Array VSS biasing for NAND array programming reliability
    1.
    发明授权
    Array VSS biasing for NAND array programming reliability 失效
    阵列VSS偏置用于NAND阵列编程的可靠性

    公开(公告)号:US5978266A

    公开(公告)日:1999-11-02

    申请号:US24880

    申请日:1998-02-17

    IPC分类号: G11C16/04 G11C16/10

    CPC分类号: G11C16/0483 G11C16/10

    摘要: A method is provided for biasing a NAND array EEPROM during programming to allow the array to be scaled down further before reach punchthrough. The sources of the ground-select transistors of the NAND array are biased at V.sub.cc instead of ground to reduce the voltage drop across the source and drain of the ground-select transistors. As a result, the channel length of the ground-select transistors can be further shortened before punchthrough is obtained, resulting in a higher density EEPROM.

    摘要翻译: 提供了一种用于在编程期间偏置NAND阵列EEPROM以允许阵列在进入穿透之前被进一步缩小的方法。 NAND阵列的接地选择晶体管的源极被偏置为Vcc而不是接地,以减小接地选择晶体管的源极和漏极两端的电压降。 结果,在获得穿通之前,可以进一步缩短接地选择晶体管的沟道长度,从而产生更高密度的EEPROM。

    Precharging scheme for reading a memory cell
    2.
    发明授权
    Precharging scheme for reading a memory cell 有权
    读取存储单元的预充电方案

    公开(公告)号:US06771543B2

    公开(公告)日:2004-08-03

    申请号:US10226912

    申请日:2002-08-22

    IPC分类号: G11C1606

    摘要: A method of reading a memory cell, and a memory array using the method, are described. An electrical load is applied to a first node in the memory array, the first node corresponding to the memory cell. A second node in the memory array, the second node on a same word line as the first node, is precharged. The second node is separated from the first node by at least one intervening node in the same word line.

    摘要翻译: 描述读取存储单元的方法和使用该方法的存储器阵列。 将电负载施加到存储器阵列中的第一节点,第一节点对应于存储器单元。 存储器阵列中的第二个节点,与第一个节点相同的字线上的第二个节点被预充电。 第二节点与同一字线中的至少一个中间节点与第一节点分离。