公开(公告)号：US11854712B2

公开(公告)日：2023-12-26

申请号：US17510857

申请日：2021-10-26

申请人： DUE2LAB S.R.L.

发明人： Nicola Zambelli ,  Giacomo Benassi

IPC分类号： G01N23/02 ,  G01N23/20 ,  G01N23/20008 ,  G21K1/02

CPC分类号： G21K1/025 ,  G01N23/02 ,  G01N23/20 ,  G01N23/20008 ,  G01N2223/03 ,  G01N2223/052 ,  G01N2223/1016 ,  G01N2223/204 ,  G01N2223/302 ,  G01N2223/303 ,  G01N2223/308 ,  G01N2223/316 ,  G01N2223/3307 ,  G01N2223/3308 ,  G01N2223/503 ,  G01N2223/633 ,  G01N2223/643 ,  G01N2223/645

摘要： An X-ray collimator (30) that comprises:



a collimator body (31) comprising:

a collimation conduit (32) provided with an inlet (320), configured to be connected to an X-ray source (20) for the inlet of a beam (B) of X-rays, and an outlet (321), configured to emit a collimated portion (B1) of the X-ray beam (B); and
a derivation conduit (33) inclined with respect to the collimation conduit (32), wherein the derivation conduit (33) is provided with an inlet (330), configured to be connected to the X-ray source (20) for the inlet of a peripheral portion (B2) of the same X-ray beam (B) emitted by the source (20), and an outlet (331);


a reference detector (40) fixed to the collimator body (31) and provided with an inlet window (41) facing the outlet (331) of the derivation conduit (33).

公开(公告)号：US11846595B2

公开(公告)日：2023-12-19

申请号：US17418867

申请日：2019-12-06

申请人： THE 59TH INSTITUTE OF CHINA ORDNANCE INDUSTRY

发明人： Lin Zheng ,  Shitao Dou ,  Changguang He ,  Zhengkun Peng ,  Yong Xiao ,  Lunwu Zhang ,  Jin Zhang ,  Xianhe Feng

IPC分类号： G01N23/207 ,  G01N23/20 ,  G01N23/20025 ,  G01N23/20008

CPC分类号： G01N23/20025 ,  G01N23/20 ,  G01N23/207 ,  G01N23/20008 ,  G01N2223/056 ,  G01N2223/302 ,  G01N2223/602 ,  G01N2223/605

摘要： A diffraction apparatus and a method for non-destructively testing internal crystal orientation uniformity of a workpiece are provided. The apparatus includes: an X-ray irradiation system for irradiating an X-ray to a measured part of a sample under testing, and an X-ray detection system for simultaneously detecting a plurality of diffracted X-rays formed by diffraction of a plurality of parts of the sample under testing, to measure an X-ray diffraction intensity distribution of the sample under testing, where the detected diffracted X-rays are short-wavelength characteristic X-rays, and the X-ray detection system is an array detection system. By the apparatus and the method, the detection efficiency is greatly improved.

公开(公告)号：US11713268B2

公开(公告)日：2023-08-01

申请号：US16426887

申请日：2019-05-30

申请人： Owens-Brockway Glass Container Inc.

发明人： Philippe Floriot

IPC分类号： G01N23/22 ,  C03B9/14 ,  C03C3/087 ,  C03C3/095 ,  G01N23/223 ,  G01N33/38 ,  C03C4/12 ,  C03B1/00 ,  C03C4/00

CPC分类号： C03B9/14 ,  C03B1/00 ,  C03C3/087 ,  C03C3/095 ,  C03C4/00 ,  C03C4/12 ,  G01N23/223 ,  G01N33/386 ,  G01N2223/0766 ,  G01N2223/301 ,  G01N2223/302 ,  G01N2223/304 ,  G01N2223/615 ,  G01N2223/616

摘要： A system and method for producing period-coded glass containers is disclosed. One method comprises producing a glass container from a traceable material composition associated with a predetermined time period, manufacturing facility, and/or time of container manufacture, where the glass container is configured to be analyzed for the traceable material composition, and at least one of constituents of or amounts of materials in the traceable material composition is configured to be identified and cross-referenced to a cross-reference schedule for identifying the time period, manufacturing facility, and/or time of container manufacture in which the glass container was produced.

公开(公告)号：US10001447B2

公开(公告)日：2018-06-19

申请号：US14901772

申请日：2015-05-13

申请人： Halliburton Energy Services, Inc.

