ESD PROTECTION CIRCUIT WITH GIDL CURRENT DETECTION

    公开(公告)号:US20230139245A1

    公开(公告)日:2023-05-04

    申请号:US17452875

    申请日:2021-10-29

    Applicant: NXP B.V.

    Abstract: An ESD protection circuit that includes a clamp path including two clamp transistors and a GIDL detection circuit for detecting GIDL current conditions in the ESD protection circuit. The GIDL detection circuit generates a signal indicative of a GIDL current condition. The signal is utilized to control a voltage of a control electrode of a clamp transistor of the clamp path to increase the conductivity of the clamp transistor when the signal is indicative of a GIDL current condition to minimize a GIDL current through at least through a portion of the clamp path when the second clamp transistor is nonconductive where no ESD current is being discharged through the clamp path.

    LEVEL SHIFTER WITH GIDL CURRENT REDUCTION
    4.
    发明公开

    公开(公告)号:US20240195394A1

    公开(公告)日:2024-06-13

    申请号:US18163347

    申请日:2023-02-02

    Applicant: NXP B.V.

    CPC classification number: H03K3/35613 H03K19/00361 H03K19/018528

    Abstract: A circuit that includes a level shifter. The level shifter includes a shift path with two transistors coupled in series. The circuit also includes a GIDL detection circuit for detecting GIDL current conditions. The GIDL detection circuit generates a GIDL signal indicative of a GIDL current condition. The signal is utilized to control a voltage of a control electrode of a transistor of the shift path to increase the conductivity of the transistor when the signal is indicative of a GIDL current condition to minimize a GIDL current through at least a portion of the shift path when the second transistor is nonconductive due to the level shifter being in a low power mode.

    Power down signal generator
    5.
    发明授权

    公开(公告)号:US11923840B1

    公开(公告)日:2024-03-05

    申请号:US18180167

    申请日:2023-03-08

    Applicant: NXP B.V.

    CPC classification number: H03K17/6872 G06F1/28 H03K19/018571

    Abstract: A power down signal generator generates a power down signal. The power down signal generator includes a detection transistor, a resistor coupled in series with the detection transistor, and a compensation transistor coupled in parallel to the resistor. The detection transistor receives a first supply voltage in a first voltage domain and a current. A control voltage is generated across the resistor based on a first part of the current. The compensation transistor receives a bias voltage derived from a second supply voltage in a second voltage domain and sinks, based on the bias voltage, a second part of the current to maintain the control voltage within a predefined range. The generation of the power down signal is controlled based on the first supply voltage and the control voltage.

    ESD protection circuit with GIDL current detection

    公开(公告)号:US11855450B2

    公开(公告)日:2023-12-26

    申请号:US17452875

    申请日:2021-10-29

    Applicant: NXP B.V.

    CPC classification number: H02H9/046 H02H1/0007

    Abstract: An ESD protection circuit that includes a clamp path including two clamp transistors and a GIDL detection circuit for detecting GIDL current conditions in the ESD protection circuit. The GIDL detection circuit generates a signal indicative of a GIDL current condition. The signal is utilized to control a voltage of a control electrode of a clamp transistor of the clamp path to increase the conductivity of the clamp transistor when the signal is indicative of a GIDL current condition to minimize a GIDL current through at least through a portion of the clamp path when the second clamp transistor is nonconductive where no ESD current is being discharged through the clamp path.

    ESD protection circuit with GIDL current detection

    公开(公告)号:US11804709B2

    公开(公告)日:2023-10-31

    申请号:US17452875

    申请日:2021-10-29

    Applicant: NXP B.V.

    CPC classification number: H02H9/046 H02H1/0007

    Abstract: An ESD protection circuit that includes a clamp path including two clamp transistors and a GIDL detection circuit for detecting GIDL current conditions in the ESD protection circuit. The GIDL detection circuit generates a signal indicative of a GIDL current condition. The signal is utilized to control a voltage of a control electrode of a clamp transistor of the clamp path to increase the conductivity of the clamp transistor when the signal is indicative of a GIDL current condition to minimize a GIDL current through at least through a portion of the clamp path when the second clamp transistor is nonconductive where no ESD current is being discharged through the clamp path.

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