公开(公告)号：US08115164B2

公开(公告)日：2012-02-14

申请号：US12320599

申请日：2009-01-29

申请人： Ralf Netz ,  Wolfgang Bathe ,  Joerg Steinert ,  Werner Kleinschmidt ,  Ingo Fahlbusch ,  Michael Brehm

发明人： Ralf Netz ,  Wolfgang Bathe ,  Joerg Steinert ,  Werner Kleinschmidt ,  Ingo Fahlbusch ,  Michael Brehm

IPC分类号： G01D18/00

CPC分类号： G02B21/34 ,  G01M11/0264 ,  G02B21/002 ,  G02B27/32

摘要： A calibration device for managing a variety of performance tests and/or calibration tasks in a laser scanning microscope. The calibration device, which has focusing optics and a test structure arranged in the focal plane of the focusing optics, with structural elements detectable in reflected and/or transmitted light aligned to each other in a common mounting, can be switched into the microscope beam path in a laser scanning microscope, so that the pupil of the focusing optics coincides with the objective pupil of the laser scanning microscope or lies in a plane conjugated to it.

摘要翻译： 用于在激光扫描显微镜中管理各种性能测试和/或校准任务的校准装置。 具有聚焦光学元件和布置在聚焦光学器件的焦平面中的测试结构的校准装置可以被转换成显微镜光束路径，该结构元件可在反射和/或透射的光中可检测到，在共同安装中彼此对准 在激光扫描显微镜中，使得聚焦光学元件的瞳孔与激光扫描显微镜的客观瞳孔重合或位于与其共轭的平面中。

公开(公告)号：US20090224174A1

公开(公告)日：2009-09-10

申请号：US12320599

申请日：2009-01-29

申请人： Ralf Netz ,  Wolfgang Bathe ,  Joerg Steinert ,  Werner Kleinschmidt ,  Ingo Fahlbusch ,  Michael Brehm

发明人： Ralf Netz ,  Wolfgang Bathe ,  Joerg Steinert ,  Werner Kleinschmidt ,  Ingo Fahlbusch ,  Michael Brehm

IPC分类号： G01N21/64 ,  G02B21/06

CPC分类号： G02B21/34 ,  G01M11/0264 ,  G02B21/002 ,  G02B27/32

摘要： A calibration device for managing a variety of performance tests and/or calibration tasks in a laser scanning microscope. The calibration device, which has focusing optics and a test structure arranged in the focal plane of the focusing optics, with structural elements detectable in reflected and/or transmitted light aligned to each other in a common mounting, can be switched into the microscope beam path in a laser scanning microscope, so that the pupil of the focusing optics coincides with the objective pupil of the laser scanning microscope or lies in a plane conjugated to it.

摘要翻译： 用于在激光扫描显微镜中管理各种性能测试和/或校准任务的校准装置。 具有聚焦光学元件和布置在聚焦光学器件的焦平面中的测试结构的校准装置可以被转换成显微镜光束路径，该结构元件可在反射和/或透射的光中可检测到，在共同安装中彼此对准 在激光扫描显微镜中，使得聚焦光学元件的瞳孔与激光扫描显微镜的客观瞳孔重合或位于与其共轭的平面中。

公开(公告)号：US09304307B2

公开(公告)日：2016-04-05

申请号：US13902763

申请日：2013-05-24

申请人： Wibke Hellmich ,  Gerhard Krampert ,  Matthias Langhorst ,  Ralf Netz

发明人： Wibke Hellmich ,  Gerhard Krampert ,  Matthias Langhorst ,  Ralf Netz

IPC分类号： G02B26/02 ,  G02B21/00

CPC分类号： G02B21/0044 ,  G02B21/0052 ,  G02B21/008

摘要： A light scanning microscope with an illumination module generates several illumination beams and moves them, in each case as a spot, in a predefined region of a sample to excite sample radiation. A detector module for confocal detection of the sample radiation excited by each spot includes a first detector, an imaging lens system, having an optical axis, for imaging the predefined region along an imaging beam path running from the sample as far as the first detector, and a rotatable diaphragm with several pinholes located in a pinhole plane. The diaphragm, upon rotation, may be located at least partially in the imaging beam path for confocal detection. A second detector may be arranged outside of the imaging beam path. A first beam splitter may be arranged in the imaging beam path between the sample and the diaphragm. The beam splitter deflects sample radiation onto the second detector.