发明人： John Norris Smith ,  Patrick William Powell ,  Corbin Sean Glenn

IPC分类号： G01N23/00 ,  G01N23/04 ,  G01V5/08 ,  G01V13/00 ,  G01N33/22

CPC分类号： G01N23/046 ,  G01N33/222 ,  G01N2223/302 ,  G01N2223/303 ,  G01N2223/419 ,  G01N2223/616 ,  G01N2223/633 ,  G01V5/08 ,  G01V13/00

摘要： A method may include positioning at least one calibration disk in a computed tomography (CT) scanner and positioning a pellet in the CT scanner. The at least one calibration disk and the pellet may both be made of a same powder exhibiting a known density. The method may further include scanning the at least one calibration disk and the pellet using the CT scanner to obtain one or more CT images of the pellet and the at least one calibration disk, and comparing a density of the pellet with the known density of the at least one calibration disk based on the one or more CT images.

公开(公告)号：US20170191950A1

公开(公告)日：2017-07-06

申请号：US15312881

申请日：2015-01-14

申请人： RIGAKU CORPORATION

发明人： Takeshi OSAKABE ,  Tetsuya OZAWA ,  Kazuhiko OMOTE ,  Licai JIANG ,  Boris VERMAN ,  Yuriy PLATONOV

IPC分类号： G01N23/20 ,  G01N23/207 ,  G01N23/205

CPC分类号： G01N23/20008 ,  G01N23/207 ,  G01N2223/056 ,  G01N2223/302 ,  G01N2223/315 ,  G01N2223/32 ,  G02B7/003 ,  G02B27/0977 ,  G02B27/4272 ,  G21K1/04 ,  G21K1/06 ,  G21K1/062 ,  G21K2201/067

摘要： Only X-rays having a specific wavelength out of focusing X-rays 2 diffracted from a sample S is reflected from a monochromator 60 based on a Bragg's condition, passed through a receiving slit 30 and detected by an X-ray detector 20. The monochromator 60 is configured to be freely removable, and arranged between the sample S and a focal point 2a at which the focusing X-rays 2 diffracted from the sample S are directly focused. At this time, the monochromator 60 is approached to the focal point 2a as closely as possible. The monochromator 60 comprises a multilayer mirror having an internal interplanar spacing which varies continuously from one end to the other end.

公开(公告)号：US4028267A

公开(公告)日：1977-06-07

申请号：US562460

申请日：1975-03-27

申请人： Adolf Ragnar Roland Umberto Einarsson Christell ,  Kaijo Aatto Matias Koski ,  Knut Lennart Ljunggren

发明人： Adolf Ragnar Roland Umberto Einarsson Christell ,  Kaijo Aatto Matias Koski ,  Knut Lennart Ljunggren

IPC分类号： G01N23/06 ,  G01N23/222 ,  G01Q40/00 ,  G01N23/02

CPC分类号： G01N23/222 ,  G01N2223/0745 ,  G01N2223/302 ,  G01N2223/643

摘要： Method and apparatus for measuring the concentration of various components, such as the iron component in iron ore, by exposing the material to irradiation between a neutron source and a gamma ray detector. The emitted gamma rays are captured by the detector and transformed into a signal which is transmitted to a recording device for measuring the gamma ray radiation.

摘要翻译： 通过将材料暴露于中子源和伽马射线探测器之间的照射来测量各种成分的浓度的方法和装置，例如铁矿石中的铁成分。 发射的伽马射线被检测器捕获并变换成被传送到用于测量伽马射线辐射的记录装置的信号。

公开(公告)号：US3040983A

公开(公告)日：1962-06-26

申请号：US4639660

申请日：1960-08-01

申请人： GEN ELECTRIC

发明人： EDWARD BIGELOW JOHN

IPC分类号： G01N23/22 ,  G01R23/09 ,  H03K5/26

CPC分类号： H03K5/26 ,  G01N23/22 ,  G01N2223/1016 ,  G01N2223/302 ,  G01N2223/304 ,  G01R23/09

公开(公告)号：US09964500B2

公开(公告)日：2018-05-08

申请号：US15531066

申请日：2014-12-08

申请人： Hitachi High-Technologies Corporation

发明人： Hisashi Hatano ,  Koichi Nagoya ,  Mamoru Kobayashi

IPC分类号： G01N23/00 ,  G01N23/225 ,  G01N21/47 ,  G01N21/95 ,  G01N21/956 ,  G01N21/84

CPC分类号： G01N23/2251 ,  G01N21/47 ,  G01N21/9501 ,  G01N21/95607 ,  G01N2021/845 ,  G01N2021/8854 ,  G01N2021/8858 ,  G01N2021/8861 ,  G01N2021/8864 ,  G01N2021/888 ,  G01N2223/302 ,  G01N2223/6116 ,  G01N2223/643 ,  G01N2223/6466 ,  H01J37/24 ,  H01J37/28

