公开(公告)号：US12094510B2

公开(公告)日：2024-09-17

申请号：US17807518

申请日：2022-06-17

Applicant: NXP USA, Inc.

Inventor： Anirban Roy ,  Thomas Stephen Harp ,  Nihaar N. Mahatme ,  Jon Scott Choy

IPC: G11C11/16

CPC classification number: G11C11/1675 ,  G11C11/1655 ,  G11C11/1657 ,  G11C11/1673 ,  G11C11/1677

Abstract: A magnetoresistive random access memory (MRAM) array includes a data array and a sensor array. Each MRAM cell includes a Magnetic Tunnel Junction (MTJ). Each MRAM cell of the data array stores a data bit. A first and second column of the sensor array are connected to form a sensor column which includes sensor cells, each formed by a first MRAM cell in the first column together with a second MRAM cell in the second column along a same word line. Only one of a first MTJ of the first MRAM cell or second MTJ of the second MRAM cell is used as an MTJ of the sensor cell, and drain electrodes of select transistors of the first and second MRAM cells are electrically connected. Read circuitry provides read data from the data array and a sensor output indicative of a rupture state of an MTJ of the sensor array.

公开(公告)号：US20230410870A1

公开(公告)日：2023-12-21

申请号：US17807518

申请日：2022-06-17

Applicant: NXP USA, Inc.

Inventor： Anirban Roy ,  Thomas Stephen Harp ,  Nihaar N. Mahatme ,  Jon Scott Choy

IPC: G11C11/16

CPC classification number: G11C11/1675 ,  G11C11/1673 ,  G11C11/1655 ,  G11C11/1657 ,  G11C11/1677

Abstract: A magnetoresistive random access memory (MRAM) array includes a data array and a sensor array. Each MRAM cell includes a Magnetic Tunnel Junction (MTJ). Each MRAM cell of the data array stores a data bit. A first and second column of the sensor array are connected to form a sensor column which includes sensor cells, each formed by a first MRAM cell in the first column together with a second MRAM cell in the second column along a same word line. Only one of a first MTJ of the first MRAM cell or second MTJ of the second MRAM cell is used as an MTJ of the sensor cell, and drain electrodes of select transistors of the first and second MRAM cells are electrically connected. Read circuitry provides read data from the data array and a sensor output indicative of a rupture state of an MTJ of the sensor array.