Defective pixel signal substitution in thermal imaging systems
    4.
    发明授权
    Defective pixel signal substitution in thermal imaging systems 失效
    热成像系统中的像素信号替代不良

    公开(公告)号:US5532484A

    公开(公告)日:1996-07-02

    申请号:US304001

    申请日:1994-09-09

    CPC分类号: H04N5/367 H04N5/33

    摘要: Thermal imaging system (10) includes a focal plane array (18) having pixels (20). Signals produced by pixels (20) are addressed by integrated circuit substrate (22) and passed to video processor (24). Video processor (24) includes, among other modules, a detection and substitution module (28) that detects defective pixels (21) and substitutes the signals produced by defective pixels (21). The detection and substitution of signals produced by defective pixels (21) may be performed while viewing the thermal scene (12) or while stimulating pixels (20) with a stimulus. A thermal stimulus may be generated by a thermoelectric cooler (50) thermally coupled to integrated circuit substrate (22) and focal plane array (18). An electrical stimulus to identify defective pixels (21) may also be delivered to pixels (20) of focal plane array (18).

    摘要翻译: 热成像系统(10)包括具有像素(20)的焦平面阵列(18)。 由像素(20)产生的信号由集成电路基板(22)寻址并传递到视频处理器(24)。 除了其他模块之外,视频处理器(24)还包括检测和替换由缺陷像素(21)产生的信号的检测和替代模块(28)。 可以在观看热场景(12)的同时或在刺激像素(20)的同时执行由缺陷像素(21)产生的信号的检测和替换。 可以由热耦合到集成电路基板(22)和焦平面阵列(18)的热电冷却器(50)产生热刺激。 用于识别缺陷像素(21)的电刺激也可以被传送到焦平面阵列(18)的像素(20)。

    Infrared detector thermal isolation structure and method
    5.
    发明授权
    Infrared detector thermal isolation structure and method 失效
    红外探测器热隔离结构及方法

    公开(公告)号:US5426304A

    公开(公告)日:1995-06-20

    申请号:US182865

    申请日:1994-01-13

    CPC分类号: H01L37/02

    摘要: In an exemplary thermal imaging system (20, 120, 220 and 320), a thermal isolation structure (50 and 150) is disposed on an integrated circuit substrate (70 and 170) for electrically connecting and mechanically bonding a corresponding focal plane array (30, 130, and 230) of thermal sensors (40, 140, and 240). Each mesa-type structure (52, 54 and 152) includes at least one mesa conductor (56, 58, 156 and 158) that extends from the top of the mesa-type structure (52, 54 and 152) to an adjacent contact pad (72 and 74). The mesa conductors (56, 58, 156 and 158) provide both biasing voltage (V.sub.B) for the respective thermal sensor (40 and 240) and a signal flowpath (V.sub.s) for the respective thermal sensor (40 and 240). The mesa conductors (56, 58, 156 and 158) may be used to provide biasing voltage (V.sub.B) to either a single ferroelectric element (242 and 243) having a void space (277 and 279) or a pair of ferroelectric elements (42 and 44). When the focal plane array (30, 130 and 230) is bonded to the corresponding array of mesa-type structures (52, 54 and 152), a thermally isolated, but electrically conductive path is provided between electrodes (43 and 45) of the thermal sensor (40 and 240) and the corresponding contact pad (72 and 172) of the integrated circuit substrate (70 and 74).

    摘要翻译: 在示例性热成像系统(20,120,220和320)中,热隔离结构(50和150)设置在集成电路衬底(70和170)上,用于电连接和机械地结合相应的焦平面阵列(30 ,130和230)热传感器(40,140和240)。 每个台面型结构(52,54和152)包括从台面型结构(52,54和152)的顶部延伸到相邻接触垫的至少一个台面导体(56,58,156和158) (72和74)。 台面导体(56,58,156和158)为相应的热传感器(40和240)提供偏压(VB)和相应的热传感器(40和240)的信号流路(Vs)。 台面导体(56,58,156和158)可用于向具有空隙空间(277和279)或一对铁电元件(42)的单个铁电元件(242和243)提供偏置电压(VB) 和44)。 当焦平面阵列(30,130和230)被结合到相应的台面型结构(52,54和152)阵列时,热隔离但是导电的路径被提供在电极(43和45)之间 热传感器(40和240)以及集成电路基板(70和74)的相应接触焊盘(72和172)。

