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    Multiview face capture using polarized spherical gradient illumination
    2.
    发明授权
    Multiview face capture using polarized spherical gradient illumination 有权
    使用极化球面梯度照明的多视角人脸捕获

    公开(公告)号：US09123116B2

    公开(公告)日：2015-09-01

    申请号：US13449729

    申请日：2012-04-18

    申请人： Paul E. Debevec ,  Abhijeet Ghosh ,  Graham Fyffe

    发明人： Paul E. Debevec ,  Abhijeet Ghosh ,  Graham Fyffe

    IPC分类号： G06T7/00 ,  H04N13/02 ,  G06K9/00 ,  G06K9/20

    CPC分类号： G06T7/0073 ,  G06K9/00255 ,  G06K9/2036 ,  G06T7/586 ,  G06T2207/10016 ,  G06T2207/10152 ,  G06T2207/30201 ,  H04N13/254 ,  H04N13/282

    摘要： A multiview face capture system may acquire detailed facial geometry with high resolution diffuse and specular photometric information from multiple viewpoints. A lighting system may illuminate a face with polarized light from multiple directions. The light may be polarized substantially parallel to a reference axis during a parallel polarization mode of operation and substantially perpendicular to the reference axis during a perpendicular polarization mode of operation. Multiple cameras may each capture an image of the face along a materially different optical axis and have a linear polarizer configured to polarize light traveling along its optical axis in a direction that is substantially parallel to the reference axis. A controller may cause each of the cameras to capture an image of the face while the lighting system is in the parallel polarization mode of operation and again while the lighting system is in the perpendicular polarization mode of operation.

    摘要翻译： 多视角人脸捕获系统可以从多个视点获取具有高分辨率漫反射光度信息的详细面部几何。 照明系统可以用来自多个方向的偏振光照亮面部。 在平行极化操作模式期间，光可以基本平行于参考轴线极化，并且在垂直偏振操作模式期间基本垂直于基准轴线。 多个摄像机可以各自沿着物理上不同的光轴捕获面部的图像，并且具有线性偏振器，其被配置为使沿着其光轴沿基本上平行于参考轴线的方向偏振光。 控制器可以使得每个照相机在照明系统处于并行极化操作模式的同时再次照明系统处于垂直极化操作模式时捕获脸部的图像。

    Estimating spectral distribution of reflections from object surface based on low frequency illumination
    3.
    发明授权
    Estimating spectral distribution of reflections from object surface based on low frequency illumination 有权
    基于低频照明估计物体表面的反射光谱分布

    公开(公告)号：US08300234B2

    公开(公告)日：2012-10-30

    申请号：US12803398

    申请日：2010-06-24

    申请人： Paul E. Debevec ,  Abhijeet Ghosh ,  Pieter Peers ,  Graham Fyffe

    发明人： Paul E. Debevec ,  Abhijeet Ghosh ,  Pieter Peers ,  Graham Fyffe

    IPC分类号： G01B11/30

    CPC分类号： G01N21/55 ,  G01N2021/556

    摘要： A system for estimating the specular roughness of points on a surface of an object may include a lighting system, an image capture system and a computer processing system. The lighting system may be configured to illuminate the surface of the object at different times with different illumination patterns. Each illumination pattern may illuminate the surface from a plurality of different directions and form an intensity gradient having an order of no more than two. The image capture system may be configured to capture an image of the surface of the object when illuminated by each of the different illumination patterns at each of the different times. The computer processing system may be configured to compute the specular roughness of each point on the surface of the object based on the images captured by the image capture system.

    摘要翻译： 用于估计物体表面上的点的镜面粗糙度的系统可以包括照明系统，图像捕获系统和计算机处理系统。 照明系统可以被配置为在不同的照明图案的不同时间照亮物体的表面。 每个照明图案可以从多个不同的方向照亮表面，并形成具有不超过两个数量级的强度梯度。 图像拍摄系统可以被配置为当在不同时间的每一个时由每个不同的照明图案照亮时捕获对象的表面的图像。 计算机处理系统可以被配置为基于由图像捕获系统捕获的图像来计算物体表面上的每个点的镜面粗糙度。

    Estimating spectral distribution of reflections from object surface based on low frequency illumination
    4.
    发明申请
    Estimating spectral distribution of reflections from object surface based on low frequency illumination 有权
    基于低频照明估计物体表面的反射光谱分布

    公开(公告)号：US20100328677A1

    公开(公告)日：2010-12-30

    申请号：US12803398

    申请日：2010-06-24

    申请人： Paul E. Debevec ,  Abhijeet Ghosh ,  Pieter Peers ,  Graham Fyffe

    发明人： Paul E. Debevec ,  Abhijeet Ghosh ,  Pieter Peers ,  Graham Fyffe

    IPC分类号： G01B11/30

    CPC分类号： G01N21/55 ,  G01N2021/556

    摘要： A system for estimating the specular roughness of points on a surface of an object may include a lighting system, an image capture system and a computer processing system. The lighting system may be configured to illuminate the surface of the object at different times with different illumination patterns. Each illumination pattern may illuminate the surface from a plurality of different directions and form an intensity gradient having an order of no more than two. The image capture system may be configured to capture an image of the surface of the object when illuminated by each of the different illumination patterns at each of the different times. The computer processing system may be configured to compute the specular roughness of each point on the surface of the object based on the images captured by the image capture system.

