FINFET WITH TOP BODY CONTACT
    1.
    发明申请
    FINFET WITH TOP BODY CONTACT 失效
    FINFET与身体接触

    公开(公告)号:US20090001464A1

    公开(公告)日:2009-01-01

    申请号:US11769032

    申请日:2007-06-27

    IPC分类号: H01L29/786

    摘要: FinFETs are provided with a body contact on a top surface of a semiconductor fin. The top body contact may be self-aligned with respect to the semiconductor fin and the source and drain regions. Alternately, the source and drain regions may be formed recessed from the top surface of the semiconductor fin. The body or an extension of the body may be contacted above the channel or above one of the source and drain regions. Electrical shorts between the source and drain and the body contacts are avoided by the recessing of the source and drain regions from the top surface of the semiconductor fin.

    摘要翻译: FinFET在半导体鳍片的顶表面上设有主体接触。 顶部本体接触可以相对于半导体鳍片和源极和漏极区域自对准。 或者,源极和漏极区域可以形成为从半导体鳍片的顶表面凹陷。 主体或身体的延伸部可以在通道上方或者源极和漏极区域之上接触。 通过源极和漏极区域从半导体鳍片的顶表面的凹陷来避免源极和漏极与主体接触之间的电短路。

    FinFET with top body contact
    2.
    发明授权
    FinFET with top body contact 失效
    FinFET与顶体接触

    公开(公告)号:US07550773B2

    公开(公告)日:2009-06-23

    申请号:US11769032

    申请日:2007-06-27

    IPC分类号: H01L29/04 H01L31/036

    摘要: FinFETs are provided with a body contact on a top surface of a semiconductor fin. The top body contact may be self-aligned with respect to the semiconductor fin and the source and drain regions. Alternately, the source and drain regions may be formed recessed from the top surface of the semiconductor fin. The body or an extension of the body may be contacted above the channel or above one of the source and drain regions. Electrical shorts between the source and drain and the body contacts are avoided by the recessing of the source and drain regions from the top surface of the semiconductor fin.

    摘要翻译: FinFET在半导体鳍片的顶表面上设有主体接触。 顶部本体接触可以相对于半导体鳍片和源极和漏极区域自对准。 或者,源极和漏极区域可以形成为从半导体鳍片的顶表面凹陷。 主体或身体的延伸部可以在通道上方或者源极和漏极区域之上接触。 通过源极和漏极区域从半导体鳍片的顶表面的凹陷来避免源极和漏极与主体接触之间的电短路。

    Electrically programmable π-shaped fuse structures and design process therefore
    3.
    发明授权
    Electrically programmable π-shaped fuse structures and design process therefore 失效
    因此电气可编程和形状的熔断器结构和设计过程

    公开(公告)号:US07784009B2

    公开(公告)日:2010-08-24

    申请号:US11923833

    申请日:2007-10-25

    IPC分类号: G06F17/50

    摘要: Electrically programmable fuses for an integrated circuit and design structures thereof are presented, wherein the electrically programmable fuse has a first terminal portion and a second terminal portion interconnected by a fuse element. The first terminal portion and the second terminal portion reside over a first support and a second support, respectively, with the first support and the second support being spaced apart, and the fuse element bridging the distance between the first terminal portion over the first support and the second terminal portion over the second support. The fuse, first support and second support define a π-shaped structure in elevational cross-section through the fuse element. The first terminal portion, second terminal portion and fuse element are coplanar, with the fuse element residing above a void. The design structure for the fuse is embodied in a machine-readable medium for designing, manufacturing or testing a design of the fuse.

