公开(公告)号：US20170191950A1

公开(公告)日：2017-07-06

申请号：US15312881

申请日：2015-01-14

申请人： RIGAKU CORPORATION

发明人： Takeshi OSAKABE ,  Tetsuya OZAWA ,  Kazuhiko OMOTE ,  Licai JIANG ,  Boris VERMAN ,  Yuriy PLATONOV

IPC分类号： G01N23/20 ,  G01N23/207 ,  G01N23/205

CPC分类号： G01N23/20008 ,  G01N23/207 ,  G01N2223/056 ,  G01N2223/302 ,  G01N2223/315 ,  G01N2223/32 ,  G02B7/003 ,  G02B27/0977 ,  G02B27/4272 ,  G21K1/04 ,  G21K1/06 ,  G21K1/062 ,  G21K2201/067

摘要： Only X-rays having a specific wavelength out of focusing X-rays 2 diffracted from a sample S is reflected from a monochromator 60 based on a Bragg's condition, passed through a receiving slit 30 and detected by an X-ray detector 20. The monochromator 60 is configured to be freely removable, and arranged between the sample S and a focal point 2a at which the focusing X-rays 2 diffracted from the sample S are directly focused. At this time, the monochromator 60 is approached to the focal point 2a as closely as possible. The monochromator 60 comprises a multilayer mirror having an internal interplanar spacing which varies continuously from one end to the other end.

公开(公告)号：US20200300789A1

公开(公告)日：2020-09-24

申请号：US16823929

申请日：2020-03-19

申请人： Rigaku Corporation

发明人： Takeshi OSAKABE ,  Tetsuya OZAWA ,  Kazuki OMOTO

IPC分类号： G01N23/20016 ,  G01N23/207 ,  G01N23/20025

摘要： Provided is an X-ray analysis apparatus including: a goniometer including an incident-side arm extending in a first direction, a fixing portion, and a receiving-side arm; an X-ray source portion, which is arranged on the incident-side arm and generates an X-ray source extending in a second direction, which crosses the first direction; a support base, which is arranged on the fixing portion, and is configured to support a sample; a parallel slit, which is arranged on the fixing portion, and is configured to limit a line width along the second direction of the X-ray source generated by the X-ray source portion; and a detector, which is arranged on the receiving-side arm, and is configured to detect a scattered X-ray generated by the sample.

公开(公告)号：US20220244199A1

公开(公告)日：2022-08-04

申请号：US17588908

申请日：2022-01-31

申请人： Rigaku Corporation

发明人： Takeshi OSAKABE

IPC分类号： G01N23/20016 ,  G01N23/20025

摘要： Provided is an X-ray analysis apparatus including: a goniometer; a sample stage provided at a rotation center of the goniometer; an X-ray source configured to irradiate a sample with an X-ray, the sample being fixed on the sample stage; an X-ray detector configured to detect the X-ray diffracted by the sample; and an opening/closing mechanism configured to vary a width of a slit, which is formed between a pair of shielding members, by opening/closing the pair of shielding members, the opening/closing mechanism including an asymmetric control unit configured to control aperture widths of the pair of shielding members asymmetrically for one of the pair of shielding members on one side and another one of the pair of shielding members on another side depending on a rotation angle of the goniometer.