OPTICAL COMMUNICATION APPARATUS AND PCB INCLUDING OPTICAL INTERFACE FOR REALIZING CONCURRENT READ AND WRITE OPERATIONS
    3.
    发明申请
    OPTICAL COMMUNICATION APPARATUS AND PCB INCLUDING OPTICAL INTERFACE FOR REALIZING CONCURRENT READ AND WRITE OPERATIONS 审中-公开
    光通信设备和PCB,包括用于实现同时读和写操作的光接口

    公开(公告)号:US20140270758A1

    公开(公告)日:2014-09-18

    申请号:US14211040

    申请日:2014-03-14

    CPC classification number: H04L5/14 H04J14/06

    Abstract: An optical communication apparatus and printed circuit board (PCB), which include an optical interface for realizing concurrent read and write operations, and a data processing system including a memory module and the PCB are provided. The optical communication apparatus includes an optical interface unit configured to output optical signal of first data and receive optical signal of second data simultaneously, and an optical bus configured to transmit the optical signals between the first optical interface unit and a second optical interface unit, the second optical interface unit being configured to receive the optical signal of the first data and output the optical signal of the second data simultaneously. The optical signal of the first data and the optical signal of the second data have polarizations, respectively, orthogonal to each other.

    Abstract translation: 提供了一种光通信装置和印刷电路板(PCB),其包括用于实现并行读写操作的光接口,以及包括存储器模块和PCB的数据处理系统。 光通信装置包括:光接口单元,被配置为同时输出第一数据的光信号并接收第二数据的光信号;以及光总线,被配置为在第一光接口单元和第二光接口单元之间传输光信号, 第二光接口单元被配置为接收第一数据的光信号并同时输出第二数据的光信号。 第一数据的光信号和第二数据的光信号分别具有彼此正交的极化。

    Test system and method for wafer including optical component
    4.
    发明授权
    Test system and method for wafer including optical component 有权
    包括光学元件的晶片测试系统和方法

    公开(公告)号:US09297849B2

    公开(公告)日:2016-03-29

    申请号:US14159828

    申请日:2014-01-21

    CPC classification number: G01R31/2601

    Abstract: A wafer test system includes an input device configured to transmit a test signal, a wafer including an optical port, an input port configured to receive the test signal, and an output port configured to output a result signal based on the test signal, a measuring device configured to measure the result signal, and an alignment device configured to align an optical fiber port of an optical probe with an alignment port based on the result signal and then align the optical fiber port with the optical port. The alignment port is the input port or the output port. The optical probe is configured to be the input device when the input port is the alignment port and the optical probe is configured to be the measuring device when the output port is the alignment port.

    Abstract translation: 晶片测试系统包括被配置为传输测试信号的输入设备,包括光学端口的晶片,被配置为接收测试信号的输入端口以及被配置为基于测试信号输出结果信号的输出端口,测量 被配置为测量结果信号的装置,以及基于结果信号将光学探针的光纤端口与对准端口对准的对准装置,然后使光纤端口与光学端口对准。 对齐端口是输入端口或输出端口。 当输出端口为对准端口时,光电探头被配置为输入设备,并且光学探头被配置为测量设备。

    TEST SYSTEM AND METHOD FOR WAFER INCLUDING OPTICAL COMPONENT
    6.
    发明申请
    TEST SYSTEM AND METHOD FOR WAFER INCLUDING OPTICAL COMPONENT 有权
    包括光学元件的波形测试系统和方法

    公开(公告)号:US20140203830A1

    公开(公告)日:2014-07-24

    申请号:US14159828

    申请日:2014-01-21

    CPC classification number: G01R31/2601

    Abstract: A wafer test system includes an input device configured to transmit a test signal, a wafer including an optical port, an input port configured to receive the test signal, and an output port configured to output a result signal based on the test signal, a measuring device configured to measure the result signal, and an alignment device configured to align an optical fiber port of an optical probe with an alignment port based on the result signal and then align the optical fiber port with the optical port. The alignment port is the input port or the output port. The optical probe is configured to be the input device when the input port is the alignment port and the optical probe is configured to be the measuring device when the output port is the alignment port.

    Abstract translation: 晶片测试系统包括被配置为传输测试信号的输入设备,包括光学端口的晶片,被配置为接收测试信号的输入端口以及被配置为基于测试信号输出结果信号的输出端口,测量 被配置为测量结果信号的装置,以及基于结果信号将光学探针的光纤端口与对准端口对准的对准装置,然后使光纤端口与光学端口对准。 对齐端口是输入端口或输出端口。 当输出端口为对准端口时,光电探头被配置为输入设备,并且光学探头被配置为测量设备。

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