    摘要翻译: 提出了用于集成电路的电可编程保险丝及其设计结构,其中电可编程熔丝具有由熔丝元件互连的第一端子部分和第二端子部分。 第一端子部分和第二端子部分分别驻留在第一支撑件和第二支撑件上,第一支撑件和第二支撑件间隔开,并且熔丝元件将第一端子部分之间的距离跨越第一支撑件和 在第二支撑件上方的第二端子部分。 保险丝,第一支撑件和第二支撑件通过保险丝元件在垂直截面中限定了一个“形”结构。 第一端子部分,第二端子部分和熔丝元件是共面的,其中熔丝元件位于空隙之上。 保险丝的设计结构体现在用于设计,制造或测试保险丝设计的机器可读介质中。

    Tunneling effect transistor with self-aligned gate
    4.
    发明授权
    Tunneling effect transistor with self-aligned gate 有权
    具有自对准栅极的隧道效应晶体管

    公开(公告)号:US07700466B2

    公开(公告)日:2010-04-20

    申请号:US11828740

    申请日:2007-07-26

    摘要: In one embodiment, a mandrel and an outer dummy spacer may be employed to form a first conductivity type region. The mandrel is removed to form a recessed region wherein a second conductivity type region is formed. In another embodiment, a mandrel is removed from within shallow trench isolation to form a recessed region, in which an inner dummy spacer is formed. A first conductivity type region and a second conductivity region are formed within the remainder of the recessed region. An anneal is performed so that the first conductivity type region and the second conductivity type region abut each other by diffusion. A gate electrode is formed in self-alignment to the p-n junction between the first and second conductivity regions. The p-n junction controlled by the gate electrode, which may be sublithographic, constitutes an inventive tunneling effect transistor.

    摘要翻译: 在一个实施例中,可以使用心轴和外部虚拟间隔件来形成第一导电类型区域。 去除心轴以形成其中形成第二导电类型区域的凹陷区域。 在另一个实施例中,心轴从浅沟槽隔离中移除以形成凹陷区域,其中形成内部虚拟间隔物。 第一导电类型区域和第二导电区域形成在凹陷区域的其余部分内。 进行退火,使得第一导电类型区域和第二导电类型区域通过扩散彼此邻接。 栅电极形成为与第一和第二导电区域之间的p-n结自对准。 由栅电极控制的可能是亚光刻的p-n结构成本发明的隧道效应晶体管。

    Electrically programmable π-shaped fuse structures and methods of fabrication thereof
    5.
    发明授权
    Electrically programmable π-shaped fuse structures and methods of fabrication thereof 有权
    电气可编程的pi形熔丝结构及其制造方法

    公开(公告)号:US07288804B2

    公开(公告)日:2007-10-30

    申请号:US11372380

    申请日:2006-03-09

    IPC分类号: H01L27/10

    摘要: Electrically programmable fuse structures for an integrated circuit and methods of fabrication thereof are presented, wherein the electrically programmable fuse has a first terminal portion and a second terminal portion interconnected by a fuse element. The first terminal portion and the second terminal portion reside over a first support and a second support, respectively, with the first support and the second support being spaced apart, and the fuse element bridging the distance between the first terminal portion over the first support and the second terminal portion over the second support. The fuse, first support and second support define a α-shaped structure in elevational cross-section through the fuse element. The first terminal portion, second terminal portion and fuse element are coplanar, with the fuse element residing above a void, which in one embodiment is filed by a thermally insulating dielectric material that surrounds the fuse element.

    摘要翻译: 提出了用于集成电路的电可编程熔丝结构及其制造方法,其中电可编程熔丝具有由熔丝元件互连的第一端子部分和第二端子部分。 第一端子部分和第二端子部分分别驻留在第一支撑件和第二支撑件上,第一支撑件和第二支撑件间隔开,并且熔丝元件将第一端子部分之间的距离跨越第一支撑件和 在第二支撑件上方的第二端子部分。 保险丝,第一支撑件和第二支撑件在通过熔断元件的正面横截面中限定了α形结构。 第一端子部分,第二端子部分和熔丝元件是共面的,其中熔丝元件位于空隙上方,在一个实施例中,熔断元件由围绕熔丝元件的绝热介电材料覆盖。

    TRENCH ANTI-FUSE STRUCTURES FOR A PROGRAMMABLE INTEGRATED CIRCUIT
    6.
    发明申请
    TRENCH ANTI-FUSE STRUCTURES FOR A PROGRAMMABLE INTEGRATED CIRCUIT 有权
    用于可编程集成电路的抗融合结构

