公开(公告)号：US11281314B2

公开(公告)日：2022-03-22

申请号：US16947978

申请日：2020-08-26

申请人： SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC

发明人： Takashi Sugano

IPC分类号： G06F3/038 ,  G01L1/14 ,  G06F3/0354

摘要： Methods and apparatus for variable capacitance detection may provide various circuits to generate control and/or output signals, measure an elapsed time based on the control and/or output signals, and compute a capacitance value based on the elapsed time, wherein the capacitance value is directly proportional to the elapsed time.

公开(公告)号：US09847786B1

公开(公告)日：2017-12-19

申请号：US15613418

申请日：2017-06-05

申请人： SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC

发明人： Takashi Sugano

IPC分类号： H03M1/50 ,  H03M1/06 ,  H03M1/64 ,  H03M1/46 ,  H03M1/76 ,  G04F10/00 ,  G04F10/10

CPC分类号： G04F10/105 ,  G04F10/005 ,  H03M1/1215 ,  H03M1/50 ,  H03M1/52

摘要： Various embodiments of the present technology may comprise methods and apparatus for a multi-cycle time-based ADC configured to convert an analog signal to a digital value. Methods and apparatus a multi-cycle time-based ADC according to various aspects of the present invention may comprise a plurality of VTCs configured to perform multiple voltage-to-time conversions out-of-phase from each other. The integration times for each VTC may be summed to provide a total integration time, which may then be converted to the digital value.