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    MULTI-DOMAIN HETEROGENEOUS PROCESS-VOLTAGE-TEMPERATURE TRACKING FOR INTEGRATED CIRCUIT POWER REDUCTION
    1.
    发明申请
    MULTI-DOMAIN HETEROGENEOUS PROCESS-VOLTAGE-TEMPERATURE TRACKING FOR INTEGRATED CIRCUIT POWER REDUCTION 有权
    用于集成电路功率降低的多域异步过程电压跟踪

    公开(公告)号：US20160003893A1

    公开(公告)日：2016-01-07

    申请号：US14323652

    申请日：2014-07-03

    Applicant: QUALCOMM Incorporated

    Inventor： Jasmin Smaila Ibrahimovic ,  Mohammad Reza Kakoee ,  Shih-Hsin Jason Hu

    IPC: G01R31/28

    CPC classification number: G01R31/2851 ,  G06F1/26 ,  G06F1/3203 ,  G06F1/3206 ,  G06F1/3287 ,  G06F1/3296 ,  Y02D10/171 ,  Y02D10/172

    Abstract: The systems and method described herein provide efficient (e.g., low power and low area) means to track performance in numerous supply domains with heterogeneous circuits that are used in a large system-on-a-chip integrated circuit (SoCs). The heterogeneous circuits can include circuits made with different devices, different cell libraries, and different hard macros that are in different power supply domains. Performance measurements from performance sensors (or process-voltage-temperature (PVT) sensors) that are spread about the SoC are collected and processed to determine voltage levels for each of the supply domains. A single controller can receive can determine voltage levels for a whole SoC. The performance sensors are connected to the controller by a scan chain. The technique is flexible and can be easily adapted for use in SoCs with different power supply domains and types of circuits.

    Abstract translation: 本文描述的系统和方法提供了有效（例如，低功率和低面积）的方式来跟踪在大型片上系统集成电路（SoC）中使用的异质电路的多个供电域中的性能。 异构电路可以包括由不同设备制成的电路，不同的单元库以及不同电源域中的不同硬宏。 收集和处理围绕SoC传播的性能传感器（或过程电压 - 温度（PVT）传感器）的性能测量，以确定每个供应域的电压电平。 单个控制器可以接收可以确定整个SoC的电压电平。 性能传感器通过扫描链连接到控制器。 该技术是灵活的，可以轻松地适用于具有不同电源域和电路类型的SoC。

    DYNAMICALLY ADAPTIVE VOLTAGE-FREQUENCY GUARDBAND CONTROL CIRCUIT
    2.
    发明申请
    DYNAMICALLY ADAPTIVE VOLTAGE-FREQUENCY GUARDBAND CONTROL CIRCUIT 审中-公开

    公开(公告)号：US20180183417A1

    公开(公告)日：2018-06-28

    申请号：US15393107

    申请日：2016-12-28

    Applicant: QUALCOMM Incorporated

    Inventor： Lam Ho ,  Keith Alan Bowman ,  Navid Toosizadeh ,  Shih-Hsin Jason Hu ,  Mohammad Reza Kakoee ,  Saravana Krishnan Kannan

    IPC: H03K5/05 ,  H03K5/19

    CPC classification number: H03K5/05 ,  G06F1/10 ,  G06F1/305 ,  H03K5/19 ,  H03K2005/00019

    Abstract: In certain aspects, a system comprises a voltage-droop mitigation circuit configured to monitor voltage droop in a supply voltage supplied to a circuit, and to perform voltage-droop mitigation for the circuit if the monitored voltage droop is equal to or greater than a droop threshold. In one aspect, the system also includes a performance monitor configured to track a number of clock cycles over which the voltage-droop mitigation circuit performs the voltage-droop mitigation within a time duration, and to adjust the droop threshold based on the number of clock cycles. In another aspect, the system also includes a performance monitor configured to track a number of times that the voltage-droop mitigation circuit performs the voltage-droop mitigation within a time duration, and to adjust the droop threshold based on the number of times that the voltage-droop mitigation circuit performs the voltage-droop mitigation within the time duration.

