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    DATA TRANSMISSION METHOD AND ELECTRONIC DEVICE FOR SUPPORTING THE SAME
    2.
    发明申请
    DATA TRANSMISSION METHOD AND ELECTRONIC DEVICE FOR SUPPORTING THE SAME 审中-公开

    公开(公告)号：US20180131664A1

    公开(公告)日：2018-05-10

    申请号：US15810727

    申请日：2017-11-13

    Applicant: Samsung Electronics Co., Ltd.

    Inventor： Sung Eun KIM ,  Dong Jae Shin ,  Yo Han Lee ,  Doo Suk Kang ,  Yong Joon Jeon ,  Eun Jung Hyun

    IPC: H04L12/58

    Abstract: An electronic device includes a display, a communication interface, a processor electrically connected with the display and the communication interface, and a memory electrically connected with the processor. The memory stores instructions that cause the processor to execute a message transmission application configured to transmit or receive data through a first communication mode, select at least one message thread from a list of messages transmitted and received in the message transmission application, and establish a channel according to a second communication mode with an external electronic device based on identification information of the external electronic device associated with the selected message thread.

    Test system and method for wafer including optical component
    3.
    发明授权
    Test system and method for wafer including optical component 有权
    包括光学元件的晶片测试系统和方法

    公开(公告)号：US09297849B2

    公开(公告)日：2016-03-29

    申请号：US14159828

    申请日：2014-01-21

    Applicant: SAMSUNG ELECTRONICS CO., LTD.

    Inventor： Dong Jae Shin ,  Yoon Dong Park ,  Sang Hun Choi ,  Kyoung Ho Ha

    IPC: G02B6/30 ,  G01R31/26

    CPC classification number: G01R31/2601

    Abstract: A wafer test system includes an input device configured to transmit a test signal, a wafer including an optical port, an input port configured to receive the test signal, and an output port configured to output a result signal based on the test signal, a measuring device configured to measure the result signal, and an alignment device configured to align an optical fiber port of an optical probe with an alignment port based on the result signal and then align the optical fiber port with the optical port. The alignment port is the input port or the output port. The optical probe is configured to be the input device when the input port is the alignment port and the optical probe is configured to be the measuring device when the output port is the alignment port.

    Abstract translation: 晶片测试系统包括被配置为传输测试信号的输入设备，包括光学端口的晶片，被配置为接收测试信号的输入端口以及被配置为基于测试信号输出结果信号的输出端口，测量 被配置为测量结果信号的装置，以及基于结果信号将光学探针的光纤端口与对准端口对准的对准装置，然后使光纤端口与光学端口对准。 对齐端口是输入端口或输出端口。 当输出端口为对准端口时，光电探头被配置为输入设备，并且光学探头被配置为测量设备。

    MEMORY CONTROLLER, MEMORY SYSTEM INCLUDING THE SAME, AND ELECTRONIC DEVICE INCLUDING THE MEMORY SYSTEM
    4.
    发明申请
    MEMORY CONTROLLER, MEMORY SYSTEM INCLUDING THE SAME, AND ELECTRONIC DEVICE INCLUDING THE MEMORY SYSTEM 有权
    存储器控制器，包括其的存储器系统以及包括存储器系统的电子设备

    公开(公告)号：US20160099781A1

    公开(公告)日：2016-04-07

    申请号：US14791356

    申请日：2015-07-03

    Applicant: Samsung Electronics Co., Ltd.

    Inventor： Hyunil Byun ,  In Sung Joe ,  Dong Jae Shin

    IPC: H04B10/548 ,  H04B10/67 ,  G06F3/06 ,  H04B10/556

    CPC classification number: G11C7/1081 ,  G11C7/1054

    Abstract: A memory system in accordance with an embodiment of the inventive concept includes a memory controller comprising a controller optical transmission unit photoelectrically-converting a data signal to output a first optical modulation signal and a second optical modulation signal, a first memory device which is optically connected with the memory controller to receive the first optical modulation signal, and a second memory device which is optically connected with the memory controller to receive the second optical modulation signal. The first optical modulation signal and the second optical modulation signal are complementary to each other.

    Abstract translation: 根据本发明构思的实施例的存储器系统包括存储器控制器，其包括光电转换数据信号以输出第一光调制信号和第二光调制信号的控制器光传输单元，光学连接的第一存储器件 存储器控制器接收第一光调制信号，以及与存储器控制器光学连接以接收第二光调制信号的第二存储器件。 第一光调制信号和第二光调制信号彼此互补。

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