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    HIGH-VOLTAGE MODULE AND MASS SPECTROMETER USING THE SAME
    4.
    发明公开
    HIGH-VOLTAGE MODULE AND MASS SPECTROMETER USING THE SAME 审中-公开

    公开(公告)号：US20230343572A1

    公开(公告)日：2023-10-26

    申请号：US18037097

    申请日：2021-12-28

    Applicant: Hitachi High-Tech Corporation

    Inventor： Zihao ONG ,  Takuma NISHIMOTO ,  Isao FURUYA ,  Hiroshi TOUDA

    IPC: H01J49/10

    CPC classification number: H01J49/10

    Abstract: A high-voltage module HVMD includes: an error amplifier configured to output a control signal based on a reference signal Vin and a feedback signal; a high voltage output circuit configured to output a high voltage Vout for supply based on the control signal; and a feedback circuit configured to output the feedback signal based on the high voltage Vout for supply. Here, the feedback circuit includes: a first partial circuit configured to receive an input of the high voltage Vout for supply and to output an intermediate signal, the first partial circuit including a resistance element; and a second partial circuit configured to receive an input of the intermediate signal and to output the feedback signal. The high-voltage module HVMD further includes a substrate SUB including: a high voltage substrate region where the high voltage output circuit and a part of the first partial circuit are mounted.

    HIGH-VOLTAGE POWER SUPPLY DEVICE
    5.
    发明公开
    HIGH-VOLTAGE POWER SUPPLY DEVICE 审中-公开

    公开(公告)号：US20230170897A1

    公开(公告)日：2023-06-01

    申请号：US17951700

    申请日：2022-09-23

    Applicant: Shimadzu Corporation

    Inventor： Haruki OSA

    IPC: H03K17/567 ,  H01F19/04 ,  H02M7/217 ,  H03K17/06

    CPC classification number: H03K17/567 ,  H01F19/04 ,  H02M7/217 ,  H03K17/063 ,  H01J49/10

    Abstract: A high-voltage power supply device includes a voltage generation unit for outputting a DC high-voltage, a switching unit using a semiconductor switching element, the switching unit being configured to output an output voltage by the voltage generation unit to a voltage output terminal in a conduction state, a driver for driving a control terminal of the semiconductor switching element, and a controller for controlling the switching unit via the driver. The driver includes a high-frequency transformer provided with primary and secondary windings, a distribution of a stray capacitance per number of unit turns of the primary winding between the primary and secondary windings in an extension direction of the primary winding being symmetrical to a midpoint of the primary winding, a rectifier for rectifying an AC current induced in the secondary winding, and a balanced output type high-frequency excitation unit for exciting the primary winding differentially.

    Electrodynamic Mass Analysis
    10.
    发明申请
    Electrodynamic Mass Analysis 审中-公开

    公开(公告)号：US20180286653A1

    公开(公告)日：2018-10-04

    申请号：US15471507

    申请日：2017-03-28

    Applicant: Varian Semiconductor Equipment Associates, Inc.

    Inventor： Frank Sinclair ,  Joseph C. Olson ,  Costel Biloiu ,  Alexandre Likhanskii ,  Peter F. Kurunczi

    IPC: H01J49/06 ,  H01J49/40 ,  H01J49/10

    CPC classification number: H01J49/061 ,  H01J37/05 ,  H01J37/3171 ,  H01J49/10 ,  H01J49/22

    Abstract: An electrodynamic mass analysis system which has the capability of filtering unwanted species from an extracted ion beam without the use of a mass analyzer magnet is disclosed. The electrodynamic mass analysis system includes an ion source and an electrode disposed outside the ion source. The ion source and the electrode are biased relative to one another so as to emit pulses of ions. Each of these pulses enters a tube where each ion travels at a speed related to its mass. Thus, ions of the same mass travel in clusters through the tube. Ions reach the distal end of the tube separated temporally and spatially from one another based on their mass. The ions then enter a deflector, which is energized so as to allow the cluster of ions having the desired mass to pass through a resolving aperture disposed at the exit of the deflector.

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