Abstract:
This disclosure provides systems, methods and apparatus for a display apparatus including dummy display elements that can be switched between being coupled to a test bus and a drive bus. When connected to the drive bus, the circuit components, including thin-film transistors, of the dummy display element experience exposure to typical operating loads. When connected to the test bus, the display apparatus can test the operating parameters of the dummy display element circuit components.
Abstract:
This disclosure provides systems, methods and apparatus for a display apparatus including dummy display elements that can be switched between being coupled to a test bus and a drive bus. When connected to the drive bus, the circuit components, including thin-film transistors, of the dummy display element experience exposure to typical operating signals. When connected to the test bus, the display apparatus can test the operating parameters of the dummy display element circuit components.
Abstract:
This disclosure provides systems, methods and apparatus for a display apparatus including dummy display elements that can be switched between being coupled to a test bus and a drive bus. When connected to the drive bus, the circuit components, including thin-film transistors, of the dummy display element experience exposure to typical operating signals. When connected to the test bus, the display apparatus can test the operating parameters of the dummy display element circuit components.
Abstract:
This disclosure provides systems, methods and apparatus for a display apparatus including dummy display elements that can be switched between being coupled to a test bus and a drive bus. When connected to the drive bus, the circuit components, including thin-film transistors, of the dummy display element experience exposure to typical operating loads. When connected to the test bus, the display apparatus can test the operating parameters of the dummy display element circuit components.