Chamber module and test handler including the same

    公开(公告)号:US11762009B2

    公开(公告)日:2023-09-19

    申请号:US17406751

    申请日:2021-08-19

    CPC classification number: G01R31/2642 H01L21/67745 H01L21/67333

    Abstract: A chamber module and a test handler including the same are disclosed. The chamber module includes a soak chamber providing a temperature adjusting space for adjusting a temperature of semiconductor devices, an elevating member disposed in the soak chamber and for elevating a tray in which the semiconductor devices are accommodated, a guide member extending in a vertical direction in the soak chamber and for guiding movement of the elevating member, and a temperature adjusting part for adjusting a temperature of the guide member.

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