    Integrated circuit adaptive voltage scaling with de-aging
    3.
    发明授权
    Integrated circuit adaptive voltage scaling with de-aging 有权
    集成电路自适应电压缩放与衰老

    公开(公告)号：US09484892B1

    公开(公告)日：2016-11-01

    申请号：US14850801

    申请日：2015-09-10

    Applicant: QUALCOMM Incorporated

    Inventor： Mohammad Reza Kakoee ,  Shih-Hsin Jason Hu ,  Min Chen ,  Jasmin Smaila Ibrahimovic ,  Carlos Auyon ,  Sorin Adrian Dobre ,  Navid Toosizadeh ,  Nan Chen ,  Mohamed Waleed Allam

    IPC: G01R31/317 ,  H03K3/011 ,  H03K3/012

    CPC classification number: H03K3/011 ,  G01R31/2884 ,  G01R31/31727 ,  H03K3/012

    Abstract: An integrated circuit compensates for circuit aging by measuring the aging with an aging sensor and controlling a supply voltage based on the measured aging. The operating environment for the aging sensor can be set to reduce impacts of non-aging effects on the measured aging. For example, the operating environment can use a temperature inversion voltage. An initial aging measurement value which is the difference between an initial aged measurement and an initial unaged measurement can be stored on the integrated circuit. A core power reduction controller can use the measured aging and the stored initial aging measurement value to update a performance-sensor target value and then perform adaptive voltage scaling using the using the updated performance-sensor target value.

    Abstract translation: 集成电路通过使用老化传感器测量老化并根据测量的老化来控制电源电压来补偿电路老化。 老化传感器的操作环境可以设置为减少非老化对测量老化的影响。 例如，操作环境可以使用温度反转电压。 初始老化测量值与初始未老化测量值之差可以存储在集成电路上。 核心功率降低控制器可以使用测量的老化和存储的初始老化测量值来更新性能传感器目标值，然后使用更新的性能传感器目标值来执行自适应电压缩放。

    Error correcting code testing
    4.
    发明授权
    Error correcting code testing 有权

    公开(公告)号：US10389379B2

    公开(公告)日：2019-08-20

    申请号：US15594322

    申请日：2017-05-12

    Applicant: QUALCOMM Incorporated

    Inventor： Rahul Gulati ,  Palkesh Jain ,  Pranjal Bhuyan ,  Mohammad Reza Kakoee

    IPC: H03M13/01 ,  H03M13/00 ,  G06F11/22

    Abstract: Various additional and alternative aspects are described herein. In some aspects, the present disclosure provides a method of testing error-correcting code (ECC) logic. The method includes receiving data for storage in a memory. The method further includes receiving an address indicating a location in the memory to store the data. The method further includes determining if the received address matches at least one of one or more test addresses. The method further includes operating the ECC logic in a normal mode when the received address does not match at least one of the one or more test addresses. The method further includes operating the ECC logic in a test mode when the received address does match at least one of the one or more test addresses.

    Dynamically adaptive voltage-frequency guardband control circuit
    7.
    发明授权
    Dynamically adaptive voltage-frequency guardband control circuit 有权

    公开(公告)号：US10009016B1

    公开(公告)日：2018-06-26

    申请号：US15393107

    申请日：2016-12-28

    Applicant: QUALCOMM Incorporated

    Inventor： Lam Ho ,  Keith Alan Bowman ,  Navid Toosizadeh ,  Shih-Hsin Jason Hu ,  Mohammad Reza Kakoee ,  Saravana Krishnan Kannan

    IPC: G01R31/00 ,  G01R19/00 ,  H03K5/05 ,  H03K5/19 ,  H03K5/00

    Abstract: In certain aspects, a system comprises a voltage-droop mitigation circuit configured to monitor voltage droop in a supply voltage supplied to a circuit, and to perform voltage-droop mitigation for the circuit if the monitored voltage droop is equal to or greater than a droop threshold. In one aspect, the system also includes a performance monitor configured to track a number of clock cycles over which the voltage-droop mitigation circuit performs the voltage-droop mitigation within a time duration, and to adjust the droop threshold based on the number of clock cycles. In another aspect, the system also includes a performance monitor configured to track a number of times that the voltage-droop mitigation circuit performs the voltage-droop mitigation within a time duration, and to adjust the droop threshold based on the number of times that the voltage-droop mitigation circuit performs the voltage-droop mitigation within the time duration.

