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公开(公告)号:US11415666B2
公开(公告)日:2022-08-16
申请号:US16585924
申请日:2019-09-27
Applicant: RENESAS ELECTRONICS CORPORATION
Inventor: Takashi Oshima , Tetsuo Matsui , Mitsuya Fukazawa , Katsuki Tateyama , Masaki Fujiwara
Abstract: A MASH type sigma delta AD converter includes a modulator, an analog filter filtering an extraction signal obtained by extracting a probe signal and an quantization error generated in a quantizer within a sigma delta modulator, a low speed AD converter performing an AD conversion of an output signal of the analog filter, a first adaptive filter searching for a transfer function of the sigma delta modulator, a second adaptive filter searching for a transfer function from an output of the modulator to the low speed AD converter via the analog filter, and a noise cancellation circuit cancelling the probe signal and the quantization error included in an output signal of the quantizer using the search results by the first and second adaptive filters.
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公开(公告)号:US09559716B1
公开(公告)日:2017-01-31
申请号:US15197447
申请日:2016-06-29
Applicant: Renesas Electronics Corporation
Inventor: Tetsuo Matsui , Hiroto Suzuki , Masaki Fujiwara , Tetsuro Matsuno
CPC classification number: H03M1/46 , H03M1/069 , H03M1/1061 , H03M1/124 , H03M1/468
Abstract: A processing speed can be improved while the accuracy of AD conversion is enhanced. An AD converter includes: a higher-order DAC that samples an analog input signal and performs DA conversion corresponding to higher-order bits of a digital output signal; an extension DAC that performs DA conversion to positive and negative polarities on an extension bit for expanding bits of the higher-order DAC; a lower-order DAC that performs DA conversion corresponding to lower-order bits of the digital output signal; a comparator that compares a comparison reference voltage with output voltages of the higher-order DAC, the extension DAC, and the lower-order DAC; and a successive approximation logic that controls successive approximation performed by the higher-order DAC, the extension DAC, and the lower-order DAC based on a comparison result of the comparator and generates the digital output signal.
Abstract translation: 可以提高处理速度,同时提高AD转换的精度。 AD转换器包括:高阶DAC,其对模拟输入信号进行采样,并对数字输出信号的高位进行DA转换; 扩展DAC,用于在用于扩展高阶DAC的位的扩展位上执行DA转换为正极性和负极性; 执行对应于数字输出信号的低阶位的DA转换的低阶DAC; 将比较参考电压与高阶DAC,扩展DAC和低阶DAC的输出电压进行比较的比较器; 以及基于比较器的比较结果控制由高阶DAC,扩展DAC和低阶DAC执行的逐次逼近的逐次逼近逻辑,并产生数字输出信号。
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公开(公告)号:US10707894B2
公开(公告)日:2020-07-07
申请号:US15900598
申请日:2018-02-20
Applicant: Renesas Electronics Corporation
Inventor: Takashi Oshima , Tetsuo Matsui , Mitsuya Fukazawa , Tomohiko Yano
Abstract: A modulator includes an analog integrator including an analog circuit and a quantizer quantizing its output signal. An external input signal is input thereto. A modulator is coupled to the latter stage of the modulator, and includes a quantizer. A probe signal generation circuit injects a probe signal to the modulator. An adaptive filter searches for a transfer function of the modulator by observing an output signal of the quantizer in accordance with a probe signal. Another adaptive filter searches for a transfer function of the modulator by observing an output signal of the quantizer in accordance with the probe signal. A noise cancel circuit cancels a quantization error generated by the quantizer using search results of the adaptive filters.
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公开(公告)号:US10903847B2
公开(公告)日:2021-01-26
申请号:US16717070
申请日:2019-12-17
Applicant: RENESAS ELECTRONICS CORPORATION
Inventor: Tetsuo Matsui , Keisaku Sento , Tomohiko Ebata
Abstract: A conventional analog-to-digital conversion circuit has a problem that conversion errors cannot be suppressed. According to one embodiment, the analog-to-digital conversion circuit includes a first digital-to-analog conversion circuit 30 of a capacitance distribution type, a second digital-to-analog conversion circuit 31 of a capacitance distribution type, and a comparison circuit 32 for comparing output voltages of the two digital-to-analog conversion circuits, and before performing a successive comparison operation for successively changing a reference voltage applied to the first digital-to-analog conversion circuit, generates an intermediate digital value having a digital value corresponding to a voltage value of an analog input signal, determines a reference voltage to be applied to the second digital-to-analog conversion circuit 31 in accordance with the intermediate digital value, and thereafter performs a successive comparison operation using the first digital-to-analog conversion circuit 30 in a state in which the state of the second digital-to-analog conversion circuit 31 is held.
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