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公开(公告)号：US20150185166A1
公开(公告)日：2015-07-02
申请号：US14582069
申请日：2014-12-23
发明人： Huaping TANG , Zhiqiang CHEN , Chuanxiang TANG , Huaibi CHEN , Yuanjing LI , Ziran ZHAO , Yaohong LIU , Shangmin SUN , Xinshui YAN , Zhanfeng QIN
CPC分类号： G01N23/043 , G01T7/08 , G01V5/0033 , G01V5/0041 , G01V5/005 , G21K1/025
摘要： The X-ray fluoroscopic imaging system of the present invention comprises: an inspection passage; an electron accelerator; a shielding collimator apparatus comprising a shielding structure, and a first collimator for extracting a low energy planar sector X-ray beam and a second collimator for extracting a high energy planar sector X-ray beam which are disposed within the shielding structure; a low energy detector array for receiving the X-ray beam from the first collimator; and a high energy detector array for receiving the X-ray beam from the second collimator. The first collimator, the low energy detector array and the target point bombarded by the electron beam are located in a first plane; and the second collimator, the high energy detector array and the target point bombarded by the electron beam are located in a second plane.
摘要翻译： 本发明的X射线透视成像系统包括：检查通道; 电子加速器; 包括屏蔽结构的屏蔽准直器装置和用于提取低能平面扇形X射线束的第一准直器和用于提取设置在屏蔽结构内的高能平面扇形X射线束的第二准直器; 低能量检测器阵列，用于接收来自第一准直仪的X射线束; 以及用于从第二准直器接收X射线束的高能量检测器阵列。 第一准直器，低能量检测器阵列和由电子束轰击的目标点位于第一平面中; 并且第二准直器，高能量检测器阵列和由电子束轰击的目标点位于第二平面中。
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公开(公告)号：US20170365440A1
公开(公告)日：2017-12-21
申请号：US15696919
申请日：2017-09-06
发明人： Yuanjing LI , Yaohong LIU , Jinsheng LIU , Huaping TANG , Chuanxiang TANG , Huaibi CHEN , Xinshui YAN
CPC分类号： H01J35/14 , H01J35/16 , H01J35/30 , H01J2235/16
摘要： An apparatus and method to generate distributed x-rays. A hot cathode of an electron gun is used in vacuum to generate electron beams having certain initial movement energy and speed. Periodic scanning is performed with the initial low-energy electron beams, which are thus caused to be reciprocally deflected. A current-limiting device is provided in the travel path of the electron beams along the direction of the reciprocal deflection. Through holes arranged in an array on the current-limiting device, only part of the electron beams targeting specific positions can pass to form sequential electron beam currents distributed in an array. These electron beam currents are accelerated by a high-voltage electric field to obtain high energy, bombard an anode target, and thus sequentially generate corresponding focus spots and x-rays distributed in an array at the anode target.
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公开(公告)号：US20150185356A1
公开(公告)日：2015-07-02
申请号：US14582076
申请日：2014-12-23
发明人： Huaping TANG , Zhiqiang CHEN , Chuanxiang TANG , Huaibi CHEN , Yuanjing LI , Ziran ZHAO , Yaohong LIU , Shangmin SUN , Xinshui YAN , Zhanfeng QIN
IPC分类号： G01V5/00
CPC分类号： G01V5/0016 , G01V5/0033 , G01V5/005 , G01V5/0066
摘要： The present invention may perform fluoroscopic imaging simultaneously on the subjects in at least two channels using only one electron accelerator, at least two sets of X-ray beams and at least two sets of detector systems, through the design of the electron accelerator, the shielding and collimating device, the at least two detector arrays and various mechanical composite structures. The X-ray fluoroscopic imaging system according to the present invention may be designed in specific forms of a stationary type, an assembled type, a track mobile type or vehicular mobile type, etc., and has advantages such as simple structure, low cost, strong function, good image quality and the like.
摘要翻译： 本发明可以通过电子加速器的设计，通过电子加速器的设计，仅使用一个电子加速器，至少两组X射线束和至少两组检测器系统，在至少两个通道中的受试者上进行透视成像 和准直装置，至少两个检测器阵列和各种机械复合结构。 根据本发明的X射线透视成像系统可以以固定型，组装式，轨道移动型或车辆型移动式等的特定形式设计，具有结构简单，成本低廉等优点， 功能强大，图像质量好等优点。
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公开(公告)号：US20200137868A1
公开(公告)日：2020-04-30
申请号：US16667849
申请日：2019-10-29
发明人： Jinsheng LIU , Yaohong LIU , Wei JIA , Xinshui YAN , Wei LI
摘要： The present disclosure provides a filament power supply for an electron accelerator and an electron accelerator. The filament power supply includes: a rectifier circuit configured to convert a power frequency AC voltage signal into a DC voltage signal; an inverter circuit configured to convert the DC voltage signal into an AC voltage signal; a sampling circuit configured to sample the AC voltage signal to obtain a current sampling signal or a voltage sampling signal; a pulse width modulation control chip configured to adjust a pulse width modulation signal until a voltage of the current sampling signal is equal to that of a reference current signal, or a voltage of the voltage sampling signal is equal to that of a reference voltage signal; a modulation circuit configured to modulate the power frequency AC voltage signal to obtain a modulation signal and output the pulse width modulation signal and the modulation signal.
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