SRAM INCLUDING REFERENCE VOLTAGE GENERATOR AND READ METHOD THEREOF

    公开(公告)号:US20240071479A1

    公开(公告)日:2024-02-29

    申请号:US18347852

    申请日:2023-07-06

    CPC classification number: G11C11/4099 G11C11/4091 G11C11/4094

    Abstract: A static random access memory includes a memory cell that stores data, a reference voltage generator that generates a reference voltage, a precharge circuit that is connected with the memory cell through a bit line, is connected with the reference voltage generator through a reference bit line, and pre-charges the bit line and the reference bit line, and a sense amplifier that is connected with the bit line and the reference bit line, compares a voltage of the bit line and a voltage of the reference bit line to generate a comparison result, and determines a value of the data stored in the memory cell based on the comparison result. The reference voltage generator includes first-type transistors.

    SEMICONDUCTOR PACKAGES
    3.
    发明申请

    公开(公告)号:US20210305114A1

    公开(公告)日:2021-09-30

    申请号:US17087879

    申请日:2020-11-03

    Abstract: A semiconductor package may include a base, a first chip on the base, and first connection patterns that connect and couple the base and the first chip. The first chip may include a substrate, pad patterns on the substrate, a passivation layer on the substrate and having openings, and pillars on the substrate, the pad patterns include a first signal pad and a second signal pad, the first connection patterns are in contact with the pillars, the pillars include a first signal pillar in contact with the first signal pad and a second signal pillar in contact with the second signal pad, the openings in the passivation layer include a first opening having a sidewall facing a side surface of the first signal pillar and surrounding the side surface of the first signal pillar, and a second opening having a sidewall facing a side surface of the second signal pillar and surrounding the side surface of the second signal pillar, and a maximum width of the second opening is greater than a maximum width of the first opening.

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