公开(公告)号：US20170212154A1

公开(公告)日：2017-07-27

申请号：US15401596

申请日：2017-01-09

Applicant: Renesas Electronics Corporation

Inventor： Masanori OTSUKA ,  Wataru SAITO ,  Yoshitaka JINGU ,  Yasuhiko KOKAMI ,  Satoshi KONDO ,  Junya HORISHIMA

IPC: G01R19/32 ,  H03K17/687

CPC classification number: G01R19/32 ,  F16D48/06 ,  F16D2121/18 ,  G01R31/007 ,  H03K17/6872

Abstract: According to one embodiment, a current detection circuit (12) includes: a detection resistor (Rs) provided between a solenoid valve (106) and a solenoid driver (11); an amplification unit (121) configured to amplify a detected voltage of the detection resistor (Rs); an AD converter (122) that is driven by a reference voltage (Vref) generated based on a reference current (Iref) and configured to convert an output voltage from the amplification unit (121) into a digital value and output the digital value as a detected current value (D1); and a correction unit configured to perform a correction on the detected current value (D1). The correction unit includes: a temperature sensor (123); a storage unit (125) configured to store information about temperature characteristics of the detected current value (D1) generated due to temperature characteristics of a reference current in each of two or more different temperature regions; and an operation unit configured to apply, to the detected current value (D1), a first correction coefficient calculated based on a detection result of the temperature sensor (123) and information about temperature characteristics of the detected current value (D1) stored in the storage unit (125).

公开(公告)号：US20200244908A1

公开(公告)日：2020-07-30

申请号：US16737527

申请日：2020-01-08

Applicant: RENESAS ELECTRONICS CORPORATION

Inventor： Osamu MATSUMOTO ,  Masanori OTSUKA ,  Fukashi MORISHITA

IPC: H04N5/378 ,  H03M1/56 ,  H03K5/24 ,  H03M1/34 ,  H04N5/351

Abstract: A solid-state imaging device capable of suppressing variations in reference voltages and improving performance of reference voltages is provided. According to one embodiment, the solid-state imaging device includes a pixel outputting a luminance signal voltage corresponding to an amount of incident light, reference voltages, a reference voltage generation circuit outputting a ramp signal and an inverse ramp signal, and an AD converter, and the AD converter includes a comparator including an amplifier coupled to one input terminal, a reference voltage and an input terminal coupled to each of the ramp signals via a capacitor, and an input terminal coupled to each of the reference voltage and the ramp signal via a capacitor, and a ramp current cancel circuit coupled to each of the reference voltages via a cancel capacitor.