    公开(公告)号:US20100230781A1

    公开(公告)日:2010-09-16

    申请号:US12537473

    申请日:2009-08-07

    IPC分类号: H01L23/525 H01L21/768

    摘要: Trench anti-fuse structures, design structures embodied in a machine readable medium for designing, manufacturing, or testing a programmable integrated circuit. The anti-fuse structure includes a trench having a plurality of sidewalls that extend into a substrate, a doped region in the semiconductor material of the substrate proximate to the sidewalls of the trench, a conductive plug in the trench, and a dielectric layer on the sidewalls of the trench. The dielectric layer is disposed between the conductive plug and the doped region. The dielectric layer is configured so that a programming voltage applied between the doped region and the conductive plug causes a breakdown of the dielectric layer within a region of the trench. The trench sidewalls are arranged with a cross-sectional geometrical shape that is independent of position between a bottom wall of the deep trench and a top surface of the substrate.

    摘要翻译: 沟槽反熔丝结构,设计结构体现在用于设计,制造或测试可编程集成电路的机器可读介质中。 反熔丝结构包括具有延伸到衬底中的多个侧壁的沟槽,靠近沟槽侧壁的衬底的半导体材料中的掺杂区域,沟槽中的导电插塞以及沟槽中的介电层 沟槽的侧壁。 电介质层设置在导电插塞和掺杂区域之间。 电介质层被配置为使得施加在掺杂区域和导电插塞之间的编程电压导致沟槽区域内的电介质层的击穿。 沟槽侧壁布置成具有与深沟槽的底壁和基板的顶表面之间的位置无关的横截面几何形状。

    Electrically programmable π-shaped fuse structures and methods of fabrication thereof
    7.
    发明授权
    Electrically programmable π-shaped fuse structures and methods of fabrication thereof 失效
    电气可编程的pi形熔丝结构及其制造方法

    公开(公告)号:US07656005B2

    公开(公告)日:2010-02-02

    申请号:US11768254

    申请日:2007-06-26

    IPC分类号: H01L29/00

    摘要: Electrically programmable fuse structures for an integrated circuit and methods of fabrication thereof are presented, wherein the electrically programmable fuse has a first terminal portion and a second terminal portion interconnected by a fuse element. The first terminal portion and the second terminal portion reside over a first support and a second support, respectively, with the first support and the second support being spaced apart, and the fuse element bridging the distance between the first terminal portion over the first support and the second terminal portion over the second support. The fuse, first support and second support define a π-shaped structure in elevational cross-section through the fuse element. The first terminal portion, second terminal portion and fuse element are coplanar, with the fuse element residing above a void, which in one embodiment is filed by a thermally insulating dielectric material that surrounds the fuse element.

    摘要翻译: 提出了用于集成电路的电可编程熔丝结构及其制造方法,其中电可编程熔丝具有由熔丝元件互连的第一端子部分和第二端子部分。 第一端子部分和第二端子部分分别驻留在第一支撑件和第二支撑件上,第一支撑件和第二支撑件间隔开,并且熔丝元件将第一端子部分之间的距离跨越第一支撑件和 在第二支撑件上方的第二端子部分。 保险丝,第一支撑件和第二支撑件通过保险丝元件在垂直截面中限定了一个pi形结构。 第一端子部分,第二端子部分和熔丝元件是共面的,其中熔丝元件位于空隙上方,在一个实施例中,熔断元件由围绕熔丝元件的绝热介电材料覆盖。

    Trench anti-fuse structures for a programmable integrated circuit
    8.
    发明授权
    Trench anti-fuse structures for a programmable integrated circuit 有权
    用于可编程集成电路的沟槽反熔丝结构

    公开(公告)号:US07977766B2

    公开(公告)日:2011-07-12

    申请号:US12537473

    申请日:2009-08-07

    IPC分类号: H01L21/00 H01L23/535

    摘要: Trench anti-fuse structures, design structures embodied in a machine readable medium for designing, manufacturing, or testing a programmable integrated circuit. The anti-fuse structure includes a trench having a plurality of sidewalls that extend into a substrate, a doped region in the semiconductor material of the substrate proximate to the sidewalls of the trench, a conductive plug in the trench, and a dielectric layer on the sidewalls of the trench. The dielectric layer is disposed between the conductive plug and the doped region. The dielectric layer is configured so that a programming voltage applied between the doped region and the conductive plug causes a breakdown of the dielectric layer within a region of the trench. The trench sidewalls are arranged with a cross-sectional geometrical shape that is independent of position between a bottom wall of the deep trench and a top surface of the substrate.