    Thermal isolation of monolithic thermal detector
    6.
    发明授权
    Thermal isolation of monolithic thermal detector 失效
    单片热探测器的隔热

    公开(公告)号:US6087661A

    公开(公告)日:2000-07-11

    申请号:US959943

    申请日:1997-10-29

    IPC分类号: G01J5/10 G01J5/20 G01J5/22

    CPC分类号: G01J5/10 G01J5/20

    摘要: A thermal sensor (36, 84, 114) comprising a thermal assembly (44, 88, 118) and a signal flowpath (46, 90, 120). The thermal assembly (44, 88, 118) may comprise a thermally sensitive element (50) and a pair of electrodes (52, 54). The thermally sensitive element (50) may generate a signal representative of an amount of thermal radiation incident to the thermally sensitive element (50). The electrodes (52, 54) may collect the signal generated by the thermally sensitive element (50). The signal flowpath (46, 90, 120) may transmit the signal collected by the electrodes (52, 54) to the substrate (34, 82, 112). The signal flowpath (46, 90, 120) may comprise a pair of arms (56, 58, 92, 122) each extending from an electrode (52, 54) and be connected to the substrate (34, 82, 112). The arms (56, 58, 92, 122) may support the thermal assembly (44, 88, 118) in spaced relation with the substrate (34, 82, 112). The arms (56, 58, 92, 122) may be formed of a thermally insulating material.

    摘要翻译: 包括热组件(44,88,118)和信号流路(46,90,120)的热传感器(36,84,114)。 热组件(44,88,118)可以包括热敏元件(50)和一对电极(52,54)。 热敏元件(50)可以产生表示入射到热敏元件(50)的热辐射量的信号。 电极(52,54)可以收集由热敏元件(50)产生的信号。 信号流路(46,90,120)可以将由电极(52,54)收集的信号传送到基板(34,82,112)。 信号流路(46,90,120)可以包括一对臂(56,58,92,122),每对臂从电极(52,54)延伸并连接到衬底(34,82,112)。 臂(56,58,92,122)可以以与衬底(34,82,112)间隔开的关系支撑热组件(44,48,118)。 臂(56,58,92,122)可以由隔热材料形成。

    Infrared detector local biasing structure and method
    7.
    发明授权
    Infrared detector local biasing structure and method 失效
    红外探测器局部偏置结构及方法

    公开(公告)号:US5436450A

    公开(公告)日:1995-07-25

    申请号:US182268

    申请日:1994-01-13

    CPC分类号: H01L37/02

    摘要: In an exemplary thermal imaging system (20, 120, 220 and 320), a thermal isolation structure (50 and 150) is disposed on an integrated circuit substrate (70 and 170) for electrically connecting and mechanically bonding a focal plane array (30 and 230) of thermal sensors (40 and 240). Each mesa-type structure (52, 54 and 152) includes at least one mesa conductor (56, 58, 156 and 158) that extends from the top of the mesa-type structure (52, 54 and 152) to an adjacent contact pad (72 and 74). The mesa conductors (56, 58, 156 and 158) provide both biasing voltage (V.sub.B) for the respective thermal sensor (40 and 240) and a signal flow path (V.sub.S) for the respective thermal sensor (40 and 240). The mesa conductors (56, 56, 156 and 158) may be used to provide biasing voltage (V.sub.B) to either a single ferroelectric element (242) or a pair of ferroelectric elements (42 and 44). When the focal plane array (30 and 230) is bonded to the corresponding array of mesa-type structures (52, 54 and 152), a thermally isolated, but electrically conductive path is provided between electrodes (43 and 45) of the thermal sensor (40 and 240) and the corresponding contact pad (72 and 172) of the integrated circuit substrate (70 and 74).