    摘要翻译： 用于估计物体表面上的点的镜面粗糙度的系统可以包括照明系统，图像捕获系统和计算机处理系统。 照明系统可以被配置为在不同的照明图案的不同时间照亮物体的表面。 每个照明图案可以从多个不同的方向照亮表面，并形成具有不超过两个数量级的强度梯度。 图像拍摄系统可以被配置为当在不同时间的每一个时由每个不同的照明图案照亮时捕获对象的表面的图像。 计算机处理系统可以被配置为基于由图像捕获系统捕获的图像来计算物体表面上的每个点的镜面粗糙度。

    Specular object scanner for measuring reflectance properties of objects
    5.
    发明授权
    Specular object scanner for measuring reflectance properties of objects 有权
    用于测量物体的反射特性的镜面物体扫描仪

    公开(公告)号：US09562857B2

    公开(公告)日：2017-02-07

    申请号：US14212751

    申请日：2014-03-14

    申请人： Paul E. Debevec ,  Xueming Yu ,  Graham Leslie Fyffe ,  Abhijeet Ghosh

    发明人： Paul E. Debevec ,  Xueming Yu ,  Graham Leslie Fyffe ,  Abhijeet Ghosh

    IPC分类号： G01N21/55 ,  G01B11/30 ,  G01B11/25

    CPC分类号： G01N21/55 ,  G01B11/25 ,  G01B11/30

    摘要： An apparatus to measure surface orientation maps of an object may include a light source that is configured to illuminate the object with a controllable field of illumination. One or more cameras may be configured to capture at least one image of the object. A processor may be configured to process the image(s) to extract the reflectance properties of the object including an albedo, a reflection vector, a roughness, and/or anisotropy parameters of a specular reflectance lobe associated with the object. The controllable field of illumination may include limited-order Spherical Harmonics (SH) and Fourier Series (FS) illumination patterns with substantially similar polarization. The SH and FS illumination patterns are used with different light sources.

    摘要翻译： 用于测量物体的表面取向图的装置可以包括配置成用可控制的照明场照射物体的光源。 一个或多个摄像机可以被配置为捕获对象的至少一个图像。 处理器可以被配置为处理图像以提取对象的反射特性，包括与对象相关联的镜面反射率波瓣的反照率，反射矢量，粗糙度和/或各向异性参数。 可控的照明领域可以包括具有基本相似极化的有限次球面谐波（SH）和傅里叶级数（FS）照明图案。 SH和FS照明图案与不同的光源一起使用。

    Practical modeling and acquisition of layered facial reflectance
    6.
    发明授权
    Practical modeling and acquisition of layered facial reflectance 有权
    分层面反射的实际建模和采集

    公开(公告)号：US08264490B2

    公开(公告)日：2012-09-11

    申请号：US12364370

    申请日：2009-02-02

    申请人： Paul E. Debevec ,  Abhijeet Ghosh

    发明人： Paul E. Debevec ,  Abhijeet Ghosh

    IPC分类号： G06T15/00

    CPC分类号： G06T15/50 ,  G06K9/00221

    摘要： Techniques are described for modeling layered facial reflectance consisting of specular reflectance, single scattering, and shallow and deep subsurface scattering. Parameters of appropriate reflectance models can be estimated for each of these layers, e.g., from just 20 photographs recorded in a few seconds from a single view-point. Spatially-varying specular reflectance and single-scattering parameters can be extracted from polarization-difference images under spherical and point source illumination. Direct-indirect separation can be employed to decompose the remaining multiple scattering observed under cross-polarization into shallow and deep scattering components to model the light transport through multiple layers of skin. Appropriate diffusion models can be matched to the extracted shallow and deep scattering components for different regions on the face. The techniques were validated by comparing renderings of subjects to reference photographs recorded from novel viewpoints and under novel illumination conditions. Related geometry acquisition systems and software products are also described.

