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公开(公告)号:US20180128758A1
公开(公告)日:2018-05-10
申请号:US15483776
申请日:2017-04-10
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Ga Hee KIM , Young Suk JUNG , Yoo Seong YANG , Young Hoon LEE , Hyun Mi LEE
Abstract: A deformation measuring apparatus of a specimen includes: a holder which supports the specimen; a contact portion disposed facing the holder and including a hemispherical tip; a position controlling portion which adjusts a position of the contact portion along a thickness direction of the specimen to allow the hemispherical tip to be in contact with a surface of the specimen; a heating chamber which accommodates the holder and the contact portion and heating the specimen; and a sensing portion which measures at least one of a thermal deformation force (F) of the specimen or a thickness direction thermal expansion (Δh) of the specimen.
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2.
公开(公告)号:US20240124765A1
公开(公告)日:2024-04-18
申请号:US18475698
申请日:2023-09-27
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Jong Hoon WON , Deuk Kyu MOON , Shang Hyeun PARK , Tae-Gon KIM , Young Hoon LEE , Deuk Seok CHUNG
CPC classification number: C09K11/025 , C08K9/04 , C09K11/0883 , C09K11/883 , H01L25/0753 , H10K59/38 , B82Y20/00
Abstract: A quantum dot, a quantum dot composite, a composition for preparing a quantum dot composite, a display panel including the quantum dot composite, and an electronic device including the display panel, wherein the quantum dot includes a core including a semiconductor nanocrystal including indium and phosphorus, a shell disposed on the core and including a semiconductor nanocrystal, and a compound represented by Chemical Formula 1 and a compound represented by Chemical Formula 2, both of which are present on the surface of the shell:
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