公开(公告)号：US20140199948A1

公开(公告)日：2014-07-17

申请号：US13740539

申请日：2013-01-14

Applicant: QUALCOMM INCORPORATED

Inventor： Jan Diffenderfer ,  Yu Song

IPC: G05F1/46

CPC classification number: G05F1/46 ,  H03K3/3565 ,  H03K19/018521

Abstract: A single-ended comparator is disclosed herein. The comparator may be implemented with low-voltage semiconductor devices that are capable of operating with high-voltage signals at an input. The single-ended comparator may be integrated in a larger circuit to receive and detect information provided on the input at voltage levels higher than the levels supported by the rest of the circuit, and transfer the information in the received signal for use by the rest of the circuit.

Abstract translation: 本文公开了单端比较器。 比较器可以利用能够在输入处与高电压信号一起工作的低压半导体器件来实现。 单端比较器可以集成在更大的电路中，以接收和检测在电路电平上提供的信号，该电平高于由电路其余部分支持的电平，并传送接收信号中的信息供其余部分使用 电路。

公开(公告)号：US09086711B2

公开(公告)日：2015-07-21

申请号：US13740539

申请日：2013-01-14

Applicant: QUALCOMM Incorporated

Inventor： Jan Diffenderfer ,  Yu Song

IPC: H04B1/28 ,  G05F1/46 ,  H03K3/3565 ,  H03K19/0185

CPC classification number: G05F1/46 ,  H03K3/3565 ,  H03K19/018521

Abstract: A single-ended comparator is disclosed herein. The comparator may be implemented with low-voltage semiconductor devices that are capable of operating with high-voltage signals at an input. The single-ended comparator may be integrated in a larger circuit to receive and detect information provided on the input at voltage levels higher than the levels supported by the rest of the circuit, and transfer the information in the received signal for use by the rest of the circuit.

Abstract translation: 本文公开了单端比较器。 比较器可以利用能够在输入处与高电压信号一起工作的低压半导体器件来实现。 单端比较器可以集成在更大的电路中，以接收和检测在电路电平上提供的信号，该电平高于由电路其余部分支持的电平，并传送接收信号中的信息供其余部分使用 电路。

公开(公告)号：US20140266357A1

公开(公告)日：2014-09-18

申请号：US13831201

申请日：2013-03-14

Applicant: QUALCOMM INCORPORATED

Inventor： Vaishnav Srinivas ,  Jan Diffenderfer ,  Philip Michael Clovis ,  David Ian West

IPC: H03K5/159

CPC classification number: H03K5/159

Abstract: A master measure circuit is disclosed that may select from various nodes on a delay path carrying a signal. The master measure circuit measures the delay for propagation of the signal from one selected node to another selected node and controls an adjustable delay circuit in the delay path accordingly.

Abstract translation: 公开了可以在承载信号的延迟路径上的各个节点进行选择的主测量电路。 主测量电路测量信号从一个选定节点传播到另一个选定节点的延迟，并相应地控制延迟路径中的可调节延迟电路。