SEMICONDUCTOR TEST APPARATUS
    4.
    发明申请

    公开(公告)号:US20170102427A1

    公开(公告)日:2017-04-13

    申请号:US15285849

    申请日:2016-10-05

    CPC classification number: G01R31/2601 G01R31/2875 G01R31/2893 G01R31/31718

    Abstract: A semiconductor test apparatus includes: a tray housing unit configured to house a customer tray loading untested semiconductor chips, secondary semiconductor chips, and non-defective semiconductor chips; a loader configured to locate the untested semiconductor chips supplied from the tray housing unit on a loading set plate and load the untested semiconductor chips onto a test tray; a tester configured to test semiconductor chips loaded on the test tray; an unloader configured to unload semiconductor chips loaded on the test tray, classify the tested semiconductor chips, and locate the classified semiconductor chips on an unloading set plate; and a retest controller configured to transfer the secondary defective semiconductor chips and the non-defective semiconductor chips to the tray housing unit and transfer the first defective semiconductor chips to the loading set plate.

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