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公开(公告)号：US11455333B1
公开(公告)日：2022-09-27
申请号：US17715831
申请日：2022-04-07
申请人： Protochips, Inc.
发明人： Franklin Stampley Walden, II , John Damiano, Jr. , David P. Nackashi , Daniel Stephen Gardiner , Mark Uebel , Alan Philip Franks , Joshua Friend , Katherine Elizabeth Marusak
IPC分类号： G06K9/00 , G06F16/535 , G06T1/00 , G06T11/60 , G06T7/20 , G06F16/538 , G06F16/58 , G06F16/51
摘要： Disclosed herein are methods and systems of metadata management for reviewing data from microscopy experimental sessions. Image data from an experimental session is stored in an archive at one or more filepath locations, either locally or on a network. Metadata associated with the image data is stored in a database with a reference to the filepath where the raw image is stored, such that the metadata is associated in the database with the image data. A user can perform post-experimental filtering, sorting, and searching of the underlying image data using the metadata, which allows the image data to be analyzed without duplication of the image data and without manual review of each individual image. The filtered data is presented in an interactive timeline format.
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2.发明授权公开(公告)号：US10373800B2
公开(公告)日：2019-08-06
申请号：US16004952
申请日：2018-06-11
申请人： Protochips, Inc.
摘要： A support for an electron microscope sample includes a body defining a void for receiving a first micro-electronic device, and a first gasket positioned about the first surface. The first gasket further defines an arm extending at an angle away from a horizontal extending through the first micro-electronic device. In operation, the first micro-electronic device is installed onto the first gasket and the arm engages an outer facing side of the first micro-electronic device to grip the first micro-electronic device.
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3.发明授权公开(公告)号：US10043633B2
公开(公告)日：2018-08-07
申请号：US14994724
申请日：2016-01-13
申请人： PROTOCHIPS, INC.
CPC分类号： H01J37/20 , H01J37/16 , H01J37/18 , H01J37/26 , H01J37/29 , H01J37/30 , H01J2237/2002 , H01J2237/2003 , H01J2237/2007
摘要： A novel sample holder for specimen support devices for insertion in electron microscopes. The novel sample holder of the invention allows for the introduction of gases or liquids to specimens for in situ imaging, as well as electrical contacts for electrochemical or thermal experiments.
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公开(公告)号：US09818578B2
公开(公告)日：2017-11-14
申请号：US14626234
申请日：2015-02-19
申请人： PROTOCHIPS, INC.
发明人： Daniel Stephen Gardiner , William Bradford Carpenter , John Damiano, Jr. , Franklin Stampley Walden, II , David P. Nackashi
IPC分类号： G01L7/00 , G01N21/03 , G01K11/32 , H01J37/26 , H01J37/16 , G01L11/02 , H01J37/20 , G01L19/04
CPC分类号： H01J37/261 , G01K11/32 , G01L11/025 , G01L19/04 , H01J37/16 , H01J37/20 , H01J37/3178 , H01J2237/2001 , H01J2237/2002 , H01J2237/2801
摘要： An apparatus and a method for measuring and monitoring the properties of a fluid, for example, pressure, temperature, and chemical properties, within a sample holder for an electron microscope. The apparatus includes at least one fiber optic sensor used for measuring temperature and/or pressure and/or pH positioned in proximity of the sample.
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公开(公告)号：US09312097B2
公开(公告)日：2016-04-12
申请号：US14513969
申请日：2014-10-14
申请人： PROTOCHIPS, INC.
发明人： David P. Nackashi , John Damiano, Jr. , Stephen E. Mick , Thomas G. Schmelzer , Michael Zapata, III
CPC分类号： H01J37/20 , G01N1/28 , H01J2237/2002 , H01J2237/2007 , H01J2237/2008 , H01J2237/202 , H01J2237/26
摘要： A novel specimen holder for specimen support devices for insertion in electron microscopes. The novel specimen holder of the invention provides mechanical support for specimen support devices and as well as electrical contacts to the specimens or specimen support devices.
