公开(公告)号：US20200298022A1

公开(公告)日：2020-09-24

申请号：US16358044

申请日：2019-03-19

Applicant: Pyramid Technical Consultants Inc.

Inventor： John Gordon ,  Andrew Dart ,  Raymond Paul Boisseau

IPC: A61N5/10

Abstract: A pencil beam system includes a charged particle beam generator, a transport beamline apparatus, a scan nozzle, a fast deflector electromagnet, and a controller. After a therapeutic dose is delivered to a first target spot, the fast deflector electromagnet generates a first magnetic field that causes the net deflection of the charged particle beam to transition from the first target spot to an adjacent target spot. After the charged particle beam is directed to the adjacent target spot, the controller simultaneously adjusts the first magnetic field and the scan nozzle magnetic field to reduce and eliminate the contribution of the first magnetic field to the net deflection. The fast deflector electromagnet is deliberately designed with limited magnetic field and limited deflecting power to provide a higher slew rate, faster settling and less hysteresis contribution to beam position as compared to the scan nozzle electromagnets.

公开(公告)号：US10300304B2

公开(公告)日：2019-05-28

申请号：US15904571

申请日：2018-02-26

Applicant: Pyramid Technical Consultants Inc.

Inventor： William P. Nett ,  John Gordon ,  Raymond Paul Boisseau

IPC: H01J37/244 ,  A61N5/00 ,  A61N5/10 ,  H01J37/24

Abstract: An assembly for preventing an overdose of a charged particle beam during therapy to a patient includes a pixelated detector apparatus and a controller. The controller includes, for each pixel: a current integrator circuit that converts the local measured current into a total local detected charge integrated from a start time, the integrator circuit outputting an integrator voltage that corresponds to the total local detected charge; and a discriminator circuit that compares the integrator voltage with a reference voltage, the reference voltage corresponding to a maximum acceptable dose for the patient. A logic circuit generates an overdose fault signal if, at any of the pixels, the integrator voltage is higher than the reference voltage.

公开(公告)号：US20180289984A1

公开(公告)日：2018-10-11

申请号：US15904571

申请日：2018-02-26

Applicant: Pyramid Technical Consultants Inc.

Inventor： William P. Nett ,  John Gordon ,  Raymond Paul Boisseau

IPC: A61N5/10 ,  H01J37/244 ,  H01J37/24

CPC classification number: A61N5/1064 ,  A61N5/1071 ,  A61N2005/1087 ,  H01J37/243 ,  H01J37/244 ,  H01J2237/24564 ,  H01J2237/2485

Abstract: An assembly for preventing an overdose of a charged particle beam during therapy to a patient includes a pixelated detector apparatus and a controller. The controller includes, for each pixel: a current integrator circuit that converts the local measured current into a total local detected charge integrated from a start time, the integrator circuit outputting an integrator voltage that corresponds to the total local detected charge; and a discriminator circuit that compares the integrator voltage with a reference voltage, the reference voltage corresponding to a maximum acceptable dose for the patient. A logic circuit generates an overdose fault signal if, at any of the pixels, the integrator voltage is higher than the reference voltage.

公开(公告)号：US10183178B2

公开(公告)日：2019-01-22

申请号：US15146541

申请日：2016-05-04

Applicant: Pyramid Technical Consultants Inc.

Inventor： Raymond Paul Boisseau ,  John Gordon ,  William P. Nett ,  Kan Ota

IPC: A61N5/10

Abstract: A control system for providing a closed loop, real time control of a charged particle pencil beam is disclosed. The system includes a first detector apparatus, a second detector apparatus, a first orthogonal magnetic deflector apparatus, a second orthogonal magnetic deflector apparatus, and a controller. The controller compares the measured position and beam angle of the beam with a model position and beam angle of a model beam to determine an offset error and a beam angle error. The first orthogonal magnetic deflector apparatus includes a pair of electromagnets to correct a first component of the offset and beam angle errors. The second orthogonal magnetic deflector apparatus includes a pair of electromagnets to correct a second component of the offset and beam angle errors. The beam can be iteratively adjusted during patient therapy or short pauses in patient therapy.

公开(公告)号：US20160250500A1

公开(公告)日：2016-09-01

申请号：US14632270

申请日：2015-02-26

Applicant: Pyramid Technical Consultants, Inc.

Inventor： R. Paul Boisseau ,  Andrew Dart ,  John Gordon ,  Kan Ota

IPC: A61N5/10

CPC classification number: A61N5/1048 ,  A61N5/1075 ,  A61N5/1077 ,  A61N2005/1074 ,  A61N2005/1087 ,  H01J47/02

Abstract: A multi-resolution detector includes a high-resolution pixelated electrode and a low-resolution pixelated electrode. The high-resolution pixelated electrode includes a plurality of sub-arrays of first pixels. Each respective first pixel at each relative position in each sub-array is electrically connected in parallel with one another. The low-resolution pixelated electrode includes a plurality of second pixels. A control system receives as inputs an output from each pixelated detector. The control system uses the inputs to determine a physical position and a transverse intensity distribution of an incident charged particle pencil beam at the resolution of the high-resolution pixelated electrode.

Abstract translation: 多分辨率检测器包括高分辨率像素电极和低分辨率像素化电极。 高分辨率像素化电极包括多个第一像素的子阵列。 每个子阵列中的每个相对位置处的每个相应的第一像素彼此并联地电连接。 低分辨率像素化电极包括多个第二像素。 控制系统接收来自每个像素化检测器的输出作为输入。 控制系统使用这些输入来确定入射带电粒子束在高分辨率像素化电极的分辨率下的物理位置和横向强度分布。

公开(公告)号：US09427599B1

公开(公告)日：2016-08-30

申请号：US14632270

申请日：2015-02-26

Applicant: Pyramid Technical Consultants, Inc.