摘要翻译： 具有照明模块的光扫描显微镜产生几个照明光束，并将它们在每种情况下作为点移动到样品的预定区域以激发样品辐射。 用于由每个点激发的样品辐射的共焦检测的检测器模块包括具有光轴的第一检测器，成像透镜系统，用于沿着从样品运行的成像光束路径成像到第一检测器， 以及具有位于针孔平面中的几个针孔的可旋转隔膜。 膜片在旋转时可以至少部分地位于用于共焦检测的成像光束路径中。 第二检测器可以布置在成像光束路径的外部。 第一分束器可以布置在样品和隔膜之间的成像光束路径中。 分束器将样品辐射器偏转到第二检测器上。

公开(公告)号：US20120268749A1

公开(公告)日：2012-10-25

申请号：US13299515

申请日：2011-11-18

申请人： Michael Goelles ,  Ralf Netz ,  Frank Hecht ,  Joerg-Michael Funk

发明人： Michael Goelles ,  Ralf Netz ,  Frank Hecht ,  Joerg-Michael Funk

IPC分类号： G01B11/14

CPC分类号： G01B11/14 ,  G02B21/0036 ,  G02B21/008

摘要： Laser scanning microscope and its operating method in which at least two first and second scanning systems activated independently of each other and that can move in at least one direction illuminate a sample with the help of a beam-combining element, and the light is detected by the sample as it comes in, The scanning fields created by the light distributions on the sample mutually overlap to create a reference pattern on the sample with one of the light distributions, which is then captured and used to create the overlap using the second light distribution and/or a reference pattern arranged in the sample plane or in an intermediate image plane is captured by both scanning fields and used to create the overlap and/or structural characteristics of the sample are captured by the two scanning fields as reference pattern and used to create the overlap in which correction values are determined.

摘要翻译： 激光扫描显微镜及其操作方法，其中至少两个第一和第二扫描系统彼此独立地激活并且可以在至少一个方向上移动，借助于光束组合元件照射样品，并且光被检测到 样品进入，由样品上的光分布产生的扫描场相互重叠，以在样品上产生参考图案，其中一个光分布被捕获并用于使用第二光分布来创建重叠 和/或布置在采样平面或中间图像平面中的参考图案由两个扫描场捕获并用于创建样本的重叠和/或结构特征由两个扫描场作为参考图案捕获，并用于 创建确定校正值的重叠。

公开(公告)号：US20100097694A1

公开(公告)日：2010-04-22

申请号：US12578202

申请日：2009-10-13

申请人： Bernhard Zimmermann ,  Ralf Netz ,  Frank Hecht ,  Joerg-Michael Funk ,  Ralf Engelmann

发明人： Bernhard Zimmermann ,  Ralf Netz ,  Frank Hecht ,  Joerg-Michael Funk ,  Ralf Engelmann

IPC分类号： G02B21/06

CPC分类号： G02B21/06 ,  G02B21/00 ,  G02B21/0032 ,  G02B21/0076 ,  G02B27/0972

摘要： Method for actuation control of a microscope, in particular of a Laser Scanning Microscope, in which, at least one first illumination light, preferably moving at least in one direction, as well as at least one second illumination light moving at least in one direction, illuminate a sample through a beam combiner, a detection of the light coming from the sample takes place, whereby, at least one part of the illumination light is generated through the splitting of the light from a common illuminating unit, characterized in that, by means of a common control unit, a controlled splitting into the first and the second illumination light takes place, in which the intensity of the first illuminating light, specified by the user or specified automatically, is assigned a higher priority (is prioritized) compared to the specified value for the second illumination light, and an adjustment for the second illumination light takes place until a maximum value is obtained, which is determined by the value specified for the first illumination light.

摘要翻译： 显微镜，特别是激光扫描显微镜的致动控制方法，其中至少一个至少在一个方向上移动的第一照明光以及至少沿一个方向移动的至少一个第二照明光， 通过光束组合器照射样品，发生来自样品的光的检测，由此通过从公共照明单元分离光而产生照明光的至少一部分，其特征在于，通过装置 发生公共控制单元的受控分割，进入第一和第二照明光，其中由用户指定或自动指定的第一照明光的强度被分配为比较高的优先级（优先化） 对于第二照明光的指定值，并且进行第二照明光的调整，直到获得最大值，其由v 为第一个照明灯指定。

