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公开(公告)号：US08866187B2
公开(公告)日：2014-10-21
申请号：US13650947
申请日：2012-10-12
Applicant: Samsung Electronics Co., Ltd.
Inventor： Kyoung Won Na , Pil-Kyu Kang , Seong Gu Kim , Yong Hwack Shin , Ho-Chul Ji , Jung Hyung Pyo , Kyoung Ho Ha
IPC: H01L31/102 , H01L31/0232 , H01L31/18 , G02B6/12 , H01L31/103 , G02B6/132 , G02B6/136
CPC classification number: H01L31/02327 , G02B6/12004 , G02B6/132 , G02B6/136 , G02B6/30 , G02B6/305 , H01L31/103 , H01L31/1804 , H01L31/1808 , Y02E10/547 , Y02P70/521
Abstract: A photodetector structure can include a silicon substrate and a silicon layer on the silicon substrate, that can include a first portion of an optical transmission medium that further includes a silicon cross-sectional transmission face. A germanium layer can be on the silicon substrate and can include a second portion of the optical transmission medium, adjacent to the first portion can include a germanium cross-sectional transmission face butt-coupled to the silicon cross-sectional transmission face.
Abstract translation: 光电检测器结构可以包括硅衬底和硅衬底上的硅层，其可以包括进一步包括硅横截面透射面的光传输介质的第一部分。 锗层可以在硅衬底上，并且可以包括光传输介质的第二部分，邻近第一部分可以包括与硅横截面透射面对接的锗横截面透射面。
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Patent Agency Ranking
公开(公告)号：US09297849B2
公开(公告)日：2016-03-29
申请号：US14159828
申请日：2014-01-21
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Dong Jae Shin , Yoon Dong Park , Sang Hun Choi , Kyoung Ho Ha
CPC classification number: G01R31/2601
Abstract: A wafer test system includes an input device configured to transmit a test signal, a wafer including an optical port, an input port configured to receive the test signal, and an output port configured to output a result signal based on the test signal, a measuring device configured to measure the result signal, and an alignment device configured to align an optical fiber port of an optical probe with an alignment port based on the result signal and then align the optical fiber port with the optical port. The alignment port is the input port or the output port. The optical probe is configured to be the input device when the input port is the alignment port and the optical probe is configured to be the measuring device when the output port is the alignment port.
Abstract translation: 晶片测试系统包括被配置为传输测试信号的输入设备，包括光学端口的晶片，被配置为接收测试信号的输入端口以及被配置为基于测试信号输出结果信号的输出端口，测量 被配置为测量结果信号的装置，以及基于结果信号将光学探针的光纤端口与对准端口对准的对准装置，然后使光纤端口与光学端口对准。 对齐端口是输入端口或输出端口。 当输出端口为对准端口时，光电探头被配置为输入设备，并且光学探头被配置为测量设备。
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公开(公告)号：US20140203830A1
公开(公告)日：2014-07-24
申请号：US14159828
申请日：2014-01-21
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： DONG JAE SHIN , Yoon Dong Park , Sang Hun Choi , Kyoung Ho Ha
IPC: G01R31/26
CPC classification number: G01R31/2601
Abstract: A wafer test system includes an input device configured to transmit a test signal, a wafer including an optical port, an input port configured to receive the test signal, and an output port configured to output a result signal based on the test signal, a measuring device configured to measure the result signal, and an alignment device configured to align an optical fiber port of an optical probe with an alignment port based on the result signal and then align the optical fiber port with the optical port. The alignment port is the input port or the output port. The optical probe is configured to be the input device when the input port is the alignment port and the optical probe is configured to be the measuring device when the output port is the alignment port.
Abstract translation: 晶片测试系统包括被配置为传输测试信号的输入设备，包括光学端口的晶片，被配置为接收测试信号的输入端口以及被配置为基于测试信号输出结果信号的输出端口，测量 被配置为测量结果信号的装置，以及基于结果信号将光学探针的光纤端口与对准端口对准的对准装置，然后使光纤端口与光学端口对准。 对齐端口是输入端口或输出端口。 当输出端口为对准端口时，光电探头被配置为输入设备，并且光学探头被配置为测量设备。
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公开(公告)号：US11099455B2
公开(公告)日：2021-08-24
申请号：US16042135
申请日：2018-07-23
Applicant: Samsung Electronics Co., Ltd.
Inventor： Dong Jae Shin , Seong Gu Kim , Yong Hwack Shin , Chang Gyun Shin , Dong Sik Shim , Chang Bum Lee , Jung Ho Cha , Kyoung Ho Ha
Abstract: An optical beam steering device may include a tunable laser diode configured to emit laser beams and an antenna that includes a grating structure and is configured to convert the laser beams to a linear light source based on the grating structure. The tunable laser diode may emit a first laser beam having a first wavelength, and emit a second laser beam having a second wavelength, the second wavelength different from the first wavelength. The antenna may receive the first laser beam and, in response, output a first linear light source having a first emission angle with a surface of the antenna. The antenna may further receive the second laser beam and, in response, output a second linear light source having a second emission angle with the surface of the antenna, the second emission angle different from the first angle.
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公开(公告)号：US20130092980A1
公开(公告)日：2013-04-18
申请号：US13650947
申请日：2012-10-12
Applicant: Samsung Electronics Co., Ltd.
Inventor： Kyoung Won Na , Pil-Kyu Kang , Seong Gu Kim , Yong Hwack Shin , Ho-Chul Ji , Jung Hyung Pyo , Kyoung Ho Ha
IPC: H01L31/0352
CPC classification number: H01L31/02327 , G02B6/12004 , G02B6/132 , G02B6/136 , G02B6/30 , G02B6/305 , H01L31/103 , H01L31/1804 , H01L31/1808 , Y02E10/547 , Y02P70/521
Abstract: A photodetector structure can include a silicon substrate and a silicon layer on the silicon substrate, that can include a first portion of an optical transmission medium that further includes a silicon cross-sectional transmission face. A germanium layer can be on the silicon substrate and can include a second portion of the optical transmission medium, adjacent to the first portion can include a germanium cross-sectional transmission face butt-coupled to the silicon cross-sectional transmission face.
Abstract translation: 光电检测器结构可以包括硅衬底和硅衬底上的硅层，其可以包括进一步包括硅横截面透射面的光传输介质的第一部分。 锗层可以在硅衬底上，并且可以包括光传输介质的第二部分，邻近第一部分可以包括与硅横截面透射面对接的锗横截面透射面。
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公开(公告)号：US11733583B2
公开(公告)日：2023-08-22
申请号：US17380304
申请日：2021-07-20
Applicant: Samsung Electronics Co., Ltd.
Inventor： Dong Jae Shin , Seong Gu Kim , Yong Hwack Shin , Chang Gyun Shin , Dong Sik Shim , Chang Bum Lee , Jung Ho Cha , Kyoung Ho Ha
CPC classification number: G02F1/292 , G01S7/4804 , G01S7/4812 , G01S7/4817 , G02B26/08 , G02F2203/24
Abstract: An optical beam steering device may include a tunable laser diode configured to emit laser beams and an antenna that includes a grating structure and is configured to convert the laser beams to a linear light source based on the grating structure. The tunable laser diode may emit a first laser beam having a first wavelength, and emit a second laser beam having a second wavelength, the second wavelength different from the first wavelength. The antenna may receive the first laser beam and, in response, output a first linear light source having a first emission angle with a surface of the antenna. The antenna may further receive the second laser beam and, in response, output a second linear light source having a second emission angle with the surface of the antenna, the second emission angle different from the first angle.
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