-
公开(公告)号：US11985740B2
公开(公告)日：2024-05-14
申请号：US17612896
申请日：2020-06-04
发明人： Michael Binder , Holger Specht , Maximilian Tauer
摘要： A method for operating a light emitting diode arrangement with at least one light emitting diode includes the steps of: a) determining at least one instantaneous current-voltage value pair; b) matching the instantaneous current-voltage value pair with an original current-voltage value pair; and c) determining an updated current feed based on the matching and driving the light emitting diode with the updated current feed.
-
2.发明申请公开(公告)号：US20190189527A1
公开(公告)日：2019-06-20
申请号：US16323237
申请日：2017-07-25
发明人： Holger Specht , Roland Zeisel , Anton Vogl , Jens Ebbecke
IPC分类号： H01L21/66 , G01R31/265 , G01R31/26
CPC分类号： H01L22/12 , G01R31/2601 , G01R31/2656 , G01R31/311
摘要： A method and a device for measuring a plurality of semiconductor chips in a wafer array are disclosed. In an embodiment a method for measuring the semiconductor chips in a wafer array, wherein the wafer array is arranged on an electrically conductive carrier so that in each case back contacts of the semiconductor chips are contacted by the carrier, wherein a contact structure is arranged on a side of the wafer array facing away from the carrier, and wherein the contact structure includes a contact element and/or a plurality of radiation-emitting measurement semiconductor chips, includes applying a voltage between the contact structure and the carrier and measuring the semiconductor chips depending on a luminous image which is generated by emitted radiation which is caused simultaneously by fluorescence when the semiconductor chips are illuminated or by a radiation-emitting operation of the measurement semiconductor chips when the voltage is applied.
-
公开(公告)号：US09683888B2
公开(公告)日：2017-06-20
申请号：US14423695
申请日：2013-08-22
CPC分类号： G01J1/0425 , G01J1/0474 , G01J1/42 , G01J2001/4252 , G01M11/30
摘要： The invention relates to a method for measuring a light radiation (300) emitted by a light-emitting diode (210). In the method, an end (121) of an optical fiber (120) which is connected to a measuring device (130) is irradiated with the light radiation (300), which is emitted by the light-emitting diode (210), through an optical device (140), so that a portion of the light radiation (300) is coupled into the optical fiber (120) and is guided to the measuring device (130). The optical device (140) causes the light radiation (300) passing through the optical device (140) to be emitted in diffuse form in the direction of the end (121) of the optical fiber (120). The invention also relates to an apparatus (100) for measuring a light radiation (300) emitted by a light-emitting diode (210).
-
公开(公告)号：US20150204718A1
公开(公告)日：2015-07-23
申请号：US14423695
申请日：2013-08-22
CPC分类号： G01J1/0425 , G01J1/0474 , G01J1/42 , G01J2001/4252 , G01M11/30
摘要： The invention relates to a method for measuring a light radiation (300) emitted by a light-emitting diode (210). In the method, an end (121) of an optical fibre (120) which is connected to a measuring device (130) is irradiated with the light radiation (300), which is emitted by the light-emitting diode (210), through an optical device (140), so that a portion of the light radiation (300) is coupled into the optical fibre (120) and is guided to the measuring device (130). The optical device (140) causes the light radiation (300) passing through the optical device (140) to be emitted in diffuse form in the direction of the end (121) of the optical fibre (120). The invention also relates to an apparatus (100) for measuring a light radiation (300) emitted by a light-emitting diode (210).
摘要翻译： 本发明涉及一种用于测量由发光二极管（210）发射的光辐射（300）的方法。 在该方法中，连接到测量装置（130）的光纤（120）的端部（121）被由发光二极管（210）发射的光辐射（300）照射通过 光学装置（140），使得光辐射（300）的一部分耦合到光纤（120）中并被引导到测量装置（130）。 光学装置（140）使通过光学装置（140）的光辐射沿着光纤（120）的端部（121）的方向以漫射形式发射。 本发明还涉及一种用于测量由发光二极管（210）发射的光辐射（300）的装置（100）。
-
-
-
搜索结果
4 条记录 (耗时 0.013 秒)