公开(公告)号：US08120771B2

公开(公告)日：2012-02-21

申请号：US12739478

申请日：2008-09-30

申请人： Stephan Wagner-Conrad ,  Frank Hecht ,  Klaus Weisshart ,  Ralf Netz

发明人： Stephan Wagner-Conrad ,  Frank Hecht ,  Klaus Weisshart ,  Ralf Netz

IPC分类号： G01J3/00

CPC分类号： G02B21/0076 ,  G02B21/008

摘要： By means of an improved configuration method, mathematical transport models can be fitted to correlations determined by means of scanning fluorescence spectroscopy with few errors. With improved methods for carrying out or evaluating a raster image correlation spectroscopy measurement (RICS) measurement, the amount of data to be stored can be reduced and RICS correlations of high statistical quality can be determined within a short period of time. For a raster image correlation spectroscopy measurement, a best value for a sampling value is determined and is specified for a subsequent scanning process on a sample. In order to carry out or evaluate a RICS measurement, sampling values are acquired or a correlation is determined exclusively in a sample region within which a pixel time (ΔP) changes along a harmonically controlled scan axis (X) by less than, or at most by, a predetermined or predeterminable value.

摘要翻译： 通过改进的配置方法，数学传递模型可以适用于通过扫描荧光光谱法确定的相关性，几乎没有错误。 通过改进的光栅图像相关光谱测量（RICS）测量方法，可以减少要存储的数据量，并可以在短时间内确定高统计质量的RICS相关性。 对于光栅图像相关光谱测量，确定采样值的最佳值，并为样品上的后续扫描过程指定。 为了执行或评估RICS测量，获取采样值或仅在像素时间（＆Dgr; P）沿着谐波控制的扫描轴（X）改变小于或等于或小于或等于 最多可以是预定的或可预定的值。

公开(公告)号：US20110267688A1

公开(公告)日：2011-11-03

申请号：US12913487

申请日：2010-10-27

申请人： Ingo Kleppe ,  Ralf Netz ,  Yauheni Novikau

发明人： Ingo Kleppe ,  Ralf Netz ,  Yauheni Novikau

IPC分类号： G02B21/06

CPC分类号： G02B21/0072 ,  G02B21/0036 ,  G02B21/0076 ,  G02B21/008

摘要： Method for enhancing the resolution of a microscope during the detection of an illuminated specimen and a microscope for carrying out the method, wherein in a first position, an illumination pattern is generated on the specimen, the resolution of which is preferably within the range of the attainable optical resolution of the microscope or higher, wherein a relative movement, preferably perpendicular to the direction of illumination, from a first into at least one second position of the illumination pattern on the specimen is generated at least once between the detection and the illumination pattern with a step width smaller than the resolution limit of the microscope and detection and storage of the detection signals take place both in the first and in the second position.

摘要翻译： 在用于检测被照射的样本的显微镜检测期间提高显微镜的分辨率的方法和用于实施该方法的显微镜的方法，其中在第一位置，在样本上产生照明图案，其分辨率优选在 显示器的可获得的光学分辨率或更高，其中在检测和照射图案之间至少产生一次关于样品上的照明图案的第一至至少一个第二位置的优选垂直于照明方向的相对运动 具有小于显微镜的分辨率极限的台阶宽度，检测信号的检测和存储在第一和第二位置都发生。

公开(公告)号：US20100225910A1

公开(公告)日：2010-09-09

申请号：US12739478

申请日：2008-09-30

申请人： Stephan Wagner-Conrad ,  Frank Hecht ,  Klaus Weisshart ,  Ralf Netz

发明人： Stephan Wagner-Conrad ,  Frank Hecht ,  Klaus Weisshart ,  Ralf Netz

IPC分类号： G01J3/28 ,  G01J1/10

CPC分类号： G02B21/0076 ,  G02B21/008

摘要： 1.1. Method for the configuration a laser scanning microscope for a raster image correlation spectroscopy measurement and method for carrying out and evaluating a measurement of this kind. 2.1. Manual setting of the scan parameters for a raster image correlation spectroscopy measurement (RICS) is complicated because the effects of setting a certain parameter are not apparent due to the complex interaction between the various parameters and also depend on the physical-technical properties of the microscope. By means of an improved configuration method, mathematical transport models can be fitted to correlations determined by means of scanning fluorescence spectroscopy with few errors. With improved methods for carrying out or evaluating a RICS measurement, the amount of data to be stored can be reduced and RICS correlations of high statistical quality can be determined within a short period of time. 2.2. According to the invention, for a raster image correlation spectroscopy measurement, a best value for a sampling value is determined and is specified for a subsequent scanning process on a sample. In order to carry out or evaluate a RICS measurement, sampling values are acquired or a correlation is determined exclusively in a sample region within which a pixel time (ΔP) changes along a harmonically controlled scan axis (X) by less than, or at most by, a predetermined or predeterminable value. 2.3. The invention is preferably used in laser scanning microscopes.