摘要翻译： 用于插入电子显微镜的样品支撑装置的新型样品架。 本发明的新型样品保持器为样品支撑装置提供机械支撑，以及对试样或样品支撑装置的电接触。
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公开(公告)号：US11514586B1
公开(公告)日：2022-11-29
申请号：US17817248
申请日：2022-08-03
申请人： Protochips, Inc.
发明人： Franklin Stampley Walden, II , John Damiano, Jr. , David P. Nackashi , Daniel Stephen Gardiner , Mark Uebel , Alan Philip Franks , Benjamin Jacobs , Joshua Brian Friend , Katherine Elizabeth Marusak , Nelson L Marthe, Jr. , Benjamin Bradshaw Larson
摘要： Methods and systems for calibrating a transmission electron microscope are disclosed. A fiducial mark on the sample holder is used to identify known reference points so that a current collection area and a through-hole on the sample holder can be located. A plurality of beam current and beam area measurements are taken, and calibration tables are extrapolated from the measurements for a full range of microscope parameters. The calibration tables are then used to determine electron dose of a sample during an experiment at a given configuration.
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公开(公告)号：US10986279B1
公开(公告)日：2021-04-20
申请号：US16951297
申请日：2020-11-18
申请人： Protochips, Inc.
发明人： Franklin Stampley Walden, II , John Damiano, Jr. , David P. Nackashi , Daniel Stephen Gardiner , Mark Uebel , Alan Philip Franks , Benjamin Jacobs
摘要： Control system configured for sample tracking in an electron microscope environment registers a movement associated with a region of interest located within an active area of a sample under observation with an electron microscope. The registered movement includes at least one directional constituent. The region of interest is positioned within a field of view of the electron microscope. The control system directs an adjustment of the electron microscope control component to one or more of dynamically center and dynamically focus the view through the electron microscope of the region of interest. The adjustment comprises one or more of a magnitude element and a direction element.
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8.发明授权公开(公告)号：US10256563B2
公开(公告)日：2019-04-09
申请号：US15830127
申请日：2017-12-04
申请人： Protochips, Inc.
发明人： John Damiano, Jr. , David P. Nackashi , Daniel Stephen Gardiner , Franklin Stampley Walden, II , William Bradford Carpenter
摘要： An electrical connector for use in electron microscopy sample holders. The electrical connector provides electrical contacts to the sample support devices which are positioned in the sample holders for electrical, temperature and/or electrochemical control.
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9.发明授权公开(公告)号：US09666409B2
公开(公告)日：2017-05-30
申请号：US15288239
申请日：2016-10-07
申请人： Protochips, Inc.
CPC分类号： H01J37/20 , H01J37/16 , H01J37/18 , H01J37/26 , H01J37/29 , H01J37/30 , H01J2237/2002 , H01J2237/2003 , H01J2237/2007
摘要： A novel sample holder for specimen support devices for insertion in electron microscopes. The novel sample holder of the invention allows for the introduction of gases or liquids to specimens for in situ imaging, as well as electrical contacts for electrochemical or thermal experiments.
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10.发明授权Method for forming an electrical connection to an sample support in an electron microscope holder 有权在电子显微镜支架中与样品支架形成电连接的方法公开(公告)号：US09437393B2
公开(公告)日：2016-09-06
申请号：US14079223
申请日：2013-11-13
申请人： PROTOCHIPS, INC.
发明人： John Damiano, Jr. , David P. Nackashi , Daniel Stephen Gardiner , Franklin Stampley Walden, II , William Bradford Carpenter
CPC分类号： H01R13/24 , H01J37/20 , H01J37/26 , H01J2237/2003 , H01J2237/2007 , H01J2237/2008 , H01J2237/206 , H01R12/721 , H01R12/79
摘要： An electrical connector for use in electron microscopy sample holders. The electrical connector provides electrical contacts to the sample support devices which are positioned in the sample holders for electrical, temperature and/or electrochemical control.
摘要翻译： 用于电子显微镜样品架的电连接器。 电连接器为位于样品保持器中的样品支撑装置提供电接触，用于电气，温度和/或电化学控制。
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