    CIRCUITS AND METHODS PROVIDING VOLTAGE ADJUSTMENT AS PROCESSOR CORES BECOME ACTIVE
    8.
    发明申请
    CIRCUITS AND METHODS PROVIDING VOLTAGE ADJUSTMENT AS PROCESSOR CORES BECOME ACTIVE 有权
    提供电压调整的电路和方法，因为处理器的电压已经成为主动

    公开(公告)号：US20170068309A1

    公开(公告)日：2017-03-09

    申请号：US14849343

    申请日：2015-09-09

    Applicant: QUALCOMM Incorporated

    Inventor： Navid Toosizadeh ,  Mohammad Reza Kakoee ,  Shih-Hsin Jason Hu ,  Mohamed Waleed Allam

    IPC: G06F1/32

    CPC classification number: G06F1/3296 ,  G06F1/3206 ,  G06F1/324 ,  Y02D10/126 ,  Y02D10/172

    Abstract: A method including receiving an indication of a number of active processing units in a computer processor; in response to receiving the indication, determining an appropriate operating voltage margin for the computer processor; reducing an operating frequency of the active processing units in response to receiving the indication; adjusting a power supply to increase or decrease a voltage to the computer processor in accordance with the appropriate operating voltage margin; and increasing the operating frequency of the active processing units in response to an acknowledgment that the power supply has been adjusted.

    Abstract translation: 一种方法，包括在计算机处理器中接收多个活动处理单元的指示; 响应于接收到所述指示，确定所述计算机处理器的适当的工作电压裕度; 响应于接收到所述指示而减少所述活动处理单元的操作频率; 调整电源以根据适当的工作电压余量增加或减少计算机处理器的电压; 以及响应于已经调整了电源的确认来增加主动处理单元的操作频率。

    Multi-domain heterogeneous process-voltage-temperature tracking for integrated circuit power reduction
    9.
    发明授权
    Multi-domain heterogeneous process-voltage-temperature tracking for integrated circuit power reduction 有权
    用于集成电路功率降低的多域异构过程电压 - 温度跟踪

    公开(公告)号：US09400308B2

    公开(公告)日：2016-07-26

    申请号：US14323652

    申请日：2014-07-03

    Applicant: QUALCOMM Incorporated

    Inventor： Jasmin Smaila Ibrahimovic ,  Mohammad Reza Kakoee ,  Shih-Hsin Jason Hu

    IPC: G01R31/00 ,  G01R31/28 ,  G06F1/26 ,  G06F1/32

    CPC classification number: G01R31/2851 ,  G06F1/26 ,  G06F1/3203 ,  G06F1/3206 ,  G06F1/3287 ,  G06F1/3296 ,  Y02D10/171 ,  Y02D10/172

    Abstract: The systems and method described herein provide efficient (e.g., low power and low area) techniques to track performance in numerous supply domains with heterogeneous circuits that are used in a large system-on-a-chip integrated circuit (SoCs). The heterogeneous circuits can include circuits made with different devices, different cell libraries, and different hard macros that are in different power supply domains. Performance measurements from performance sensors (or process-voltage-temperature (PVT) sensors) that are spread about the SoC are collected and processed to determine voltage levels for each of the supply domains. A single controller can receive can determine voltage levels for a whole SoC. The performance sensors are connected to the controller by a scan chain. The techniques are flexible and can be easily adapted for use in SoCs with different power supply domains and types of circuits.

    Abstract translation: 本文所述的系统和方法提供了有效（例如，低功率和低面积）的技术，用于跟踪在大型片上系统集成电路（SoC）中使用的异质电路的多个供电域中的性能。 异构电路可以包括由不同设备制成的电路，不同的单元库以及不同电源域中的不同硬宏。 收集和处理围绕SoC传播的性能传感器（或过程电压 - 温度（PVT）传感器）的性能测量，以确定每个供应域的电压电平。 单个控制器可以接收可以确定整个SoC的电压电平。 性能传感器通过扫描链连接到控制器。 这些技术是灵活的，可以容易地适用于具有不同电源域和电路类型的SoC。

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