公开(公告)号：US20060294427A1

公开(公告)日：2006-12-28

申请号：US11167965

申请日：2005-06-27

申请人： Richard Glass ,  Madhu Athreya ,  Keith Drescher ,  Piyush Desai

发明人： Richard Glass ,  Madhu Athreya ,  Keith Drescher ,  Piyush Desai

IPC分类号： G06F11/00

CPC分类号： G06F11/3636

摘要： A scheme for exposing internal debug values in an in-band means via debug packets that are injected sequentially with normal link traffic on a link and do not interrupt or otherwise interfere with normal operation of the link or related devices. Therefore, this proposal does not require additional pins since the debug values are exposed via debug packets in an in-band means along with normal link traffic and the debug values are exposed synchronously with normal link traffic since the debug packets are injected sequentially.

公开(公告)号：US07958404B2

公开(公告)日：2011-06-07

申请号：US12414733

申请日：2009-03-31

申请人： Keith Drescher ,  Debendra Das Sharma ,  David Sams ,  Richard Glass

发明人： Keith Drescher ,  Debendra Das Sharma ,  David Sams ,  Richard Glass

IPC分类号： G06F11/00

CPC分类号： G01R31/3177

摘要： In one embodiment, a state machine may enable retraining of a link, where the state machine is to be initiated responsive to an external input received from a logic analyzer coupled to the link or a periodic timer. Such external input may indicate that the logic analyzer has lost synchronization with respect to link communications, and the retraining thus enables the logic analyzer to regain resynchronization. Other embodiments are described and claimed.

摘要翻译： 在一个实施例中，状态机可以允许重新训练链路，其中响应于从耦合到链路的逻辑分析器接收的外部输入或周期性定时器来启动状态机。 这种外部输入可以指示逻辑分析仪相对于链路通信已经失去同步，并且再训练使得逻辑分析仪能够重新获得重新同步。 描述和要求保护其他实施例。

公开(公告)号：US20090006317A1

公开(公告)日：2009-01-01

申请号：US11771962

申请日：2007-06-29

申请人： Robert N. Roth ,  Keith Drescher ,  Ramamurthy V. Dharmala ,  Richard Glass ,  Saji Varkey

发明人： Robert N. Roth ,  Keith Drescher ,  Ramamurthy V. Dharmala ,  Richard Glass ,  Saji Varkey

IPC分类号： G06F7/06

CPC分类号： G06F16/148

摘要： A distributed search architecture utilizing multiple processing cores to search multiple files containing time-correlated and logically/semantically interdependent sequential data. A supervisory processing core may provide coordination of the search where multiple slave processing cores each search one or more data files containing time-correlated and logically/semantically interdependent sequential data. Results of the searches performed by the slave processing cores may be provided to the supervisory processing core for consolidation, further analysis and/or presentation.

摘要翻译： 利用多个处理核心搜索包含时间相关和逻辑/语义相互依赖的顺序数据的多个文件的分布式搜索架构。 监督处理核心可以提供搜索的协调，其中多个从属处理核心每个搜索包含时间相关和逻辑/语义相互依赖的顺序数据的一个或多个数据文件。 从处理核心执行的搜索结果可以被提供给监督处理核心用于合并，进一步分析和/或呈现。

公开(公告)号：US20100251001A1

公开(公告)日：2010-09-30

申请号：US12414733

申请日：2009-03-31

申请人： Keith Drescher ,  Debendra Das Sharma ,  David Sams ,  Richard Glass

发明人： Keith Drescher ,  Debendra Das Sharma ,  David Sams ,  Richard Glass

IPC分类号： G01R31/3177 ,  G06F11/25 ,  G06F11/07

CPC分类号： G01R31/3177

摘要： In one embodiment, a state machine may enable retraining of a link, where the state machine is to be initiated responsive to an external input received from a logic analyzer coupled to the link or a periodic timer. Such external input may indicate that the logic analyzer has lost synchronization with respect to link communications, and the retraining thus enables the logic analyzer to regain resynchronization. Other embodiments are described and claimed.

