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公开(公告)号:US20200066662A1
公开(公告)日:2020-02-27
申请号:US16281819
申请日:2019-02-21
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Yong Koon LEE , Jin Su KIM
IPC: H01L23/66 , H01L23/552 , H01L23/538 , H01L23/495 , H01Q1/22
Abstract: A semiconductor package includes a frame having a first through-hole, a semiconductor chip having an active surface on which a connection pad is disposed; a first encapsulant encapsulating at least a portion of the semiconductor chip; a second encapsulant disposed on at least a portion of the external side surface of the frame, and a connection member disposed on the active surface of the semiconductor chip and including a redistribution layer electrically connected to the connection pad of the semiconductor chip. The frame includes an insulating layer, a wiring layer disposed on upper and lower surfaces of the insulating layer, a first metal layer on the external side wall of the insulating layer, a second metal layer on the internal side wall of the first through hole, and a via penetrating the upper and lower surfaces of the insulating layer.
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公开(公告)号:US20210313276A1
公开(公告)日:2021-10-07
申请号:US17353074
申请日:2021-06-21
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Yong Koon LEE , Myung Sam KANG , Young Gwan KO , Young Chan KO , Chang Bae LEE
IPC: H01L23/538 , H01L23/31 , H01L23/00 , H01L25/16 , H01L23/66 , H01L21/48 , H01L23/552 , H01Q1/38 , H01L23/13
Abstract: A method including forming a frame having an opening, forming a first metal layer, forming a first encapsulant, forming an insulation layer on the first metal layer, forming a first through-hole and a second through-hole penetrating the insulation layer and the first encapsulant, forming a second metal layer and a third metal layer, forming a second encapsulant, forming a first metal via and a second metal via penetrating the second encapsulant and a metal pattern layer on the second encapsulant, and forming a connection structure. The first metal layer and the second metal layer respectively are formed to extend to a surface of each of the first encapsulant and the frame, facing the metal pattern layer, and the first metal layer and the second metal layer are connected to the metal pattern layer through the first metal via and the second metal via having heights different from each other.
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公开(公告)号:US20200035607A1
公开(公告)日:2020-01-30
申请号:US16282638
申请日:2019-02-22
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Yong Koon LEE , Jin Su KIM
IPC: H01L23/538 , H01L23/00 , H01L23/31 , H01L23/522 , H01L25/065
Abstract: A semiconductor package and an antenna module including the same includes a frame having first and second through-holes, a semiconductor chip disposed in the first through-hole of the frame and having an active surface on which a connection pad is disposed and an inactive surface disposed on an opposite side of the active surface, a wiring chip disposed in the second through-hole of the frame and including a body portion and a plurality of through vias penetrating the body portion, an encapsulant encapsulating at least portions of the semiconductor chip and the wiring chip, and a connection member disposed on the active surface of the semiconductor chip and including a redistribution layer electrically connected to the connection pad of the semiconductor chip and the through via of the wiring chip.
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公开(公告)号:US20230260919A1
公开(公告)日:2023-08-17
申请号:US18141568
申请日:2023-05-01
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Yong Koon LEE , Myung Sam KANG , Young Gwan KO , Young Chan KO , Chang Bae LEE
IPC: H01L23/538 , H01L23/31 , H01L23/00 , H01L25/16 , H01L23/66 , H01L21/48 , H01L23/552 , H01Q1/38 , H01L23/13
CPC classification number: H01L23/5389 , H01L23/3128 , H01L24/05 , H01L23/3135 , H01L24/24 , H01L23/5386 , H01L25/16 , H01L23/66 , H01L24/19 , H01L21/486 , H01L24/82 , H01L21/4857 , H01L21/4853 , H01L23/552 , H01Q1/38 , H01L23/13 , H01L2924/3025 , H01L2223/6677 , H01L2223/6616 , H01L2924/1421 , H01L2924/19041 , H01L2924/19042 , H01L2924/19105 , H01L2224/24137 , H01L2224/24195 , H01L2224/82101
Abstract: A semiconductor package including a core structure, in which a first and second semiconductor chips and passive components are embedded, a connection structure disposed on a first side of the core structure, and including a redistribution layer electrically connected to the first and second semiconductor chips and the passive components, and a metal pattern layer and a backside wiring layer disposed on a second side of the core structure opposing the first side, and spaced apart from each other. The core structure includes a first metal layer surrounding the first semiconductor chip, a second metal layer surrounding the first semiconductor chip, and the first metal layer, a third metal layer surrounding the second semiconductor chip, and a fourth metal layer surrounding the second semiconductor chip, the passive components, and the third metal layer, and each of the first to fourth metal layers is electrically connected to the metal pattern layer.
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