摘要:
A plurality of AWG filters with aliasing responses are selected such that the wavelength range of a fundamental response of the AWG filters results in the aliased range of AWG filters to be adjacent to a fundamental range of the AWG filters. A plurality of optical sources is provided sufficient to cover each fundamental wavelength range and each alias wavelength range of the AWG filters. When a single one of the optical sources is enabled, reflected optical energy from a series string of FBGs coupled to the optical source is applied to the plurality of AWG filters, and the AWG output in combination with the wavelength range of the optical source is used to discriminate reflected wavelength from the FBG sensors.
摘要:
A wavelength interrogator is coupled to a circulator which couples optical energy from a broadband source to an optical fiber having a plurality of sensors, each sensor reflecting optical energy at a unique wavelength and directing the reflected optical energy to an AWG. The AWG has a detector coupled to each output, and the reflected optical energy from each grating is coupled to the skirt edge response of the AWG such that the adjacent channel responses form a complementary pair response. The complementary pair response is used to convert an AWG skirt response to a wavelength.
摘要:
An optical power combiner, or splitter, is formed from a first substrate and a second substrate, each substrate having a substantially planar joining surface, at least one substrate having a plurality of waveguide channels formed such as by etching, the plurality of waveguide channels coupled to a waveguide channel combiner having a plurality of waveguide channel apertures, the optical combiner having a single channel aperture on an opposite side from the plurality of waveguide channel apertures, the single channel aperture coupled to a single waveguide channel of zero or greater length, and to an edge opposite the plurality of waveguide channels.
摘要:
A temperature correcting pressure gauge which has a substrate having at least one surface coupled to a source of pressure to be measured, the substrate first surface having a first fiber Bragg grating from a first optical fiber attached in an appropriately sensitive region of the substrate, a fiber Bragg grating from a second optical fiber attached to the opposite surface from the first fiber Bragg grating, the first and second fiber Bragg gratings reflecting or transmitting optical energy of decreasing or increasing wavelength, respectively, in response to an applied pressure. The first and second fiber Bragg gratings have nominal operating wavelength ranges that are adjacent to each other but are exclusive ranges and the fiber Bragg gratings also have closely matched pressure coefficients and temperature coefficients.
摘要:
A thermal protection system (TPS) test plug has optical fibers with FBGs embedded in the optical fiber arranged in a helix, an axial fiber, and a combination of the two. Optionally, one of the optical fibers is a sapphire FBG for measurement of the highest temperatures in the TPS plug. The test plug may include an ablating surface and a non-ablating surface, with an engagement surface with threads formed, the threads having a groove for placement of the optical fiber. The test plug may also include an optical connector positioned at the non-ablating surface for protection of the optical fiber during insertion and removal.
摘要:
Fabrication techniques for polishing fibers engaged in grooves on substrates. A protection template assembly is disclosed to protect the unpolished portions of fibers. Chemical mechanical polishing may be used to achieve high fabrication throughput and high polishing uniformity. Optical monitoring may be used to monitor the polishing in real time.
摘要:
Fabrication techniques for polishing fibers engaged in grooves on substrates. A protection template assembly is disclosed to protect the unpolished portions of fibers. Chemical mechanical polishing may be used to achieve high fabrication throughput and high polishing uniformity. Optical monitoring may be used to monitor the polishing in real time.