    摘要翻译： 描述了用于对由镜面反射率，单散射和浅层和深层次表面散射组成的分层面部反射的建模技术。 可以针对这些层中的每一层来估计适当的反射率模型的参数，例如，从单个视点在几秒钟内记录的仅20个照片。 可以从球面和点光源照明下的极化差分图像中提取空间变化的镜面反射率和单散射参数。 可以使用直接间接分离来将交叉偏振下观察到的剩余多重散射分解为浅层和深度散射分量，以模拟通过多层皮肤的光传输。 适当的扩散模型可以与提取的浅层和深度散射分量匹配，以适应不同区域的面部。 通过将受试者的效果与从新观点和新颖照明条件下记录的参考照片进行比较来验证这些技术。 还描述了相关几何采集系统和软件产品。

    Practical Modeling and Acquisition of Layered Facial Reflectance
    7.
    发明申请
    Practical Modeling and Acquisition of Layered Facial Reflectance 有权
    分层面反射的实际建模与采集

    公开(公告)号：US20090226049A1

    公开(公告)日：2009-09-10

    申请号：US12364370

    申请日：2009-02-02

    申请人： Paul E. Debevec ,  Abhijeet Ghosh

    发明人： Paul E. Debevec ,  Abhijeet Ghosh

    IPC分类号： G06K9/00

    CPC分类号： G06T15/50 ,  G06K9/00221

    摘要： Techniques are described for modeling layered facial reflectance consisting of specular reflectance, single scattering, and shallow and deep subsurface scattering. Parameters of appropriate reflectance models can be estimated for each of these layers, e.g., from just 20 photographs recorded in a few seconds from a single view-point. Spatially-varying specular reflectance and single-scattering parameters can be extracted from polarization-difference images under spherical and point source illumination. Direct-indirect separation can be employed to decompose the remaining multiple scattering observed under cross-polarization into shallow and deep scattering components to model the light transport through multiple layers of skin. Appropriate diffusion models can be matched to the extracted shallow and deep scattering components for different regions on the face. The techniques were validated by comparing renderings of subjects to reference photographs recorded from novel viewpoints and under novel illumination conditions. Related geometry acquisition systems and software products are also described.

    摘要翻译： 描述了用于对由镜面反射率，单散射和浅层和深层次表面散射组成的分层面部反射的建模技术。 可以针对这些层中的每一层来估计适当的反射率模型的参数，例如，从单个视点在几秒钟内记录的仅20个照片。 可以从球面和点光源照明下的极化差分图像中提取空间变化的镜面反射率和单散射参数。 可以使用直接间接分离来将交叉偏振下观察到的剩余多重散射分解为浅层和深度散射分量，以模拟通过多层皮肤的光传输。 适当的扩散模型可以与提取的浅层和深度散射分量匹配，以适应不同区域的面部。 通过将受试者的效果与从新观点和新颖照明条件下记录的参考照片进行比较来验证这些技术。 还描述了相关几何采集系统和软件产品。

    SPECULAR OBJECT SCANNER FOR MEASURING REFLECTANCE PROPERTIES OF OBJECTS
    8.
    发明申请
    SPECULAR OBJECT SCANNER FOR MEASURING REFLECTANCE PROPERTIES OF OBJECTS 有权
    用于测量物体反射特性的光学对象扫描仪

    公开(公告)号：US20140268160A1

    公开(公告)日：2014-09-18

    申请号：US14212751

    申请日：2014-03-14

    申请人： Paul E. Debevec ,  Xueming Yu ,  Graham Leslie Fyffe ,  Abhijeet Ghosh

    发明人： Paul E. Debevec ,  Xueming Yu ,  Graham Leslie Fyffe ,  Abhijeet Ghosh

    IPC分类号： G01N21/47 ,  G01N21/01

    CPC分类号： G01N21/55 ,  G01B11/25 ,  G01B11/30

    摘要： An apparatus to measure surface orientation maps of an object may include a light source that is configured to illuminate the object with a controllable field of illumination. One or more cameras may be configured to capture at least one image of the object. A processor may be configured to process the image(s) to extract the reflectance properties of the object including an albedo, a reflection vector, a roughness, and/or anisotropy parameters of a specular reflectance lobe associated with the object. The controllable field of illumination may include limited-order Spherical Harmonics (SH) and Fourier Series (FS) illumination patterns with substantially similar polarization. The SH and FS illumination patterns are used with different light sources.

    摘要翻译： 用于测量物体的表面取向图的装置可以包括配置成用可控制的照明场照射物体的光源。 一个或多个摄像机可以被配置为捕获对象的至少一个图像。 处理器可以被配置为处理图像以提取对象的反射特性，包括与对象相关联的镜面反射率波瓣的反照率，反射矢量，粗糙度和/或各向异性参数。 可控的照明领域可以包括具有基本相似极化的有限次球面谐波（SH）和傅里叶级数（FS）照明图案。 SH和FS照明图案与不同的光源一起使用。