Abstract:
A process for forming high k dielectric thin films on a substrate, e.g., silicon, by 1) low temperature (500° C. or less) deposition of a dielectric material onto a surface, followed by 2) high temperature post-deposition annealing. The deposition can take place in an oxidative environment, followed by annealing, or alternatively the deposition can take place in a non-oxidative environment (e.g., N2), followed by oxidation and annealing.
Abstract:
Provided is a method of integrating Ta2O5 into an MIS stack capacitor for a semiconductor device by forming a thin SiON layer at the Si/TaO interface using low temperature remote plasma oxidation anneal. Also provided is a method of forming an MIS stack capacitor with improved electrical performance by treating SiO2 with remote plasma nitridation or SiN layer with rapid thermal oxidation or RPO to form a SiON layer prior to Ta2O5 deposition with TAT-DMAE, TAETO or any other Ta-containing precursor.
Abstract translation:提供了一种通过使用低温远程等离子体氧化退火在Si / TaO界面处形成薄SiON层来将Ta 2 O 5集成到用于半导体器件的MIS堆叠电容器中的方法。 还提供了一种通过用远程等离子体氮化处理SiO 2或具有快速热氧化或RPO的SiN层来形成具有改进的电性能的MIS堆叠电容器的方法,以在与TAT-DMAE,TAETO或任何其它Ta的Ta 2 O 5沉积之前形成SiON层 含有前体。
Abstract:
The formation of a barrier layer over a high k dielectric layer and deposition of a conducting layer over the barrier layer prevents intermigration between the species of the high k dielectric layer and the conducting layer and prevents oxygen scavenging of the high k dielectric layer. One example of a capacitor stack device provided includes a high k dielectric layer of Ta2O5, a barrier layer of TaON or TiON formed at least in part by a remote plasma process, and a top electrode of TiN. The processes may be conducted at about 300 to 700° C. and are thus useful for low thermal budget applications. Also provided are MIM capacitor constructions and methods in which an insulator layer is formed by remote plasma oxidation of a bottom electrode.
Abstract translation:在高k电介质层上形成阻挡层并且在阻挡层上沉积导电层可防止高k电介质层与导电层之间的迁移,并防止高k介电层的氧清除。 提供的电容器堆叠装置的一个示例包括Ta 2 O 5的高k电介质层,至少部分由远程等离子体工艺形成的TaON或TiON的阻挡层和TiN的顶部电极。 该方法可以在约300-700℃下进行,因此可用于低热预算应用。 还提供了MIM电容器结构和其中通过底部电极的远程等离子体氧化形成绝缘体层的方法。
Abstract:
An injection molded container such as a flower pot having an outer surface and an inner surface and an indentation of a shape and size corresponding to the shape and size of a design element member, the design element member and the container member adapted to easily engage one another and to be easily disengaged so as to provide at least one decorative element on the outside surface of the container which can be easily changed according to a selectable design scheme.
Abstract:
A method and apparatus to control the deposition rate of a refractory metal film in a semiconductor fabrication process by controlling a quantity of ethylene present. The method includes placing a substrate in a deposition zone, of a semiconductor process chamber, flowing, into the deposition zone, a process gas including a refractory metal source, an inert carrier gas, and a hydrocarbon. Typically, the refractory metal source is tungsten hexafluoride, WF6, and the inert gas is argon, Ar. The ethylene may be premixed with either the argon or the tungsten hexafluoride to form a homogenous mixture. However, an in situ mixing apparatus may also be employed.
Abstract:
The content and order of a predetermined sequence of hard-coded and/or quasi-programmable test patterns may be altered during a Built-In Self-Test (BIST) routine. As such, knowledge gained post design completion may be reflected in the selection and arrangement of available tests to be executed during a BIST routine. In one embodiment, a sequence of hard-coded and/or quasi-programmable tests is executed during a BIST routine by receiving test ordering information for the sequence of tests and executing the sequence of tests in an order indicated by the test ordering information. A corresponding BIST circuit comprises a storage element and a state machine. The storage element is configured to store test ordering information for the sequence of tests. The state machine is configured to execute the sequence of tests in an order indicated by the test ordering information.
Abstract:
Techniques for controllably allocating a portion of a plurality of memory banks as cache memory are disclosed. To this end, a configuration tracker and a bank selector are employed. The configuration tracker configures whether each memory bank is to operate in a cache or not. The bank selector has a plurality of bank distributing functions. Upon receiving an incoming address, the bank selector determines the configuration of memory banks currently operating as the cache and applies an appropriate bank distributing function based on the configuration of memory banks. The applied bank distributing function utilizes bits in the incoming address to access one of the banks configured as being in the cache.
Abstract:
An apparatus and process for limiting residue remaining after the etching of metal in a semiconductor manufacturing process, such as etching back a tungsten layer to form tungsten plugs, by passivating the surface of a wafer with a halogen-containing gas are disclosed. The wafer is exposed to the halogen-containing gas in a chamber before a metal layer is deposited on the wafer. The exposure can occur in the same chamber as the metal deposition, or a different chamber. The wafer can remain in the chamber or be moved to another chamber for etching after exposure and deposition.
Abstract:
A vertical planter having a partitioned tray, a liner, and a sliding wire support grid, wherein the partitioned tray engages the sliding wire support grid to provide access to the partitioned tray.
Abstract:
A liner for use in a horticultural planter contains an integral water tray which is located between inner and outer fibrous layers of a liner. The water tray extends from a bottom surface of the liner toward a peripheral top edge. An overflow region is included with the water tray near the peripheral top edge of the liner.