and/or the stage, the fluid channel being provided radially inward of the recovery channel.
摘要:
A liquid immersion lithography apparatus includes a projection system including an optical member of which an incidence side has a convex lens shape, the projection system being configured to project an image through a liquid on a workpiece, and a liquid immersion member arranged below the optical member, the liquid immersion member having a plurality of openings through which the liquid is allowed to flow. A material of which the optical member is made is more resistant to the liquid than a material of which the liquid immersion member is made.
摘要:
An exposure apparatus exposes a substrate with light from an object through an optical assembly and liquid. The exposure apparatus includes a stage and a liquid supply system. The stage is movable relative to the optical assembly and holds the substrate so that the substrate faces the optical assembly across the liquid. The liquid supply system includes an outlet arranged so as to face a top surface of the substrate held by the stage and supplies the liquid from the outlet onto the top surface. The stage includes a support which supports an undersurface of the substrate, and a channel having a port. The port is arranged outside the support so as to recover the liquid supplied from the outlet and flowing outwardly from the top surface of the substrate supported by the support.
摘要:
An immersion lithography apparatus includes: an optical assembly including a plano-convex lens as a last optical element, the optical assembly configured to project an image onto a substrate through an immersion liquid; a containment member that surrounds a last portion of the optical assembly, the containment member having a channel via which the immersion liquid recovered from a gap between the containment member and the substrate and/or a stage holding the substrate is removed; an outlet above a bottom surface of the last optical element, via which the immersion liquid is released to a space between the optical assembly and the containment member; and an immersion liquid source apparatus from which the immersion liquid is delivered to the outlet, the immersion liquid source apparatus having a flow controller, and a flow sensor that measures a rate of a flow of the immersion liquid to be delivered to the outlet.
摘要:
A lithographic projection apparatus includes a projection system having a last element from which an exposure light is projected onto a wafer through liquid in a space under the last element. A light incident surface of the last element has a convex shape. A liquid retaining member is disposed adjacent to a surface of the last element through which the exposure light does not pass. The liquid retaining member has an undersurface under which liquid is retained. A gap is formed between the liquid retaining member and the surface of the last element, the gap being in fluidic communication with the space. The liquid is retained between the last element and the undersurface of the liquid retaining member on one side and an upper surface of the wafer on the other side. The liquid locally covers a portion of the upper surface of the wafer.
摘要:
A measurement assembly (12) for measuring a feature (14A) on a surface (16) includes a metrology system (18), a mover assembly (19), a pointer (22), and a control system (24). The metrology system (18) generates a measurement beam (26), and the mover assembly (19) selectively adjusts the direction of the measurement beam (26). The pointer (22) is handheld and generates a pointer beam (34) that can be selectively directed at the surface (16) to form a pointer spot (36) on the surface (16). Further, the control system (24) controls the mover assembly (19) to move the direction of the measurement beam (26) until the measurement beam (26) is approximately directed at the pointer spot (36).
摘要:
An immersion lithography apparatus includes a projection system having a last optical element, a plurality of liquid supply openings that surround a path of exposure light that exits an end surface of the last optical element and face downwardly, and a plurality of liquid recovery openings that surround the path of the exposure light, are arranged radially outward of the liquid supply openings, and face downwardly. An upper surface of a substrate is opposite to the liquid supply openings and the liquid recovery openings. A portion of the upper surface of the substrate is covered with immersion liquid, which flows across the end surface of the last optical element. The substrate is exposed with the exposure light through the immersion liquid between the end surface of the last optical element and the upper surface the substrate.