Abstract:
It is an object to obtain a semiconductor storage having a 1nullchip structure which can be simultaneously accessed to memory cells present in different memory cell arrays. A 1nullport memory cell array (11) provided with a word line (WL1) for a first port in common and a 2nullport memory cell array (12) are provided together over one chip, thereby constituting a semiconductor storage. By selectively bringing any of a plurality of the word lines (WL1) for the first port into an active state by a row decoder (16), it is possible to simultaneously access respective memory cells of the 1nullport memory cell array (11) and the 2nullport memory cell array (12). By selectively bringing any of a plurality of word lines (WL2) for a second port into an active state by a row decoder (18), it is possible to singly access the 2nullport memory cell array (12).
Abstract:
A dummy circuit including a plurality of dummy cells is provided in correspondence to a predetermined number of word lines. When either one of corresponding word lines are selected, a dummy bit line equal in load to a normal bit line is driven using the plurality of dummy cells included in this dummy circuit. A potential of this dummy bit line is detected by a dummy sense amplifier, and a sense enable signal is generated. Therefore, it is possible to accurately detect a sense timing irrespectively of array architecture.
Abstract:
A semiconductor memory device having a multiport memory includes a plurality of memory cells MC arranged in columns and rows, a plurality of first word lines WLA0-WLAn connected to a first port 13a, and a plurality of second word lines WLB0-WLBn connected to a second port 13b. Each of a plurality of first word lines WLA0-WLAn and each of a plurality of second word lines WLB0-WLBn are arranged alternately in a planar layout. A semiconductor memory device is thus obtained that allows a coupling noise between interconnections to be reduced without an increase in memory cell area.
Abstract:
Level control signals are both set to H level, and potentials of power supply lines are both set to be lower than a power supply potential. In this manner, a gate leakage current during waiting and writing operation of a memory cell array can significantly be reduced. The level control signals are set to L level and H level respectively, and solely the potential of one of the power supply lines is set to be lower than the power supply potential. In this manner, power consumption during a reading operation of the memory cell array can be reduced.
Abstract:
Dummy cells are divided into a plurality of divided dummy columns, and divided dummy bit lines are arranged corresponding to the divided dummy columns. These divided dummy bit lines are provided with dummy sense amplifiers that drive a sense control line transmitting a sense enable signal activating a sense amplifier. A faster activation timing of the sense amplifier can be achieved.