摘要翻译： 在一个实施例中，状态机可以允许重新训练链路，其中响应于从耦合到链路的逻辑分析器接收的外部输入或周期性定时器来启动状态机。 这种外部输入可以指示逻辑分析仪相对于链路通信已经失去同步，并且再训练使得逻辑分析仪能够重新获得重新同步。 描述和要求保护其他实施例。

公开(公告)号：US10198333B2

公开(公告)日：2019-02-05

申请号：US13997182

申请日：2010-12-23

申请人： Mark B. Trobough ,  Keshavan K. Tiruvallur ,  Chinna B. Prudvi ,  Christian E. Iovin ,  David W. Grawrock ,  Jay J. Nejedlo ,  Ashok N. Kabadi ,  Travis K. Goff ,  Evan J. Halprin ,  Kapila B. Udawatta ,  Jiun Long Foo ,  Wee Hoo Cheah ,  Vui Yong Liew ,  Selvakumar Raja Gopal ,  Yuen Tat Lee ,  Samie B. Samaan ,  Kip C. Killpack ,  Neil Dobler ,  Nagib Z. Hakim ,  Brian Meyer ,  William H. Penner ,  John L. Baudrexl ,  Russell J. Wunderlich ,  James J. Grealish ,  Kyle Markley ,  Timothy S. Storey ,  Loren J. McConnell ,  Lyle E. Cool ,  Mukesh Kataria ,  Rahima K. Mohammed ,  Tieyu Zheng ,  Yi Amy Xia ,  Ridvan A. Sahan ,  Arun R. Ramadorai ,  Priyadarsan Patra ,  Edwin E. Parks ,  Abhijit Davare ,  Padmakumar Gopal ,  Bruce Querbach ,  Hermann W. Gartler ,  Keith Drescher ,  Sanjay S. Salem ,  David C. Florey

发明人： Mark B. Trobough ,  Keshavan K. Tiruvallur ,  Chinna B. Prudvi ,  Christian E. Iovin ,  David W. Grawrock ,  Jay J. Nejedlo ,  Ashok N. Kabadi ,  Travis K. Goff ,  Evan J. Halprin ,  Kapila B. Udawatta ,  Jiun Long Foo ,  Wee Hoo Cheah ,  Vui Yong Liew ,  Selvakumar Raja Gopal ,  Yuen Tat Lee ,  Samie B. Samaan ,  Kip C. Killpack ,  Neil Dobler ,  Nagib Z. Hakim ,  Brian Meyer ,  William H. Penner ,  John L. Baudrexl ,  Russell J. Wunderlich ,  James J. Grealish ,  Kyle Markley ,  Timothy S. Storey ,  Loren J. McConnell ,  Lyle E. Cool ,  Mukesh Kataria ,  Rahima K. Mohammed ,  Tieyu Zheng ,  Yi Amy Xia ,  Ridvan A. Sahan ,  Arun R. Ramadorai ,  Priyadarsan Patra ,  Edwin E. Parks ,  Abhijit Davare ,  Padmakumar Gopal ,  Bruce Querbach ,  Hermann W. Gartler ,  Keith Drescher ,  Sanjay S. Salem ,  David C. Florey

IPC分类号： G06F11/273 ,  G06F11/267

摘要： An apparatus and method is described herein for providing a test, validation, and debug architecture. At a target or base level, hardware hooks (Design for Test or DFx) are designed into and integrated with silicon parts. A controller may provide abstracted access to such hooks, such as through an abstraction layer that abstracts low level details of the hardware DFx. In addition, the abstraction layer through an interface, such as APIs, provides services, routines, and data structures to higher-level software/presentation layers, which are able to collect test data for validation and debug of a unit/platform under test. Moreover, the architecture potentially provides tiered (multiple levels of) secure access to the test architecture. Additionally, physical access to the test architecture for a platform may be simplified through use of a unified, bi-directional test access port, while also potentially allowing remote access to perform remote test and debug of a part/platform under test. In essence, a complete test architecture stack is described herein for test, validation, and debug of electronic parts, devices, and platforms.

