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公开(公告)号:US10079603B1
公开(公告)日:2018-09-18
申请号:US15947855
申请日:2018-04-08
Applicant: NXP B.V.
Inventor: Chinmayee Kumari Panigrahi
IPC: H03K19/0185 , H03K5/13 , H04L25/02
CPC classification number: H03K19/018528 , H03K5/13 , H03K19/018585 , H04L25/026 , H04L25/0272 , H04L25/0282
Abstract: A driver circuit for an integrated circuit (IC) is configurable to operate in three different signaling modes, namely, differential signaling mode, single-ended current mode, and single-ended voltage mode. The driver circuit receives first and second input signals from a pre-driver and outputs first and second output signals that conform with the selected one of the three signaling modes.
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公开(公告)号:US20230139245A1
公开(公告)日:2023-05-04
申请号:US17452875
申请日:2021-10-29
Applicant: NXP B.V.
Inventor: Marcin Grad , Chinmayee Kumari Panigrahi , Maciej Skrobacki
Abstract: An ESD protection circuit that includes a clamp path including two clamp transistors and a GIDL detection circuit for detecting GIDL current conditions in the ESD protection circuit. The GIDL detection circuit generates a signal indicative of a GIDL current condition. The signal is utilized to control a voltage of a control electrode of a clamp transistor of the clamp path to increase the conductivity of the clamp transistor when the signal is indicative of a GIDL current condition to minimize a GIDL current through at least through a portion of the clamp path when the second clamp transistor is nonconductive where no ESD current is being discharged through the clamp path.
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公开(公告)号:US12015407B1
公开(公告)日:2024-06-18
申请号:US18163347
申请日:2023-02-02
Applicant: NXP B.V.
Inventor: Chinmayee Kumari Panigrahi , Marcin Grad , Aman Chugh
IPC: H03K19/0175 , H03K3/356 , H03K19/00 , H03K19/003 , H03K19/0185
CPC classification number: H03K3/35613 , H03K19/0008 , H03K19/00361 , H03K19/0175 , H03K19/018528
Abstract: A circuit that includes a level shifter. The level shifter includes a shift path with two transistors coupled in series. The circuit also includes a GIDL detection circuit for detecting GIDL current conditions. The GIDL detection circuit generates a GIDL signal indicative of a GIDL current condition. The signal is utilized to control a voltage of a control electrode of a transistor of the shift path to increase the conductivity of the transistor when the signal is indicative of a GIDL current condition to minimize a GIDL current through at least a portion of the shift path when the second transistor is nonconductive due to the level shifter being in a low power mode.
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公开(公告)号:US20240195394A1
公开(公告)日:2024-06-13
申请号:US18163347
申请日:2023-02-02
Applicant: NXP B.V.
Inventor: Chinmayee Kumari Panigrahi , Marcin Grad , Aman Chugh
IPC: H03K3/356 , H03K19/003 , H03K19/0185
CPC classification number: H03K3/35613 , H03K19/00361 , H03K19/018528
Abstract: A circuit that includes a level shifter. The level shifter includes a shift path with two transistors coupled in series. The circuit also includes a GIDL detection circuit for detecting GIDL current conditions. The GIDL detection circuit generates a GIDL signal indicative of a GIDL current condition. The signal is utilized to control a voltage of a control electrode of a transistor of the shift path to increase the conductivity of the transistor when the signal is indicative of a GIDL current condition to minimize a GIDL current through at least a portion of the shift path when the second transistor is nonconductive due to the level shifter being in a low power mode.
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公开(公告)号:US11923840B1
公开(公告)日:2024-03-05
申请号:US18180167
申请日:2023-03-08
Applicant: NXP B.V.
IPC: G06F1/24 , G06F1/28 , H03K17/687 , H03K19/0185
CPC classification number: H03K17/6872 , G06F1/28 , H03K19/018571
Abstract: A power down signal generator generates a power down signal. The power down signal generator includes a detection transistor, a resistor coupled in series with the detection transistor, and a compensation transistor coupled in parallel to the resistor. The detection transistor receives a first supply voltage in a first voltage domain and a current. A control voltage is generated across the resistor based on a first part of the current. The compensation transistor receives a bias voltage derived from a second supply voltage in a second voltage domain and sinks, based on the bias voltage, a second part of the current to maintain the control voltage within a predefined range. The generation of the power down signal is controlled based on the first supply voltage and the control voltage.
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公开(公告)号:US11855450B2
公开(公告)日:2023-12-26
申请号:US17452875
申请日:2021-10-29
Applicant: NXP B.V.
Inventor: Marcin Grad , Chinmayee Kumari Panigrahi , Maciej Skrobacki
CPC classification number: H02H9/046 , H02H1/0007
Abstract: An ESD protection circuit that includes a clamp path including two clamp transistors and a GIDL detection circuit for detecting GIDL current conditions in the ESD protection circuit. The GIDL detection circuit generates a signal indicative of a GIDL current condition. The signal is utilized to control a voltage of a control electrode of a clamp transistor of the clamp path to increase the conductivity of the clamp transistor when the signal is indicative of a GIDL current condition to minimize a GIDL current through at least through a portion of the clamp path when the second clamp transistor is nonconductive where no ESD current is being discharged through the clamp path.
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公开(公告)号:US11804709B2
公开(公告)日:2023-10-31
申请号:US17452875
申请日:2021-10-29
Applicant: NXP B.V.
Inventor: Marcin Grad , Chinmayee Kumari Panigrahi , Maciej Skrobacki
CPC classification number: H02H9/046 , H02H1/0007
Abstract: An ESD protection circuit that includes a clamp path including two clamp transistors and a GIDL detection circuit for detecting GIDL current conditions in the ESD protection circuit. The GIDL detection circuit generates a signal indicative of a GIDL current condition. The signal is utilized to control a voltage of a control electrode of a clamp transistor of the clamp path to increase the conductivity of the clamp transistor when the signal is indicative of a GIDL current condition to minimize a GIDL current through at least through a portion of the clamp path when the second clamp transistor is nonconductive where no ESD current is being discharged through the clamp path.
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