    摘要翻译: 沟槽反熔丝结构,设计结构体现在用于设计,制造或测试可编程集成电路的机器可读介质中。 反熔丝结构包括具有延伸到衬底中的多个侧壁的沟槽,靠近沟槽侧壁的衬底的半导体材料中的掺杂区域,沟槽中的导电插塞以及沟槽中的介电层 沟槽的侧壁。 电介质层设置在导电插塞和掺杂区域之间。 电介质层被配置为使得施加在掺杂区域和导电插塞之间的编程电压导致沟槽区域内的电介质层的击穿。 沟槽侧壁布置成具有与深沟槽的底壁和基板的顶表面之间的位置无关的横截面几何形状。

    TUNNELING EFFECT TRANSISTOR WITH SELF-ALIGNED GATE
    9.
    发明申请
    TUNNELING EFFECT TRANSISTOR WITH SELF-ALIGNED GATE 有权
    具有自对准门的隧道效应晶体管

    公开(公告)号:US20090026491A1

    公开(公告)日:2009-01-29

    申请号:US11828740

    申请日:2007-07-26

    IPC分类号: H01L29/70 H01L21/33

    摘要: In one embodiment, a mandrel and an outer dummy spacer may be employed to form a first conductivity type region. The mandrel is removed to form a recessed region wherein a second conductivity type region is formed. In another embodiment, a mandrel is removed from within shallow trench isolation to form a recessed region, in which an inner dummy spacer is formed. A first conductivity type region and a second conductivity region are formed within the remainder of the recessed region. An anneal is performed so that the first conductivity type region and the second conductivity type region abut each other by diffusion. A gate electrode is formed in self-alignment to the p-n junction between the first and second conductivity regions. The p-n junction controlled by the gate electrode, which may be sublithographic, constitutes an inventive tunneling effect transistor.

    摘要翻译: 在一个实施例中,可以使用心轴和外部虚拟间隔件来形成第一导电类型区域。 去除心轴以形成其中形成第二导电类型区域的凹陷区域。 在另一个实施例中,心轴从浅沟槽隔离中移除以形成凹陷区域,其中形成内部虚拟间隔物。 第一导电类型区域和第二导电区域形成在凹陷区域的其余部分内。 进行退火,使得第一导电类型区域和第二导电类型区域通过扩散彼此邻接。 栅电极形成为与第一和第二导电区域之间的p-n结自对准。 由栅电极控制的可能是亚光刻的p-n结构成本发明的隧道效应晶体管。

    Self-aligned devices and methods of manufacture
    10.
    发明授权
    Self-aligned devices and methods of manufacture 失效
    自对准装置和制造方法

    公开(公告)号:US08691697B2

    公开(公告)日:2014-04-08

    申请号:US12943956

    申请日:2010-11-11

    IPC分类号: H01L21/302 B44C1/22

    摘要: A method includes forming patterned lines on a substrate having a predetermined pitch. The method further includes forming spacer sidewalls on sidewalls of the patterned lines. The method further includes forming material in a space between the spacer sidewalls of adjacent patterned lines. The method further includes forming another patterned line from the material by protecting the material in the space between the spacer sidewalls of adjacent patterned lines while removing the spacer sidewalls. The method further includes transferring a pattern of the patterned lines and the another patterned line to the substrate.

    摘要翻译: 一种方法包括在具有预定间距的基底上形成图案线。 该方法还包括在图案化线的侧壁上形成间隔壁。 该方法还包括在相邻图案线的间隔壁侧壁之间的空间中形成材料。 该方法还包括通过在相邻图案化线的间隔壁侧壁之间的空间中保护材料同时去除间隔壁侧壁而从该材料形成另一图案化线。 该方法还包括将图案化线和另一图案化线的图案转移到衬底。