    摘要翻译: 在示例性热成像系统(20,120,220和320)中,热隔离结构(50和150)设置在集成电路基板(70和170)上,用于电连接和机械地结合焦平面阵列(30和 230)的热传感器(40和240)。 每个台面型结构(52,54和152)包括从台面型结构(52,54和152)的顶部延伸到相邻接触垫的至少一个台面导体(56,58,156和158) (72和74)。 台面导体(56,58,156和158)为相应的热传感器(40和240)提供偏压(VB)和相应的热传感器(40和240)的信号流路(VS)。 台面导体(56,56,156和158)可用于向单个铁电元件(242)或一对铁电元件(42和44)提供偏置电压(VB)。 当焦平面阵列(30和230)被结合到对应的台面型结构(52,54和152)阵列时,在热传感器的电极(43和45)之间提供热隔离但是导电的路径 (40和240)以及集成电路基板(70和74)的对应的接触垫(72和172)。

    Thermal detector and method
    8.
    发明授权
    Thermal detector and method 失效
    热探测器和方法

    公开(公告)号:US5559332A

    公开(公告)日:1996-09-24

    申请号:US334666

    申请日:1994-11-04

    CPC分类号: H01L27/16 H04N5/33

    摘要: A thermal imaging system (10) for providing an image representative of an amount of thermal radiation incident to the system is provided. The system (10) includes a thermal detector (28 or 30) made from a layer of temperature sensitive material forming a first element of a signal-producing circuit (54). The first element (28 or 30) has either a resistance or capacitance value depending on its temperature. The system (10) also includes an integrated circuit substrate (32) having a second element (56, 58, 62, or 64) of the signal-producing circuit (54) complementary and electrically coupled to the first element (28 or 30). The signal-producing circuit (54) may produce an output signal having a frequency. The frequency of the output signal is monitored as representing an absolute temperature of the detector (28 or 30) so as to determine the amount of thermal energy incident to the system (10).

    摘要翻译: 提供一种用于提供表示入射到系统的热辐射量的图像的热成像系统(10)。 系统(10)包括由形成信号产生电路(54)的第一元件的感温材料层制成的热检测器(28或30)。 第一个元件(28或30)的电阻或电容值取决于其温度。 系统(10)还包括集成电路基板(32),其具有互补且电耦合到第一元件(28或30)的信号产生电路(54)的第二元件(56,58,62或64) 。 信号产生电路(54)可以产生具有频率的输出信号。 监视输出信号的频率,表示检测器(28或30)的绝对温度,以便确定入射到系统(10)的热能的量。

    Microbolometer cell structure
    10.
    发明授权
    Microbolometer cell structure 失效
    微热电池单元结构

    公开(公告)号:US5834776A

    公开(公告)日:1998-11-10

    申请号:US767049

    申请日:1996-12-12

    IPC分类号: G01J5/20 G01J5/34

    CPC分类号: G01J5/20 G01J5/34

    摘要: A pyroelectric detector system and the pyroelectric detector element therefor having an integrated circuit (1) and a pyroelectric detector element (7) coupled to the integrated circuit and thermally isolated from the integrated circuit. The element includes a lead-containing pyroelectric layer having a pair of opposing surfaces and having a thickness to provide a resonant cavity for radiations in a predetermined frequency range. A bottom electrode (5) opaque to radiations in the predetermined frequency range is secured to one of the pair of opposing surfaces and a top electrode (9, 11) is secured to the other of the pair of opposing surfaces which is semi-transparent to radiations in the predetermined frequency range. The top electrode is taken from the group consisting of platinum and nichrome. The lead-containing pyroelectric layer is preferably lead titanate.

    摘要翻译: 热电探测器系统及其热电检测器元件具有集成电路(1)和耦合到集成电路并与集成电路热隔离的热电检测器元件(7)。 元件包括含铅的热电层,其具有一对相对的表面,并且具有厚度以提供用于在预定频率范围内的辐射的谐振腔。 在预定频率范围内对辐射不透明的底部电极(5)固定到一对相对表面中的一个,并且顶部电极(9,11)固定到一对相对表面中的另一个,其是半透明的 在预定频率范围内的辐射。 顶部电极取自铂和镍铬合金组。 含铅的热电层优选为钛酸铅。