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公开(公告)号：US20200298022A1
公开(公告)日：2020-09-24
申请号：US16358044
申请日：2019-03-19
Applicant: Pyramid Technical Consultants Inc.
Inventor： John Gordon , Andrew Dart , Raymond Paul Boisseau
IPC: A61N5/10
Abstract: A pencil beam system includes a charged particle beam generator, a transport beamline apparatus, a scan nozzle, a fast deflector electromagnet, and a controller. After a therapeutic dose is delivered to a first target spot, the fast deflector electromagnet generates a first magnetic field that causes the net deflection of the charged particle beam to transition from the first target spot to an adjacent target spot. After the charged particle beam is directed to the adjacent target spot, the controller simultaneously adjusts the first magnetic field and the scan nozzle magnetic field to reduce and eliminate the contribution of the first magnetic field to the net deflection. The fast deflector electromagnet is deliberately designed with limited magnetic field and limited deflecting power to provide a higher slew rate, faster settling and less hysteresis contribution to beam position as compared to the scan nozzle electromagnets.
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公开(公告)号：US10300304B2
公开(公告)日：2019-05-28
申请号：US15904571
申请日：2018-02-26
Applicant: Pyramid Technical Consultants Inc.
Inventor： William P. Nett , John Gordon , Raymond Paul Boisseau
IPC: H01J37/244 , A61N5/00 , A61N5/10 , H01J37/24
Abstract: An assembly for preventing an overdose of a charged particle beam during therapy to a patient includes a pixelated detector apparatus and a controller. The controller includes, for each pixel: a current integrator circuit that converts the local measured current into a total local detected charge integrated from a start time, the integrator circuit outputting an integrator voltage that corresponds to the total local detected charge; and a discriminator circuit that compares the integrator voltage with a reference voltage, the reference voltage corresponding to a maximum acceptable dose for the patient. A logic circuit generates an overdose fault signal if, at any of the pixels, the integrator voltage is higher than the reference voltage.
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公开(公告)号：US20180289984A1
公开(公告)日：2018-10-11
申请号：US15904571
申请日：2018-02-26
Applicant: Pyramid Technical Consultants Inc.
Inventor： William P. Nett , John Gordon , Raymond Paul Boisseau
IPC: A61N5/10 , H01J37/244 , H01J37/24
CPC classification number: A61N5/1064 , A61N5/1071 , A61N2005/1087 , H01J37/243 , H01J37/244 , H01J2237/24564 , H01J2237/2485
Abstract: An assembly for preventing an overdose of a charged particle beam during therapy to a patient includes a pixelated detector apparatus and a controller. The controller includes, for each pixel: a current integrator circuit that converts the local measured current into a total local detected charge integrated from a start time, the integrator circuit outputting an integrator voltage that corresponds to the total local detected charge; and a discriminator circuit that compares the integrator voltage with a reference voltage, the reference voltage corresponding to a maximum acceptable dose for the patient. A logic circuit generates an overdose fault signal if, at any of the pixels, the integrator voltage is higher than the reference voltage.
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公开(公告)号：US10195465B2
公开(公告)日：2019-02-05
申请号：US15840604
申请日：2017-12-13
Applicant: Pyramid Technical Consultants Inc.
Inventor： John Stuart Gordon , Raymond Paul Boisseau
IPC: A61N5/10
Abstract: A control system for fine tuning or spreading a charged particle pencil beam includes a low-inductance, low-power compensation or fine-tuning magnet assembly. The feedback loop that includes the compensation magnet assembly has a faster response rate than the feedback loop that includes the scan nozzle. The compensation or fine-tuning magnet assembly is preferably disposed upstream of the scan nozzle magnet(s) with respect to the beam path to make rapid but minor adjustments to the beam position between iterations of the scan nozzle.
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公开(公告)号：US09981146B2
公开(公告)日：2018-05-29
申请号：US15847187
申请日：2017-12-19
Applicant: Pyramid Technical Consultants Inc.
Inventor： Raymond P. Boisseau , John S. Gordon , Andrew Dart , Julia C. Nett
CPC classification number: A61N5/1075 , A61N5/1048 , A61N2005/1034 , A61N2005/1087 , H01J37/243 , H05K5/0026 , H05K5/0247 , H05K5/04 , H05K9/0049
Abstract: A multi-layer charged particle beam characterization system is disclosed, and method for using the same. A typical embodiment includes a plurality of two-sided metal plates, arranged as a stack, each metal plate having an electrical contact tab extending from at least one common edge of the metal plate, and a plurality of insulator films disposed between adjacent metal plates, each insulator film is sized to match its corresponding metal plate. The tabs are coupled to a printed circuit board and connected to an external electrical connector to register a number of metal plates and insulator layers through which a charged particle beam has penetrated.
