摘要:
A detection system. The detection system includes a substrate, a laser, and a sensor array. The substrate includes a first surface, a second surface conceptually divided into multiple areas, and a third surface. The laser is configured to emit electromagnetic radiation into the substrate and incident subsequently onto second surface areas. The sensor array is configured to capture electromagnetic radiation reflected from the second surface. If a first dielectric, having first dielectric constant, is in contact with some areas, electromagnetic radiation incident thereon experiences total internal reflection and if a second dielectric having second dielectric constant is in contact with other areas, some of the electromagnetic radiation incident thereon is reflected back into the substrate by the second dielectric. The sensor array is configured to detect laser speckle originating from the incidence of the electromagnetic radiation at the second surface and to detect electromagnetic radiation reflected from the second dielectric.
摘要:
A position detection system. In representative embodiments, the position detection system comprises a support structure having a cavity, a first light source configured to emit light into at least part of the cavity, a second light source configured to emit light into at least part of the cavity, a first image sensor configured to capture at least part of the light emitted into the cavity by the first and second light sources, an article moveable relative to the support structure, a protuberance attached to the article, and a computation circuit configured to receive a signal from the first image sensor. Movement of the support structure moves the protuberance within the cavity. The computation circuit is configured to compute the location of the protuberance from shadows cast by the protuberance onto the first image sensor.
摘要:
A projection optical system for digital lithography. The system includes an Offner imaging system defining an optical axis and having a well-corrected region. The system also includes spatial light modulators circumferentially arranged about the optical axis, such that optical beams emitted thereby propagate through the Offner imaging system within the well-corrected region.
摘要:
A projection optical system for digital lithography includes an Offner imaging system with a defined optical axis. The Offner imaging system has a well-corrected region. The system includes means for shaping an optical beam having an extent too large to fit within the well-corrected region to propagate through the Offner imaging system within the well-corrected region.
摘要:
A portable device includes a transparent surface; a microlens array having lenslets, each lenslet forming a corresponding image of an object using light received through the transparent surface; a light sensor having pixels, each pixel corresponding uniquely to one of the plurality of lenslets, to detect the formed images of the object; and a controller to use the detected images to determine a motion of the object relative to the transparent surface, and to output the detected motion to a display for use in navigating a cursor and/or a menu on the display according to the determined motion. The portable device can be used in a telephone, personal digital assistant, and/or other handheld devices which control navigation on a display included in the device or external to the device.
摘要:
A surface plasmon resonance sensor includes a conducting grating having an effective periodicity that varies with an azimuthal angle of a light ray incident on the conducting grating, thereby varying a surface plasmon resonance condition.
摘要:
This disclosure provides systems, methods and apparatus for measuring the direction distribution of light. In some implementations, an ambient light direction distribution sensor device can include, for example, a light steering layer that is designed to steer light from different incident angles toward associated locations on a light detector. The light detector can then output one or more signals that are indicative of the amount of light that is incident upon the sensor device from different incident angles. These measurements can be used to control various parameters of a display in response to the detected ambient lighting conditions.
摘要:
Modulator devices are selectably adjustable between at least two states, wherein the transmission and/or reflection of particular wavelengths of light are modified. Certain modulator devices are substantially uniformly adjustable over a wide range of wavelengths, including visible and infrared wavelengths. Other modulator devices are adjustable over visible wavelengths without significantly affecting infrared wavelengths. In addition, the modulator devices may be used in conjunction with fixed thin film reflective structures.
摘要:
One embodiment of the invention is a user input system for a hand held computing device that comprises a movable piece with a reflective side, an optical cavity adjacent to said movable piece, a light emitting source positioned within the cavity such that emitted light is incident on to the reflective side of the movable piece, and a sensor positioned within the cavity to receive light reflected from the reflective side.
摘要:
Tunable cross-coupling evanescent mode optical devices and methods of making the same are described. In one aspect, a tunable optical device includes a first layer, a second layer, a metal layer disposed between the first and second layers, and an electrode. The first layer is supportable of electromagnetic field modes over a range of wavelengths that includes a target wavelength range. The second layer is disposed between the metal layer and the electrode and has an index of refraction that is adjustable over a range of values. The metal layer is disposed between the first and second layers and has at least one corrugated metal film region with a corrugation periodicity enabling cross-coupling of evanescent modes of equal wavelength within the target wavelength range and localized on opposite sides of the metal layer with different respective wavenumbers. The cross-coupling evanescent modes have a cross-coupling wavelength determined at least in part by the corrugation periodicity and the index of refraction of the first and second layers and is substantially unaffected by the electrode.