公开(公告)号：US20170319873A1

公开(公告)日：2017-11-09

申请号：US15146541

申请日：2016-05-04

Applicant: Pyramid Technical Consultants Inc.

Inventor： Raymond Paul Boisseau ,  John Gordon ,  William P. Nett ,  Kan Ota

IPC: A61N5/10

CPC classification number: A61N5/1067 ,  A61N5/1043 ,  A61N5/1048 ,  A61N2005/1074 ,  A61N2005/1087

Abstract: A control system for providing a closed loop, real time control of a charged particle pencil beam is disclosed. The system includes a first detector apparatus, a second detector apparatus, a first orthogonal magnetic deflector apparatus, a second orthogonal magnetic deflector apparatus, and a controller. The controller compares the measured position and beam angle of the beam with a model position and beam angle of a model beam to determine an offset error and a beam angle error. The first orthogonal magnetic deflector apparatus includes a pair of electromagnets to correct a first component of the offset and beam angle errors. The second orthogonal magnetic deflector apparatus includes a pair of electromagnets to correct a second component of the offset and beam angle errors. The beam can be iteratively adjusted during patient therapy or short pauses in patient therapy.

公开(公告)号：US10183178B2

公开(公告)日：2019-01-22

申请号：US15146541

申请日：2016-05-04

Applicant: Pyramid Technical Consultants Inc.

Inventor： Raymond Paul Boisseau ,  John Gordon ,  William P. Nett ,  Kan Ota

IPC: A61N5/10

Abstract: A control system for providing a closed loop, real time control of a charged particle pencil beam is disclosed. The system includes a first detector apparatus, a second detector apparatus, a first orthogonal magnetic deflector apparatus, a second orthogonal magnetic deflector apparatus, and a controller. The controller compares the measured position and beam angle of the beam with a model position and beam angle of a model beam to determine an offset error and a beam angle error. The first orthogonal magnetic deflector apparatus includes a pair of electromagnets to correct a first component of the offset and beam angle errors. The second orthogonal magnetic deflector apparatus includes a pair of electromagnets to correct a second component of the offset and beam angle errors. The beam can be iteratively adjusted during patient therapy or short pauses in patient therapy.

公开(公告)号：US20160250500A1

公开(公告)日：2016-09-01

申请号：US14632270

申请日：2015-02-26

Applicant: Pyramid Technical Consultants, Inc.

Inventor： R. Paul Boisseau ,  Andrew Dart ,  John Gordon ,  Kan Ota

IPC: A61N5/10

CPC classification number: A61N5/1048 ,  A61N5/1075 ,  A61N5/1077 ,  A61N2005/1074 ,  A61N2005/1087 ,  H01J47/02

Abstract: A multi-resolution detector includes a high-resolution pixelated electrode and a low-resolution pixelated electrode. The high-resolution pixelated electrode includes a plurality of sub-arrays of first pixels. Each respective first pixel at each relative position in each sub-array is electrically connected in parallel with one another. The low-resolution pixelated electrode includes a plurality of second pixels. A control system receives as inputs an output from each pixelated detector. The control system uses the inputs to determine a physical position and a transverse intensity distribution of an incident charged particle pencil beam at the resolution of the high-resolution pixelated electrode.

Abstract translation: 多分辨率检测器包括高分辨率像素电极和低分辨率像素化电极。 高分辨率像素化电极包括多个第一像素的子阵列。 每个子阵列中的每个相对位置处的每个相应的第一像素彼此并联地电连接。 低分辨率像素化电极包括多个第二像素。 控制系统接收来自每个像素化检测器的输出作为输入。 控制系统使用这些输入来确定入射带电粒子束在高分辨率像素化电极的分辨率下的物理位置和横向强度分布。

公开(公告)号：US09427599B1

公开(公告)日：2016-08-30

申请号：US14632270

申请日：2015-02-26

Applicant: Pyramid Technical Consultants, Inc.

Inventor： R. Paul Boisseau ,  Andrew Dart ,  John Gordon ,  Kan Ota

IPC: G01T1/24 ,  A61N5/10

CPC classification number: A61N5/1048 ,  A61N5/1075 ,  A61N5/1077 ,  A61N2005/1074 ,  A61N2005/1087 ,  H01J47/02

Abstract: A multi-resolution detector includes a high-resolution pixelated electrode and a low-resolution pixelated electrode. The high-resolution pixelated electrode includes a plurality of sub-arrays of first pixels. Each respective first pixel at each relative position in each sub-array is electrically connected in parallel with one another. The low-resolution pixelated electrode includes a plurality of second pixels. A control system receives as inputs an output from each pixelated detector. The control system uses the inputs to determine a physical position and a transverse intensity distribution of an incident charged particle pencil beam at the resolution of the high-resolution pixelated electrode.

Abstract translation: 多分辨率检测器包括高分辨率像素电极和低分辨率像素化电极。 高分辨率像素化电极包括多个第一像素的子阵列。 每个子阵列中的每个相对位置处的每个相应的第一像素彼此并联地电连接。 低分辨率像素化电极包括多个第二像素。 控制系统接收来自每个像素化检测器的输出作为输入。 控制系统使用这些输入来确定入射带电粒子束在高分辨率像素化电极的分辨率下的物理位置和横向强度分布。