SEMICONDUCTOR MEMORY DEVICE AND METHOD OF FABRICATING THE SAME

    公开(公告)号:US20240074154A1

    公开(公告)日:2024-02-29

    申请号:US18126395

    申请日:2023-03-25

    CPC classification number: H10B12/34 H10B12/053 H10B12/09 H10B12/315 H10B12/50

    Abstract: A semiconductor memory may include a substrate, a buried dielectric layer on the substrate and providing a first recess that extends in a first direction, a word line in the first recess of the buried dielectric layer, first and second source/drain patterns on opposite sides of the word line, a channel pattern between the word line and the first recess of the buried dielectric layer and contacting the first and second source/drain patterns, and a bit line electrically connected to the second source/drain pattern and extending in a second direction that intersects the first direction. The channel pattern includes vertical parts and a horizontal part connected to each other. The vertical parts are on opposite lateral surfaces of the word line. The horizontal part is below the word line.

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