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公开(公告)号：US10146604B2
公开(公告)日：2018-12-04
申请号：US15244190
申请日：2016-08-23
Applicant: Oracle International Corporation
Inventor： David Rudy , George Kechriotis , Patrick O'Grady , James Gemmell
Abstract: Utilities for use in actively detecting the occurrence of bad blocks in NAND flash storage devices and diagnosing the devices as faulty at some point before complete failure of the devices (e.g., before a number of allowable bad blocks has been reached) to allow a corresponding service processor to continue to write to available blocks for a period of time until a replacement NAND flash device can be identified. The utilities may also be utilized to predict the future occurrence of bad blocks in NAND flash devices, such as during the “burn-in” process of the devices (e.g., which tests the quality of the NAND flash device before being placed into service to weed out devices with defects).
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公开(公告)号：US20180060148A1
公开(公告)日：2018-03-01
申请号：US15244190
申请日：2016-08-23
Applicant: Oracle International Corporation
Inventor： David Rudy , George Kechriotis , Patrick O'Grady , James Gemmell
CPC classification number: G06F11/076 , G06F11/0727 , G06F11/0772 , G06F11/079 , G06F11/2069 , G06F2201/805 , G11C29/38 , G11C29/44 , G11C29/52
Abstract: Utilities for use in actively detecting the occurrence of bad blocks in NAND flash storage devices and diagnosing the devices as faulty at some point before complete failure of the devices (e.g., before a number of allowable bad blocks has been reached) to allow a corresponding service processor to continue to write to available blocks for a period of time until a replacement NAND flash device can be identified. The utilities may also be utilized to predict the future occurrence of bad blocks in NAND flash devices, such as during the “burn-in” process of the devices (e.g., which tests the quality of the NAND flash device before being placed into service to weed out devices with defects).
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