摘要： A defect inspection device is provided with an illumination optical system that irradiates light or an electron beam onto a sample, a detector that detects a signal obtained from the sample through the irradiation of the light or electron beam, a defect detection unit that detects a defect candidate on the sample through the comparison of a signal output by the detector and a prescribed threshold, and a display unit that displays a setting screen for setting the threshold. The setting screen is a two-dimensional distribution map that represents the distribution of the defect candidates in a three dimensional feature space having three features as the axes thereof and includes the axes of the three features and the threshold, which is represented in one dimension.

公开(公告)号：US20160370305A1

公开(公告)日：2016-12-22

申请号：US14901772

申请日：2015-05-13

申请人： HALLIBURTON ENERGY SERVICES, INC.

发明人： John Norris Smith ,  Patrick William Powell ,  Corbin Sean Glenn

IPC分类号： G01N23/04 ,  G01N33/22

CPC分类号： G01N23/046 ,  G01N33/222 ,  G01N2223/302 ,  G01N2223/303 ,  G01N2223/419 ,  G01N2223/616 ,  G01N2223/633 ,  G01V5/08 ,  G01V13/00

摘要： A method may include positioning at least one calibration disk in a computed tomography (CT) scanner and positioning a pellet in the CT scanner. The at least one calibration disk and the pellet may both be made of a same powder exhibiting a known density. The method may further include scanning the at least one calibration disk and the pellet using the CT scanner to obtain one or more CT images of the pellet and the at least one calibration disk, and comparing a density of the pellet with the known density of the at least one calibration disk based on the one or more CT images.

摘要翻译： 一种方法可以包括将计算机断层摄影（CT）扫描器中的至少一个校准盘定位并将颗粒定位在CT扫描器中。 至少一个校准盘和颗粒都可以由表现出已知密度的相同粉末制成。 该方法还可以包括使用CT扫描器扫描至少一个校准盘和颗粒，以获得颗粒和至少一个校准盘的一个或多个CT图像，并将颗粒的密度与已知密度的 基于所述一个或多个CT图像的至少一个校准盘。

公开(公告)号：US20160313266A1

公开(公告)日：2016-10-27

申请号：US15103894

申请日：2014-11-17

申请人： HITACHI HIGH-TECHNOLOGIES CORPORATION

发明人： Akiyuki SUGIYAMA ,  Miki ISAWA ,  Satoru YAMAGUCHI ,  Motonobu HOMMI

IPC分类号： G01N23/22 ,  G01N23/225

CPC分类号： G01N23/2206 ,  G01B15/00 ,  G01B2210/56 ,  G01N23/2251 ,  G01N2223/071 ,  G01N2223/302 ,  G01N2223/306 ,  G01N2223/6116 ,  G03F7/0002

摘要： The purpose of the present invention is to provide a pattern measurement device for quantitatively evaluating a pattern formed using a directed self-assembly (DSA) method with high accuracy. The present invention is a pattern measurement device for measuring distances between patterns formed in a sample, wherein the centroids of a plurality of patterns included in an image are determined; the inter-centroid distances, and the like, of the plurality of centroids are determined; and on the basis of the inter-centroid distances, and the like, of the plurality of centroids, a pattern meeting a specific condition is distinguished from patterns different from the pattern meeting the specific condition or information is calculated about the number of the patterns meeting the specific condition, the size of an area including the patterns meeting the specific condition, and the number of imaginary lines between the patterns meeting the specific condition.

摘要翻译： 本发明的目的是提供一种用于使用定向自组装（DSA）方法以高精度定量评估图案的图案测量装置。 本发明是一种图形测量装置，用于测量在样本中形成的图案之间的距离，其中确定包括在图像中的多个图案的质心; 确定多个质心的质心距离等; 并且基于多个质心之间的像素间距等，将符合特定条件的图案区别于与满足特定条件的图案不同的图案，或者计算关于图案会议次数的信息 特定条件，包括满足特定条件的图案的区域的尺寸以及满足特定条件的图案之间的虚线数量。