Abstract:
An abrasive composition for polishing a semiconductor device, comprising cerium oxide, a water-soluble organic compound having at least one group of nullCOOH, nullCOOMx (wherein Mx is an atom or a functional group capable of substituting a H atom to form a salt), nullSO3H or nullSO3Mx, (wherein My is an atom or a functional group capable of substituting a H atom to form a salt), and water a process for forming shallow trench isolations using this abrasive composition.
Abstract translation:一种用于抛光半导体器件的研磨组合物,包括氧化铈,具有至少一个-COOH基团的-COOH的水溶性有机化合物,-COOMx(其中Mx是可以取代H原子的原子或官能团形成盐 ),-SO 3 H或-SO 3 M x(其中My是能够取代H原子形成盐的原子或官能团),水是使用该研磨组合物形成浅沟槽隔离的方法。
Abstract:
A cerium oxide slurry for polishing comprising cerium oxide dispersed in water, wherein the slurry has a conductivity of about 30c nullS/cm or less when the cerium oxide concentration in the slurry is c wt.%. In order to adjust the conductivity to about 30c nullS/cm or less, cerium oxide is washed with deionized water.