公开(公告)号：US10146604B2

公开(公告)日：2018-12-04

申请号：US15244190

申请日：2016-08-23

Applicant: Oracle International Corporation

Inventor： David Rudy ,  George Kechriotis ,  Patrick O'Grady ,  James Gemmell

IPC: G06F11/00 ,  G06F11/07 ,  G06F11/20 ,  G11C29/38 ,  G11C29/44 ,  G11C29/52

Abstract: Utilities for use in actively detecting the occurrence of bad blocks in NAND flash storage devices and diagnosing the devices as faulty at some point before complete failure of the devices (e.g., before a number of allowable bad blocks has been reached) to allow a corresponding service processor to continue to write to available blocks for a period of time until a replacement NAND flash device can be identified. The utilities may also be utilized to predict the future occurrence of bad blocks in NAND flash devices, such as during the “burn-in” process of the devices (e.g., which tests the quality of the NAND flash device before being placed into service to weed out devices with defects).

公开(公告)号：US20180060148A1

公开(公告)日：2018-03-01

申请号：US15244190

申请日：2016-08-23

Applicant: Oracle International Corporation

Inventor： David Rudy ,  George Kechriotis ,  Patrick O'Grady ,  James Gemmell

IPC: G06F11/07 ,  G11C16/16 ,  G11C16/10 ,  G11C16/26 ,  G06F11/20 ,  G11C29/38 ,  G11C29/44

CPC classification number: G06F11/076 ,  G06F11/0727 ,  G06F11/0772 ,  G06F11/079 ,  G06F11/2069 ,  G06F2201/805 ,  G11C29/38 ,  G11C29/44 ,  G11C29/52

Abstract: Utilities for use in actively detecting the occurrence of bad blocks in NAND flash storage devices and diagnosing the devices as faulty at some point before complete failure of the devices (e.g., before a number of allowable bad blocks has been reached) to allow a corresponding service processor to continue to write to available blocks for a period of time until a replacement NAND flash device can be identified. The utilities may also be utilized to predict the future occurrence of bad blocks in NAND flash devices, such as during the “burn-in” process of the devices (e.g., which tests the quality of the NAND flash device before being placed into service to weed out devices with defects).

公开(公告)号：US20200174875A1

公开(公告)日：2020-06-04

申请号：US16204615

申请日：2018-11-29

Applicant: Oracle International Corporation

Inventor： David Rudy ,  Robert Hueston ,  Scott Cooke ,  Paul Mitchell

IPC: G06F11/07

Abstract: Utilities (e.g., systems, methods, etc.) that make use of a secure input/output (I/O) channel between system firmware (e.g., BIOS) and the SP to allow the BIOS to securely send data (e.g., error data) for secure consumption by the SP while preventing or limiting other sources from sending falsified data or the like the SP. The secure I/O channel includes interface hardware (e.g., Field-programmable gate array (FPGA)) that is configured to be unlocked by the BIOS using a security key received from a key generator over a separate security channel. After such data is securely sent to the interface hardware, the BIOS may then pass error interrupt(s) to the OS for performing of any necessary recovery actions. At any appropriate time, the SP may read or consume error data from the memory register of the interface hardware and perform any appropriate diagnoses and/or handling of the error data.