公开(公告)号：US20150127983A1

公开(公告)日：2015-05-07

申请号：US13997182

申请日：2010-12-23

申请人： Mark B. Trobough ,  Keshavan K. Tiruvallur ,  Chinna B. Prudvi ,  Christian E. Iovin ,  David W. Grawrock ,  Jay J. Nejedlo ,  Ashok N. Kabadi ,  Travis K. Goff ,  Evan J. Halprin ,  Kapila B. Udawatta ,  Jiun Long Foo ,  Wee Hoo Cheah ,  Vui Yong Liew ,  Selvakumar Raja Gopal ,  Yuen Tat Lee ,  Samie B. Samaan ,  Kip C. Killpack ,  Neil Dobler ,  Nagib Z. Hakim ,  Briar Meyer ,  William H. Penner ,  John L. Baudrexl ,  Russell J. Wunderlich ,  James J. Grealish ,  Kyle Markley ,  Timothy S. Storey ,  Loren J. McConnell ,  Lyle E. Cool ,  Mukesh Kataria ,  Rahima K. Mohammed ,  Tieyu Zheng ,  Yi Amy Xia ,  Ridvan A. Sahan ,  Arun R. Ramadorai ,  Priyadarsan Patra ,  Edwin E. Parks ,  Abhijit Davare ,  Padmakumar Gopal ,  Bruce Querbach ,  Hermann W. Gartler ,  Keith Drescher ,  Sanjay S. Salem ,  David C. Florey

发明人： Mark B. Trobough ,  Keshavan K. Tiruvallur ,  Chinna B. Prudvi ,  Christian E. Iovin ,  David W. Grawrock ,  Jay J. Nejedlo ,  Ashok N. Kabadi ,  Travis K. Goff ,  Evan J. Halprin ,  Kapila B. Udawatta ,  Jiun Long Foo ,  Wee Hoo Cheah ,  Vui Yong Liew ,  Selvakumar Raja Gopal ,  Yuen Tat Lee ,  Samie B. Samaan ,  Kip C. Killpack ,  Neil Dobler ,  Nagib Z. Hakim ,  Briar Meyer ,  William H. Penner ,  John L. Baudrexl ,  Russell J. Wunderlich ,  James J. Grealish ,  Kyle Markley ,  Timothy S. Storey ,  Loren J. McConnell ,  Lyle E. Cool ,  Mukesh Kataria ,  Rahima K. Mohammed ,  Tieyu Zheng ,  Yi Amy Xia ,  Ridvan A. Sahan ,  Arun R. Ramadorai ,  Priyadarsan Patra ,  Edwin E. Parks ,  Abhijit Davare ,  Padmakumar Gopal ,  Bruce Querbach ,  Hermann W. Gartler ,  Keith Drescher ,  Sanjay S. Salem ,  David C. Florey

IPC分类号： G06F11/273

CPC分类号： G06F11/2733 ,  G06F11/267

摘要： An apparatus and method is described herein for providing a test, validation, and debug architecture. At a target or base level, hardware (Design for Test or DFx) are designed into and integrated with silicon parts. A controller may provide abstracted access to such hooks, such as through an abstraction layer that abstracts low level details of the hardware DFx. In addition, the abstraction layer through an interface, such as APIs, provides services, routines, and data structures to higher-level software/presentation layers, which are able to collect test data for validation and debug of a unit/platform under test. Moreover, the architecture potentially provides tiered (multiple levels of) secure access to the test architecture. Additionally, physical access to the test architecture for a platform may be simplified through use of a unified, bi-directional test access port, while also potentially allowing remote access to perform remote test and de-bug of a part/platform under test. In essence, a complete test architecture stack is described herein for test, validation, and debug of electronic parts, devices, and platforms.

摘要翻译： 这里描述了一种用于提供测试，验证和调试架构的装置和方法。 在目标或基础级别，硬件（测试设计或DFx）被设计并集成在硅部件中。 控制器可以提供对这种钩子的抽象访问，例如通过抽象层来抽象硬件DFx的低级细节。 此外，通过接口（如API）的抽象层向更高级的软件/表示层提供服务，例程和数据结构，这些层能够收集测试数据，以便对被测单元/平台进行验证和调试。 此外，该架构可能提供对测试架构的分层（多级）安全访问。 此外，可以通过使用统一的双向测试访问端口来简化对平台的测试架构的物理访问，同时还可能允许远程访问执行被测部件/平台的远程测试和脱离。 本质上描述了一个完整的测试架构栈，用于电子部件，设备和平台的测试，验证和调试。