-
公开(公告)号:US20190259464A1
公开(公告)日:2019-08-22
申请号:US16378304
申请日:2019-04-08
Applicant: RAMBUS INC.
Inventor: Thomas Vogelsang , William Ng , Fredrick A. Ware
Abstract: Embodiments generally relate to integrated circuit devices having through silicon vias (TSVs). In one embodiment, an integrated circuit (IC) device includes a field of TSVs and an address decoder that selectably couples at least one of the TSVs to at least one of a test input and a test evaluation circuit. In another embodiment, a method includes selecting one or more TSVs from a field of TSVs in at least one IC device, and coupling each selected TSV to at least one of a test input and a test evaluation circuit.