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Patent Agency Ranking
公开(公告)号：US10456598B2
公开(公告)日：2019-10-29
申请号：US16116388
申请日：2018-08-29
Applicant: Pyramid Technical Consultants Inc.
Inventor： Raymond Paul Boisseau , William P. Nett , John S. Gordon , Sashidar Kollipara , Yuriy Kozlov
IPC: A61N5/10
Abstract: The present disclosure is directed to systems and methods for real-time control of a charged particle pencil beam system during therapeutic treatment of a patient. In an aspect, the present disclosure is directed to measuring an actual shape, an actual intensity distribution, and an actual location at isocenter of the charged particle pencil beam. The actual data is compared to model treatment data in real time to determine if a statistically significant variance occurs in which case the charged particle pencil beam can be stopped mid-treatment for correction and/or analysis.
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公开(公告)号：US10183178B2
公开(公告)日：2019-01-22
申请号：US15146541
申请日：2016-05-04
Applicant: Pyramid Technical Consultants Inc.
Inventor： Raymond Paul Boisseau , John Gordon , William P. Nett , Kan Ota
IPC: A61N5/10
Abstract: A control system for providing a closed loop, real time control of a charged particle pencil beam is disclosed. The system includes a first detector apparatus, a second detector apparatus, a first orthogonal magnetic deflector apparatus, a second orthogonal magnetic deflector apparatus, and a controller. The controller compares the measured position and beam angle of the beam with a model position and beam angle of a model beam to determine an offset error and a beam angle error. The first orthogonal magnetic deflector apparatus includes a pair of electromagnets to correct a first component of the offset and beam angle errors. The second orthogonal magnetic deflector apparatus includes a pair of electromagnets to correct a second component of the offset and beam angle errors. The beam can be iteratively adjusted during patient therapy or short pauses in patient therapy.
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公开(公告)号：US10092777B2
公开(公告)日：2018-10-09
申请号：US15593027
申请日：2017-05-11
Applicant: Pyramid Technical Consultants Inc.
Inventor： Raymond Paul Boisseau , William P. Nett , John S. Gordon , Sashidar Kollipara , Yuriy Kozlov
Abstract: The present disclosure is directed to systems and methods for real-time control of a charged particle pencil beam system during therapeutic treatment of a patient. In an aspect, the present disclosure is directed to measuring an actual shape, an actual intensity distribution, and an actual location at isocenter of the charged particle pencil beam. The actual data is compared to model treatment data in real time to determine if a statistically significant variance occurs in which case the charged particle pencil beam can be stopped mid-treatment for correction and/or analysis.
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公开(公告)号：US20180111007A1
公开(公告)日：2018-04-26
申请号：US15840604
申请日：2017-12-13
Applicant: Pyramid Technical Consultants Inc.
Inventor： John Stuart Gordon , Raymond Paul Boisseau
IPC: A61N5/10
CPC classification number: A61N5/1067 , A61N5/1043 , A61N5/1045 , A61N5/1049 , A61N2005/1034 , A61N2005/1087
Abstract: A control system for fine tuning or spreading a charged particle pencil beam includes a low-inductance, low-power compensation or fine-tuning magnet assembly. The feedback loop that includes the compensation magnet assembly has a faster response rate than the feedback loop that includes the scan nozzle. The compensation or fine-tuning magnet assembly is preferably disposed upstream of the scan nozzle magnet(s) with respect to the beam path to make rapid but minor adjustments to the beam position between iterations of the scan nozzle.
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公开(公告)号：US20180104512A1
公开(公告)日：2018-04-19
申请号：US15847187
申请日：2017-12-19
Applicant: Pyramid Technical Consultants Inc.
Inventor： Raymond P. Boisseau , John S. Gordon , Andrew Dart , Julia C. Nett
CPC classification number: A61N5/1075 , A61N5/1048 , A61N2005/1034 , A61N2005/1087 , H01J37/243 , H05K5/0026 , H05K5/0247 , H05K5/04 , H05K9/0049
Abstract: A multi-layer charged particle beam characterization system is disclosed, and method for using the same. A typical embodiment includes a plurality of two-sided metal plates, arranged as a stack, each metal plate having an electrical contact tab extending from at least one common edge of the metal plate, and a plurality of insulator films disposed between adjacent metal plates, each insulator film is sized to match its corresponding metal plate. The tabs are coupled to a printed circuit board and connected to an external electrical connector to register a number of metal plates and insulator layers through which a charged particle beam has penetrated.
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