Inventor： R. Paul Boisseau ,  Andrew Dart ,  John Gordon ,  Kan Ota

IPC: G01T1/24 ,  A61N5/10

CPC classification number: A61N5/1048 ,  A61N5/1075 ,  A61N5/1077 ,  A61N2005/1074 ,  A61N2005/1087 ,  H01J47/02

Abstract: A multi-resolution detector includes a high-resolution pixelated electrode and a low-resolution pixelated electrode. The high-resolution pixelated electrode includes a plurality of sub-arrays of first pixels. Each respective first pixel at each relative position in each sub-array is electrically connected in parallel with one another. The low-resolution pixelated electrode includes a plurality of second pixels. A control system receives as inputs an output from each pixelated detector. The control system uses the inputs to determine a physical position and a transverse intensity distribution of an incident charged particle pencil beam at the resolution of the high-resolution pixelated electrode.

Abstract translation: 多分辨率检测器包括高分辨率像素电极和低分辨率像素化电极。 高分辨率像素化电极包括多个第一像素的子阵列。 每个子阵列中的每个相对位置处的每个相应的第一像素彼此并联地电连接。 低分辨率像素化电极包括多个第二像素。 控制系统接收来自每个像素化检测器的输出作为输入。 控制系统使用这些输入来确定入射带电粒子束在高分辨率像素化电极的分辨率下的物理位置和横向强度分布。

公开(公告)号：US09333376B2

公开(公告)日：2016-05-10

申请号：US14641932

申请日：2015-03-09

Applicant: Pyramid Technical Consultants, Inc.

Inventor： R. Paul Boisseau ,  John Gordon ,  William P. Nett

IPC: A61B6/00 ,  G01N23/04 ,  A61N5/10 ,  G01T1/29

CPC classification number: A61N5/1075 ,  A61N2005/1087 ,  G01T1/29

Abstract: A system for calibrating a charged particle pencil beam includes a first pixelated detector, a second pixelated detector, a beam stop, and a diagnostics system. The first and second pixelated detectors measure the pencil beam at positions proximal and/or distal to an isocenter plane. The beam stop is configured to detect an energy level of the pencil beam. The diagnostics system is configured to transmit a signal to request a generation of the charged particle pencil beam at different settings. The diagnostics system is also configured to update a calibration parameter for each setting based on the data received from the pixelated detectors and the beam stop.

Abstract translation: 用于校准带电粒子笔束的系统包括第一像素化检测器，第二像素化检测器，光束停止器和诊断系统。 第一和第二像素化检测器在等角点平面的近端和/或远端的位置测量笔束。 射束停止器被配置为检测铅笔束的能量水平。 诊断系统被配置为发送信号以请求产生不同设置的带电粒子束的波束。 诊断系统还被配置为基于从像素化检测器和束停止接收的数据来更新每个设置的校准参数。

公开(公告)号：US20170319873A1

公开(公告)日：2017-11-09

申请号：US15146541

申请日：2016-05-04

Applicant: Pyramid Technical Consultants Inc.

Inventor： Raymond Paul Boisseau ,  John Gordon ,  William P. Nett ,  Kan Ota

IPC: A61N5/10

CPC classification number: A61N5/1067 ,  A61N5/1043 ,  A61N5/1048 ,  A61N2005/1074 ,  A61N2005/1087

Abstract: A control system for providing a closed loop, real time control of a charged particle pencil beam is disclosed. The system includes a first detector apparatus, a second detector apparatus, a first orthogonal magnetic deflector apparatus, a second orthogonal magnetic deflector apparatus, and a controller. The controller compares the measured position and beam angle of the beam with a model position and beam angle of a model beam to determine an offset error and a beam angle error. The first orthogonal magnetic deflector apparatus includes a pair of electromagnets to correct a first component of the offset and beam angle errors. The second orthogonal magnetic deflector apparatus includes a pair of electromagnets to correct a second component of the offset and beam angle errors. The beam can be iteratively adjusted during patient therapy or short pauses in patient therapy.

公开(公告)号：US20150251021A1

公开(公告)日：2015-09-10

申请号：US14641932

申请日：2015-03-09

Applicant: Pyramid Technical Consultants, Inc.

Inventor： R. Paul Boisseau ,  John Gordon ,  William P. Nett

IPC: A61N5/10 ,  G01T1/29

CPC classification number: A61N5/1075 ,  A61N2005/1087 ,  G01T1/29

Abstract: A system for calibrating a charged particle pencil beam includes a first pixelated detector, a second pixelated detector, a beam stop, and a diagnostics system. The first and second pixelated detectors measure the pencil beam at positions proximal and/or distal to an isocenter plane. The beam stop is configured to detect an energy level of the pencil beam. The diagnostics system is configured to transmit a signal to request a generation of the charged particle pencil beam at different settings. The diagnostics system is also configured to update a calibration parameter for each setting based on the data received from the pixelated detectors and the beam stop.

Abstract translation: 用于校准带电粒子笔束的系统包括第一像素化检测器，第二像素化检测器，光束停止器和诊断系统。 第一和第二像素化检测器在等角点平面的近端和/或远端的位置测量笔束。 射束停止器被配置为检测铅笔束的能量水平。 诊断系统被配置为发送信号以请求产生不同设置的带电粒子束的波束。 诊断系统还被配置为基于从像素化检测器和束停止接收的数据来更新每个设置的校准参数。