公开(公告)号：US08785846B2

公开(公告)日：2014-07-22

申请号：US14058856

申请日：2013-10-21

Applicant: Purdue Research Foundation

Inventor： Zheng Ouyang ,  Chen Tsung-Chi

IPC: H01J49/10 ,  H01J49/04 ,  H01J49/02 ,  H01J49/26

CPC classification number: H01J49/0422 ,  H01J49/0013 ,  H01J49/0495 ,  H01J49/10 ,  H01J49/168 ,  H01J49/24 ,  H01J49/26

Abstract: The invention generally relates to systems and methods for sample analysis. In certain embodiments, the invention provides systems for analyzing a sample that include an electric source, a vacuum chamber including a conducting member, in which the conducting member is coupled to the electric source, a sample introduction member coupled to the vacuum chamber, and a mass analyzer. The system is configured such that a distal end of the sample introduction member resides within the vacuum chamber and proximate the conducting member, such that an electrical discharge may be produced between the sample introduction member and the conducting member. A neutral gas that has been introduced into the vacuum chamber interacts with the generated discharge, producing ions within the vacuum chamber that are subsequently transferred into the mass analyzer in the vacuum chamber.

Abstract translation: 本发明一般涉及用于样品分析的系统和方法。 在某些实施例中，本发明提供了用于分析包括电源的样品，包括导电构件的真空室的系统，其中导电构件耦合到电源，耦合到真空室的样品引入构件和 质量分析仪 该系统构造成使得样品引入构件的远端位于真空室内并且靠近导电构件，使得可以在样品引入构件和导电构件之间产生放电。 已经引入真空室的中性气体与产生的排放物相互作用，在真空室内产生离子，随后将其转移到真空室中的质量分析器中。