摘要翻译： 1.1。 配置用于光栅图像相关光谱测量的激光扫描显微镜的方法和用于执行和评估这种测量的方法。 2.1。 用于光栅图像相关光谱测量（RICS）的扫描参数的手动设置是复杂的，因为设置某个参数的效果由于各种参数之间的复杂相互作用而不明显，并且还取决于显微镜的物理 - 技术性质 。 通过改进的配置方法，数学传递模型可以适用于通过扫描荧光光谱法确定的相关性，几乎没有错误。 通过改进的RICS测量方法，可以减少存储的数据量，并可以在短时间内确定高统计质量的RICS相关性。 2.2。 根据本发明，对于光栅图像相关光谱测量，确定采样值的最佳值，并为样品的后续扫描过程确定。 为了执行或评估RICS测量，获取采样值或仅在像素时间（＆Dgr; P）沿着谐波控制的扫描轴（X）改变小于或等于或小于或等于 最多可以是预定的或可预定的值。 2.3。 本发明优选用于激光扫描显微镜。

公开(公告)号：US07656583B2

公开(公告)日：2010-02-02

申请号：US11783289

申请日：2007-04-06

申请人： Michael Goelles ,  Ralf Netz ,  Marcus Heidkamp ,  Joerg-Michael Funk

发明人： Michael Goelles ,  Ralf Netz ,  Marcus Heidkamp ,  Joerg-Michael Funk

IPC分类号： G02B27/10

CPC分类号： G02B27/144 ,  G02B21/0064

摘要： A beam corradiator for combining two radiation beams, preferably movable beams independent from each other in at least one direction, to scan and/or influence a sample, preferably a manipulation system and an imaging system, with a partially reflecting layer being provided for the corradiation, wherein the thickness of the layer is provided with a preferably consistent incline or decline over the optically effective cross-section of the beam corradiatior.

摘要翻译： 一种用于组合两个辐射束，优选在至少一个方向上彼此独立的可移动光束以扫描和/或影响样品，优选地操纵系统和成像系统的光束校正器，其中提供了部分反射层用于辐照 ，其中所述层的厚度在所述光束辐射体的光学有效横截面上被提供优选地一致的倾斜或下降。

公开(公告)号：US09404867B2

公开(公告)日：2016-08-02

申请号：US13518115

申请日：2010-10-22

申请人： Michael Kempe ,  Ralf Netz ,  Gerhard Krampert

发明人： Michael Kempe ,  Ralf Netz ,  Gerhard Krampert

IPC分类号： G01N21/64 ,  G02B21/16

CPC分类号： G01N21/6458 ,  G02B21/16

摘要： A luminescence microscopy method includes a sample being used, which comprises a certain substance, wherein the certain substance can be converted repeatedly from a first state, in which it can be excited into emitting luminescence radiation, into a second state, in which it cannot be excited into emitting luminescence radiation. The substance present in the sample can be brought into the first state by irradiating switch radiation. The certain substance can be excited into emitting luminescence radiation by irradiating excitation radiation. The sample emitting luminescence radiation can be displayed. A high-resolution selection of sample regions extending perpendicularly to a sample surface is carried out by irradiating either the switch radiation or the excitation radiation as structured illumination of the sample. A high-resolution selection of the sample surface is carried out by irradiating the switch radiation and/or the excitation radiation as TIRF illumination of the sample.

摘要翻译： 发光显微镜方法包括使用的样品，其包含某种物质，其中某些物质可以从其可被激发发射发光辐射的第一状态重复地转换成第二状态，其中不能是 激发发射发光辐射。 存在于样品中的物质可以通过照射开关辐射而进入第一状态。 可以通过照射激发辐射来激发某些物质发射发光辐射。 可以显示发射发光辐射的样品。 垂直于样品表面延伸的样品区域的高分辨率选择是通过照射样品的结构照明中的开关辐射或激发辐射来进行的。 通过将开关辐射和/或激发辐射照射作为样品的TIRF照明来进行样品表面的高分辨率选择。