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公开(公告)号:US20220139982A1
公开(公告)日:2022-05-05
申请号:US17576268
申请日:2022-01-14
Applicant: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Inventor: Larry Duane KINSMAN , Swarnal BORTHAKUR , Marc Allen SULFRIDGE , Scott Donald CHURCHWELL , Brian VAARTSTRA
IPC: H01L27/146
Abstract: An image sensor package may include a semiconductor wafer having a pixel array, a color filter array (CFA) formed over the pixel array, and one or more lenses formed over the CFA. A light block layer may couple over the semiconductor wafer around a perimeter of the lenses and an encapsulation layer may be coupled around the perimeter of the lenses and over the light block layer. The light block layer may form an opening providing access to the lenses. A mold compound layer may be coupled over the encapsulation layer and the light block layer. A temporary protection layer may be used to protect the one or more lenses from contamination during application of the mold compound and/or during processes occurring outside of a cleanroom environment.
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公开(公告)号:US20180097028A1
公开(公告)日:2018-04-05
申请号:US15285197
申请日:2016-10-04
Applicant: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Inventor: Larry Duane KINSMAN , Swarnal BORTHAKUR , Marc Allen SULFRIDGE , Scott Donald CHURCHWELL , Brian VAARTSTRA
IPC: H01L27/146
CPC classification number: H01L27/14621 , H01L27/14618 , H01L27/1462 , H01L27/14623 , H01L27/14627 , H01L27/14632 , H01L27/14685 , H01L27/14687
Abstract: An image sensor package may include a semiconductor wafer having a pixel array, a color filter array (CFA) formed over the pixel array, and one or more lenses formed over the CFA. A light block layer may couple over the semiconductor wafer around a perimeter of the lenses and an encapsulation layer may be coupled around the perimeter of the lenses and over the light block layer. The light block layer may form an opening providing access to the lenses. A mold compound layer may be coupled over the encapsulation layer and the light block layer. A temporary protection layer may be used to protect the one or more lenses from contamination during application of the mold compound and/or during processes occurring outside of a cleanroom environment.
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公开(公告)号:US20190189663A1
公开(公告)日:2019-06-20
申请号:US16282547
申请日:2019-02-22
Applicant: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Inventor: Larry Duane KINSMAN , Swarnal BORTHAKUR , Marc Allen SULFRIDGE , Scott Donald CHURCHWELL , Brian VAARTSTRA
IPC: H01L27/146
CPC classification number: H01L27/14621 , H01L27/14618 , H01L27/1462 , H01L27/14623 , H01L27/14627 , H01L27/14632 , H01L27/14685 , H01L27/14687
Abstract: An image sensor package may include a semiconductor wafer having a pixel array, a color filter array (CFA) formed over the pixel array, and one or more lenses formed over the CFA. A light block layer may couple over the semiconductor wafer around a perimeter of the lenses and an encapsulation layer may be coupled around the perimeter of the lenses and over the light block layer. The light block layer may form an opening providing access to the lenses. A mold compound layer may be coupled over the encapsulation layer and the light block layer. A temporary protection layer may be used to protect the one or more lenses from contamination during application of the mold compound and/or during processes occurring outside of a cleanroom environment.
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公开(公告)号:US20190189662A1
公开(公告)日:2019-06-20
申请号:US16282495
申请日:2019-02-22
Applicant: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Inventor: Larry Duane KINSMAN , Swarnal BORTHAKUR , Marc Allen SULFRIDGE , Scott Donald CHURCHWELL , Brian VAARTSTRA
IPC: H01L27/146
CPC classification number: H01L27/14621 , H01L27/14618 , H01L27/1462 , H01L27/14623 , H01L27/14627 , H01L27/14632 , H01L27/14685 , H01L27/14687
Abstract: An image sensor package may include a semiconductor wafer having a pixel array, a color filter array (CFA) formed over the pixel array, and one or more lenses formed over the CFA. A light block layer may couple over the semiconductor wafer around a perimeter of the lenses and an encapsulation layer may be coupled around the perimeter of the lenses and over the light block layer. The light block layer may form an opening providing access to the lenses. A mold compound layer may be coupled over the encapsulation layer and the light block layer. A temporary protection layer may be used to protect the one or more lenses from contamination during application of the mold compound and/or during processes occurring outside of a cleanroom environment.
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